RU93047570A - METHOD FOR DETERMINING THE ENERGY GAMMA RADIATION SPECTRUM - Google Patents

METHOD FOR DETERMINING THE ENERGY GAMMA RADIATION SPECTRUM

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Publication number
RU93047570A
RU93047570A RU93047570/25A RU93047570A RU93047570A RU 93047570 A RU93047570 A RU 93047570A RU 93047570/25 A RU93047570/25 A RU 93047570/25A RU 93047570 A RU93047570 A RU 93047570A RU 93047570 A RU93047570 A RU 93047570A
Authority
RU
Russia
Prior art keywords
determining
gamma radiation
radiation spectrum
energy gamma
detector
Prior art date
Application number
RU93047570/25A
Other languages
Russian (ru)
Other versions
RU2067306C1 (en
Inventor
Е.С. Матусевич
В.П. Семенов
Л.А. Трыков
Original Assignee
Экспериментальный научно-исследовательский и методологический центр "Моделирующие системы"
Filing date
Publication date
Application filed by Экспериментальный научно-исследовательский и методологический центр "Моделирующие системы" filed Critical Экспериментальный научно-исследовательский и методологический центр "Моделирующие системы"
Priority to RU93047570A priority Critical patent/RU2067306C1/en
Priority claimed from RU93047570A external-priority patent/RU2067306C1/en
Application granted granted Critical
Publication of RU2067306C1 publication Critical patent/RU2067306C1/en
Publication of RU93047570A publication Critical patent/RU93047570A/en

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Claims (1)

В способе определения спектра - гамма излучения, основанный на использовании кремниевого детектора, устанавливают толщину чувствительного слоя не менее 2 мм, а остальные размеры этого слоя - не менее чем в три раза больше толщины. Детектор устанавливают так, чтобы наименьшая сторона его чувствительного слоя была бы перпендикулярна к потоку измеряемого излучения, подают на детектор напряжение 200 - 600 В. Измерения производят с порогом не менее 30 кэВ с последующим дифференцированием и преобразованием в матричную форму.In the method for determining the spectrum - gamma radiation based on the use of a silicon detector, the thickness of the sensitive layer is set to at least 2 mm, and the remaining dimensions of this layer are not less than three times the thickness. The detector is installed so that the smallest side of its sensitive layer is perpendicular to the flux of the measured radiation, a voltage of 200 - 600 V is applied to the detector. Measurements are made with a threshold of at least 30 keV, followed by differentiation and transformation into a matrix form.
RU93047570A 1993-10-11 1993-10-11 Method of determination of energy spectrum of gamma radiation RU2067306C1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
RU93047570A RU2067306C1 (en) 1993-10-11 1993-10-11 Method of determination of energy spectrum of gamma radiation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
RU93047570A RU2067306C1 (en) 1993-10-11 1993-10-11 Method of determination of energy spectrum of gamma radiation

Publications (2)

Publication Number Publication Date
RU2067306C1 RU2067306C1 (en) 1996-09-27
RU93047570A true RU93047570A (en) 1997-03-10

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Family Applications (1)

Application Number Title Priority Date Filing Date
RU93047570A RU2067306C1 (en) 1993-10-11 1993-10-11 Method of determination of energy spectrum of gamma radiation

Country Status (1)

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RU (1) RU2067306C1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2003302156A1 (en) * 2003-07-22 2005-02-04 "Scientific And Technical Center Ratec, Limited" Apparatus for detecting hidden radioactive, explosive and fissile materials
RU2497157C1 (en) * 2012-06-08 2013-10-27 Федеральное бюджетное учреждение "12 Центральный научно-исследовательский институт Министерства обороны Российской Федерации" Method of determining energy spectrum of gamma quanta
RU2597668C1 (en) * 2015-05-15 2016-09-20 Федеральное государственное автономное образовательное учреждение высшего профессионального образования "Уральский федеральный университет имени первого Президента России Б.Н. Ельцина" Method of suppressing avalanche noise in spectrometers with slow scintillators and silicon photoelectron multipliers

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