JP2820440B2 - 組織を分析する方法および装置 - Google Patents

組織を分析する方法および装置

Info

Publication number
JP2820440B2
JP2820440B2 JP1194423A JP19442389A JP2820440B2 JP 2820440 B2 JP2820440 B2 JP 2820440B2 JP 1194423 A JP1194423 A JP 1194423A JP 19442389 A JP19442389 A JP 19442389A JP 2820440 B2 JP2820440 B2 JP 2820440B2
Authority
JP
Japan
Prior art keywords
tissue
sheet
strip
detector
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1194423A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0288952A (ja
Inventor
ヘルマン‐ヨーゼフ・コピネツク
ハイナー・オツテン
ハンス‐ヨアヒム・ブンゲ
Original Assignee
ヘツシユ・シユタール・アクチエンゲゼルシヤフト
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ヘツシユ・シユタール・アクチエンゲゼルシヤフト filed Critical ヘツシユ・シユタール・アクチエンゲゼルシヤフト
Publication of JPH0288952A publication Critical patent/JPH0288952A/ja
Application granted granted Critical
Publication of JP2820440B2 publication Critical patent/JP2820440B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20091—Measuring the energy-dispersion spectrum [EDS] of diffracted radiation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Auxiliary Devices For Music (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
JP1194423A 1988-07-29 1989-07-28 組織を分析する方法および装置 Expired - Lifetime JP2820440B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3825830.7 1988-07-29
DE3825830A DE3825830A1 (de) 1988-07-29 1988-07-29 Verfahren und vorrichtung zur texturanalyse

Publications (2)

Publication Number Publication Date
JPH0288952A JPH0288952A (ja) 1990-03-29
JP2820440B2 true JP2820440B2 (ja) 1998-11-05

Family

ID=6359857

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1194423A Expired - Lifetime JP2820440B2 (ja) 1988-07-29 1989-07-28 組織を分析する方法および装置

Country Status (7)

Country Link
US (1) US4982417A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
EP (1) EP0352423B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JP2820440B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
AT (1) ATE94649T1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CA (1) CA1314335C (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (2) DE3825830A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
NO (1) NO179538C (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3825830A1 (de) 1988-07-29 1990-02-01 Hoesch Stahl Ag Verfahren und vorrichtung zur texturanalyse
FR2783444B1 (fr) * 1998-09-21 2000-12-15 Kvaerner Metals Clecim Procede de laminage d'un produit metallique
US6343110B1 (en) * 2000-07-25 2002-01-29 Ge Medical Systems Global Technology Company, Llc Methods and apparatus for submillimeter CT slices with increased coverage
DE102015108060A1 (de) * 2015-05-21 2016-11-24 Ims Messsysteme Gmbh Verfahren und Vorrichtung zur Charakterisierung eines Gefüges eines Bands oder Blechs aus Metall
DE102017208576A1 (de) 2016-05-25 2017-11-30 Sms Group Gmbh Vorrichtung und Verfahren zum Ermitteln einer Mikrostruktur eines Metallprodukts sowie metallurgische Anlage
US11898971B2 (en) 2019-06-24 2024-02-13 Sms Group Gmbh Controlling process parameters by means of radiographic online determination of material properties when producing metallic strips and sheets
EP4356118A2 (en) * 2021-06-16 2024-04-24 Carl Zeiss X-Ray Microscopy, Inc. Laboratory crystallographic x-ray diffraction analysis system

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4982417A (en) 1988-07-29 1991-01-01 Hoesch Stahl Ag Method and apparatus for texture analysis

