JPS5776441A - Modulation method for x-ray wavelength - Google Patents

Modulation method for x-ray wavelength

Info

Publication number
JPS5776441A
JPS5776441A JP55152905A JP15290580A JPS5776441A JP S5776441 A JPS5776441 A JP S5776441A JP 55152905 A JP55152905 A JP 55152905A JP 15290580 A JP15290580 A JP 15290580A JP S5776441 A JPS5776441 A JP S5776441A
Authority
JP
Japan
Prior art keywords
ray
sample
measured
detector
minute rotation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55152905A
Other languages
Japanese (ja)
Other versions
JPH0330101B2 (en
Inventor
Hiroyuki Oyanagi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP55152905A priority Critical patent/JPS5776441A/en
Publication of JPS5776441A publication Critical patent/JPS5776441A/en
Publication of JPH0330101B2 publication Critical patent/JPH0330101B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To give the modulation of a constant period to a spectral wavelength and to perform the experiments of X-ray diffraction, scattering, absorption by a phase sensitive detecting method with high accuracy, by adding a minute rotation vibrating apparatus to an X-ray spectral crystal. CONSTITUTION:Continuous X-ray radiated from an X-ray source 11 are irradiated to a sample 13 to be measured after making incident to a spectral crystal minute rotation vibrating apparatus 12 which is in rotary oscillation at an angle frequency omega and giving wavelength modulation. Further, X-rays diffracted or scattered by the sample 13 or transmitted the sample 13, are detected by an X-ray detector 14. The output of the detector 14 is measured by a phase sensitive detector 15 using the output of a minute rotation driving source 16 as a reference signal. Hereby, X-ray diffraction and scattering or absorption spectrum by the sample 13 is measured with a good ratio of signal vs noise.
JP55152905A 1980-10-30 1980-10-30 Modulation method for x-ray wavelength Granted JPS5776441A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55152905A JPS5776441A (en) 1980-10-30 1980-10-30 Modulation method for x-ray wavelength

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55152905A JPS5776441A (en) 1980-10-30 1980-10-30 Modulation method for x-ray wavelength

Publications (2)

Publication Number Publication Date
JPS5776441A true JPS5776441A (en) 1982-05-13
JPH0330101B2 JPH0330101B2 (en) 1991-04-26

Family

ID=15550692

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55152905A Granted JPS5776441A (en) 1980-10-30 1980-10-30 Modulation method for x-ray wavelength

Country Status (1)

Country Link
JP (1) JPS5776441A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2642886C1 (en) * 2016-11-30 2018-01-29 Федеральное государственное автономное образовательное учреждение высшего образования "Национальный исследовательский Нижегородский государственный университет им. Н.И. Лобачевского" Intensity modulation of x-ray beam
WO2018201586A1 (en) * 2017-05-05 2018-11-08 中国科学院上海光学精密机械研究所 Measurement device and method for in-situ time-resolved x-ray absorption spectrum

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2642886C1 (en) * 2016-11-30 2018-01-29 Федеральное государственное автономное образовательное учреждение высшего образования "Национальный исследовательский Нижегородский государственный университет им. Н.И. Лобачевского" Intensity modulation of x-ray beam
WO2018201586A1 (en) * 2017-05-05 2018-11-08 中国科学院上海光学精密机械研究所 Measurement device and method for in-situ time-resolved x-ray absorption spectrum
US10969348B2 (en) 2017-05-05 2021-04-06 Shanghai Institute Of Optics And Fine Mechanics, Chinese Academy Of Sciences Device and method for measuring in-situ time-resolved X-ray absorption spectrum

Also Published As

Publication number Publication date
JPH0330101B2 (en) 1991-04-26

Similar Documents

Publication Publication Date Title
FR2454619A1 (en) METHOD AND DEVICE FOR CONTINUOUS MEASUREMENT OF ELEMENTS CONTENT
EP0144713A3 (en) Device for optically measuring concentration of substances
US2806957A (en) Apparatus and method for spectral analysis
JPH09318535A (en) Light absorption spectrum measuring method of solution by laser induced photothermic displacement spectroscopy
GB1494062A (en) Method of and apparatus for spectroscopic gas analysis
EP0338233A3 (en) Apparatus for measuring the peak voltage applied to a radiation source
DE3375824D1 (en) Method and apparatus for measuring spectra of materials
JPS5776441A (en) Modulation method for x-ray wavelength
GB1513938A (en) Determination of the concentration ratio between two components of a mixture of substances
JPS5757241A (en) Zeeman atomic absorption photometer
GB1583845A (en) Determination of the ratio of amounts of two components of a mixture of substances
GB1582673A (en) Ice detector
JPS6441810A (en) Method for measuring applied film on metal thickness
JPS55124069A (en) Measuring method of concentration of suspended matter in water and organic index
JPS5322787A (en) Measuring apparatus for corpuscle
SU1204020A1 (en) Device for measuring density
SU278263A1 (en)
JPS55160836A (en) Photometric analysis meter
JPS54130185A (en) Total raman light monitoring method and apparatus
Koda et al. Study of the conformational equilibrium between rotational isomers using ultrasonic relaxation and Raman spectroscopy. Part 3.—1-Bromo-2-cholroethane
SU1523976A1 (en) Method of measuring radial beats of heart
SU1087853A1 (en) Surface machining quality control method
FR2455275A1 (en) Measuring apparent density of drill-cores by gamma ray absorption - using source having low activity in small, light appts. operable on site eliminating irradiation hazards and sample alteration
SU972350A1 (en) Device for x-ray radiometric fluorescent analyzer (its versions)
SU693184A1 (en) Shf method of measuring the moisture-content of dielectric material