JPS5756742A - Method for foreseeing life of metallic material - Google Patents

Method for foreseeing life of metallic material

Info

Publication number
JPS5756742A
JPS5756742A JP55130823A JP13082380A JPS5756742A JP S5756742 A JPS5756742 A JP S5756742A JP 55130823 A JP55130823 A JP 55130823A JP 13082380 A JP13082380 A JP 13082380A JP S5756742 A JPS5756742 A JP S5756742A
Authority
JP
Japan
Prior art keywords
rays
metallic material
diffracted
value width
half value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55130823A
Other languages
Japanese (ja)
Other versions
JPH0125417B2 (en
Inventor
Makoto Hayashi
Shinji Sakata
Tasuku Shimizu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP55130823A priority Critical patent/JPS5756742A/en
Publication of JPS5756742A publication Critical patent/JPS5756742A/en
Publication of JPH0125417B2 publication Critical patent/JPH0125417B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Abstract

PURPOSE:To detect damages, estimate remaining life and prevent the accident owing to failure or the like by irradiating X-rays to a metallic material receiving load in a high temp. environment, and obtaining the diffracted X-ray images by this. CONSTITUTION:X-rays are irradiated to a metallic material receiving load in a high temp. environment, whereby the diffracted images of diffracted X-rays are obtained. The degrees of blackening of the Debye rings on an X-rays film are investigated with a photometer, whereby a refraction intensity curve is obtd. Since the half value width (b) of this diffraction intensity curve and stress repetitive number N/Nf are in a linear relation, if a master curve for half value width changes is beforehand made under various heat treatment conditions and working conditions, a remaining life Nr is estimated by recording the stress repetitive number N and measuring the half value width.
JP55130823A 1980-09-22 1980-09-22 Method for foreseeing life of metallic material Granted JPS5756742A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55130823A JPS5756742A (en) 1980-09-22 1980-09-22 Method for foreseeing life of metallic material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55130823A JPS5756742A (en) 1980-09-22 1980-09-22 Method for foreseeing life of metallic material

Publications (2)

Publication Number Publication Date
JPS5756742A true JPS5756742A (en) 1982-04-05
JPH0125417B2 JPH0125417B2 (en) 1989-05-17

Family

ID=15043542

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55130823A Granted JPS5756742A (en) 1980-09-22 1980-09-22 Method for foreseeing life of metallic material

Country Status (1)

Country Link
JP (1) JPS5756742A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015145862A (en) * 2014-02-04 2015-08-13 パルステック工業株式会社 X-ray diffraction measurement device and method for detecting x-ray incidence angle in x-ray diffraction measurement device
JP2016075617A (en) * 2014-10-08 2016-05-12 Ｊｆｅエンジニアリング株式会社 Valve stress detection method, and valve life prediction method using the method
JP2018087738A (en) * 2016-11-29 2018-06-07 新日鐵住金株式会社 Method for evaluating remaining life of metal material

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5120894A (en) * 1974-08-09 1976-02-19 Hitachi Ltd
JPS5388781A (en) * 1977-01-14 1978-08-04 Mitsubishi Heavy Ind Ltd Method of nondestructively measuring useful life of metal material

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5120894A (en) * 1974-08-09 1976-02-19 Hitachi Ltd
JPS5388781A (en) * 1977-01-14 1978-08-04 Mitsubishi Heavy Ind Ltd Method of nondestructively measuring useful life of metal material

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015145862A (en) * 2014-02-04 2015-08-13 パルステック工業株式会社 X-ray diffraction measurement device and method for detecting x-ray incidence angle in x-ray diffraction measurement device
JP2016075617A (en) * 2014-10-08 2016-05-12 Ｊｆｅエンジニアリング株式会社 Valve stress detection method, and valve life prediction method using the method
JP2018087738A (en) * 2016-11-29 2018-06-07 新日鐵住金株式会社 Method for evaluating remaining life of metal material

Also Published As

Publication number Publication date
JPH0125417B2 (en) 1989-05-17

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