NL9100337A - Halfgeleiderinrichting. - Google Patents

Halfgeleiderinrichting. Download PDF

Info

Publication number
NL9100337A
NL9100337A NL9100337A NL9100337A NL9100337A NL 9100337 A NL9100337 A NL 9100337A NL 9100337 A NL9100337 A NL 9100337A NL 9100337 A NL9100337 A NL 9100337A NL 9100337 A NL9100337 A NL 9100337A
Authority
NL
Netherlands
Prior art keywords
layer
polyimide
passivation layer
semiconductor device
chip
Prior art date
Application number
NL9100337A
Other languages
English (en)
Dutch (nl)
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Priority to NL9100337A priority Critical patent/NL9100337A/nl
Priority to EP19920200462 priority patent/EP0501564B1/en
Priority to DE69202363T priority patent/DE69202363T2/de
Priority to JP04036239A priority patent/JP3133130B2/ja
Publication of NL9100337A publication Critical patent/NL9100337A/nl
Priority to US08/024,918 priority patent/US5287003A/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • H01L23/3135Double encapsulation or coating and encapsulation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H01L23/293Organic, e.g. plastic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/0212Auxiliary members for bonding areas, e.g. spacers
    • H01L2224/02122Auxiliary members for bonding areas, e.g. spacers being formed on the semiconductor or solid-state body
    • H01L2224/02163Auxiliary members for bonding areas, e.g. spacers being formed on the semiconductor or solid-state body on the bonding area
    • H01L2224/02165Reinforcing structures
    • H01L2224/02166Collar structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L24/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01019Potassium [K]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/102Material of the semiconductor or solid state bodies
    • H01L2924/1025Semiconducting materials
    • H01L2924/10251Elemental semiconductors, i.e. Group IV
    • H01L2924/10253Silicon [Si]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Formation Of Insulating Films (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
NL9100337A 1991-02-26 1991-02-26 Halfgeleiderinrichting. NL9100337A (nl)

Priority Applications (5)

Application Number Priority Date Filing Date Title
NL9100337A NL9100337A (nl) 1991-02-26 1991-02-26 Halfgeleiderinrichting.
EP19920200462 EP0501564B1 (en) 1991-02-26 1992-02-18 Semiconductor device
DE69202363T DE69202363T2 (de) 1991-02-26 1992-02-18 Halbleiteranordnung.
JP04036239A JP3133130B2 (ja) 1991-02-26 1992-02-24 半導体デバイス
US08/024,918 US5287003A (en) 1991-02-26 1993-03-02 Resin-encapsulated semiconductor device having a passivation reinforcement hard polyimide film

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL9100337A NL9100337A (nl) 1991-02-26 1991-02-26 Halfgeleiderinrichting.
NL9100337 1991-02-26

Publications (1)

Publication Number Publication Date
NL9100337A true NL9100337A (nl) 1992-09-16

Family

ID=19858931

Family Applications (1)

Application Number Title Priority Date Filing Date
NL9100337A NL9100337A (nl) 1991-02-26 1991-02-26 Halfgeleiderinrichting.

Country Status (4)

Country Link
EP (1) EP0501564B1 (ja)
JP (1) JP3133130B2 (ja)
DE (1) DE69202363T2 (ja)
NL (1) NL9100337A (ja)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5438022A (en) 1993-12-14 1995-08-01 At&T Global Information Solutions Company Method for using low dielectric constant material in integrated circuit fabrication
JP2773660B2 (ja) * 1994-10-27 1998-07-09 日本電気株式会社 半導体装置
GB9520791D0 (en) * 1995-10-13 1995-12-13 Philips Electronics Nv Image sensor
WO1999049512A1 (fr) * 1998-03-20 1999-09-30 Hitachi, Ltd. Dispositif a semi-conducteur et procede de fabrication associe
WO2003044858A2 (en) * 2001-11-23 2003-05-30 Koninklijke Philips Electronics N.V. Semiconductor device and method of enveloping an integrated circuit
JP5298789B2 (ja) * 2008-11-12 2013-09-25 株式会社デンソー 電子装置およびその製造方法
JP5350424B2 (ja) 2011-03-24 2013-11-27 東京エレクトロン株式会社 表面処理方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59191353A (ja) * 1983-04-15 1984-10-30 Hitachi Ltd 多層配線構造を有する電子装置

Also Published As

Publication number Publication date
JPH0595058A (ja) 1993-04-16
DE69202363T2 (de) 1996-01-25
EP0501564B1 (en) 1995-05-10
EP0501564A1 (en) 1992-09-02
DE69202363D1 (de) 1995-06-14
JP3133130B2 (ja) 2001-02-05

Similar Documents

Publication Publication Date Title
US5287003A (en) Resin-encapsulated semiconductor device having a passivation reinforcement hard polyimide film
EP0605112B1 (en) Use of an insulating adhesive tape, lead frame and semiconductor device employing the tape
US7056772B2 (en) Method for sealing semiconductor component
US6046101A (en) Passivation technology combining improved adhesion in passivation and a scribe street without passivation
US20040191955A1 (en) Wafer-level chip scale package and method for fabricating and using the same
NL9100337A (nl) Halfgeleiderinrichting.
KR900001656B1 (ko) 패시베이션필름(passivation film)의 형성방법
US5026667A (en) Producing integrated circuit chips with reduced stress effects
US6776050B2 (en) Support for bending test of flexible substrates
US20050199988A1 (en) Sensor device
Vincent et al. Enhancement of underfill adhesion to die and substrate by use of silane additives
GB2378578A (en) Semiconductor device encapsulation
KR100335663B1 (ko) 테입리스 loc 패키징용 폴리(이미드-실록산) 화합물
Makabe et al. A novel positive working photosensitive polymer for semiconductor surface coating
JPS63293930A (ja) 半導体装置における電極
JPH0263148A (ja) 半導体装置
JP2532726B2 (ja) 半導体装置及びそれを用いたイメ―ジセンサ―
JP7143182B2 (ja) 半導体装置製造方法および半導体装置
Takeuchi et al. Effect of combination between various polyimide coating materials and molding compounds on the reliability of integrated circuits (ICs)
JPH0744280B2 (ja) シリコン結晶体の接合方法
JP2785722B2 (ja) 樹脂封止型半導体装置
JPH10209154A (ja) 半導体装置
KR0144290B1 (ko) 마이크로전자칩에의 접착제의 사용방법 및 이 방법에 의한 반도체집적회로칩 및 캡슐화 반도체모듈
JPS58166748A (ja) 半導体装置
JPH0794639A (ja) 半導体装置及び製造方法

Legal Events

Date Code Title Description
A1B A search report has been drawn up
BV The patent application has lapsed