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3319065A (en) * 1963-11-29 1967-05-09 Jones & Laughlin Steel Corp Scintillation detector comprising a flat annular scintillating crystal
GB1255644A (en) * 1968-05-10 1971-12-01 Rolls Royce Method of determining the value of a mechanical property or properties of a fibre
JPS608456B2 (ja) * 1974-07-10 1985-03-02 理学電機株式会社 結晶粒度測定法
US3984679A (en) * 1975-02-18 1976-10-05 Gte Laboratories Incorporated Coating thickness monitor for multiple layers
US3963439A (en) * 1975-09-05 1976-06-15 The United States Of America As Represented By The Secretary Of The Navy Multielectrode apparatus and techniques to prepare aligned asbestos fibers on a thin substrate
US4095103A (en) * 1976-03-12 1978-06-13 Northwestern University Apparatus and method for determination of residual stress in crystalline substances
US4125771A (en) * 1977-11-18 1978-11-14 Net Systems Inc. Apparatus for determining stress in nickel and titanium alloyed materials
DE2817742C2 (de) * 1978-04-22 1980-07-24 Hoesch Werke Ag, 4600 Dortmund Verfahren und Vorrichtung zum Bestimmen technologischer Kennwerte
JPS5583841A (en) * 1978-12-20 1980-06-24 Hitachi Ltd X ray stress measuring unit using gamma ray excitation x ray source
GB2039363B (en) * 1979-01-12 1983-02-16 Coal Ind Determining the nature of transported material
JPS5890112A (ja) * 1981-11-26 1983-05-28 Toshiba Corp 放射線厚さ計
US4649556A (en) * 1982-09-24 1987-03-10 Northwestern University Method and apparatus for the "on-line", nondestructive measurement and control of grain size in materials
DE3425295C2 (de) * 1984-07-10 1986-07-24 Hoesch Ag, 4600 Dortmund Vorrichtung zur Messung des Dickenprofils von gewalzten Blechbändern
US4715053A (en) * 1985-01-25 1987-12-22 Westinghouse Electric Corp. Method for monitoring the crystallographic texture of metallic tubes by use of X-ray diffraction

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4982417A (en) 1988-07-29 1991-01-01 Hoesch Stahl Ag Method and apparatus for texture analysis

Also Published As

Publication number Publication date
CA1314335C (en) 1993-03-09
DE58905602D1 (de) 1993-10-21
EP0352423A3 (de) 1991-05-29
NO892438D0 (no) 1989-06-13
NO179538C (no) 1996-10-23
DE3825830C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-06-04
NO179538B (no) 1996-07-15
EP0352423B1 (de) 1993-09-15
EP0352423A2 (de) 1990-01-31
DE3825830A1 (de) 1990-02-01
NO892438L (no) 1990-01-30
ATE94649T1 (de) 1993-10-15
JPH0288952A (ja) 1990-03-29
US4982417A (en) 1991-01-01

Similar Documents

Publication Publication Date Title
US5461654A (en) X-ray fluorescence detector
US20080095311A1 (en) Measuring Device for the Shortwavelentgh X Ray Diffraction and a Method Thereof
JPH10123071A (ja) Ｘ線分析方法および装置
JP2820440B2 (ja) 組織を分析する方法および装置
US2549987A (en) X-ray diffraction method
US4016418A (en) Method of radioactivity analysis
JPH06121791A (ja) Ｘ線定量装置およびｘ線定量方法
US4277686A (en) Device for determining internal body structures by means of scattered radiation
JPS61193057A (ja) 放射線分析装置
JPH01227050A (ja) 物体の密度等の測定方法と装置
Fewell et al. The measurement of diagnostic x-ray spectra with a high purity Germanium spectrometer
US5351689A (en) Method and apparatus for low dose estimates of bone minerals in vivo gamma ray backscatter
JP3030950B2 (ja) 校正用ファントムおよびデータ校正法
CN114641687A (zh) 荧光x射线分析装置
EP0282466B1 (en) Method for measuring x-rays or gamma radiation and device for this
JPH0237539B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPH0759762A (ja) Ｘ線ｃｔ装置
Szpunar Geometry of Texture Measurements for Dispersive Methods
JP2759922B2 (ja) 高次ｘ線強度の測定方法
SU1597703A1 (ru) Способ неразрушающего контрол распределени @ -излучающего нуклида в образцах
JPS5977346A (ja) 物質元素組成分析装置
US6142668A (en) X-ray multimeter
Keating et al. Film Thickness Determination from Substrate X‐Ray Reflections
JPH04212041A (ja) Ｘ線イメージセンサ及びｘ線検査装置
Wells et al. A simple transmission X-ray microtomography instrument