NL9002176A - Werkwijze voor het verminderen van deeltjescontaminatie tijdens sputteren en een sputterinrichting voor gebruik van een dergelijke werkwijze. - Google Patents
Werkwijze voor het verminderen van deeltjescontaminatie tijdens sputteren en een sputterinrichting voor gebruik van een dergelijke werkwijze. Download PDFInfo
- Publication number
- NL9002176A NL9002176A NL9002176A NL9002176A NL9002176A NL 9002176 A NL9002176 A NL 9002176A NL 9002176 A NL9002176 A NL 9002176A NL 9002176 A NL9002176 A NL 9002176A NL 9002176 A NL9002176 A NL 9002176A
- Authority
- NL
- Netherlands
- Prior art keywords
- ions
- substrate
- gas discharge
- chamber
- chamber part
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3492—Variation of parameters during sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Electrodes Of Semiconductors (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Physical Vapour Deposition (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL9002176A NL9002176A (nl) | 1990-10-08 | 1990-10-08 | Werkwijze voor het verminderen van deeltjescontaminatie tijdens sputteren en een sputterinrichting voor gebruik van een dergelijke werkwijze. |
DE69110394T DE69110394T2 (de) | 1990-10-08 | 1991-09-30 | Verfahren zum Verringen von Teilchenkontamination beim Zerstäuben. |
EP91202530A EP0480504B1 (en) | 1990-10-08 | 1991-09-30 | Method of reducing particle contamination during sputtering |
JP25907191A JP3659653B2 (ja) | 1990-10-08 | 1991-10-07 | 基板上に層を設ける方法およびこれに使用するスパッタリング装置 |
US08/400,783 US6059938A (en) | 1990-10-08 | 1995-03-06 | Method of reducing particle contamination during sputtering |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL9002176 | 1990-10-08 | ||
NL9002176A NL9002176A (nl) | 1990-10-08 | 1990-10-08 | Werkwijze voor het verminderen van deeltjescontaminatie tijdens sputteren en een sputterinrichting voor gebruik van een dergelijke werkwijze. |
Publications (1)
Publication Number | Publication Date |
---|---|
NL9002176A true NL9002176A (nl) | 1992-05-06 |
Family
ID=19857779
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL9002176A NL9002176A (nl) | 1990-10-08 | 1990-10-08 | Werkwijze voor het verminderen van deeltjescontaminatie tijdens sputteren en een sputterinrichting voor gebruik van een dergelijke werkwijze. |
Country Status (5)
Country | Link |
---|---|
US (1) | US6059938A (ja) |
EP (1) | EP0480504B1 (ja) |
JP (1) | JP3659653B2 (ja) |
DE (1) | DE69110394T2 (ja) |
NL (1) | NL9002176A (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0954620A4 (en) * | 1997-01-16 | 2002-01-02 | Bottomfield Layne F | COMPONENTS FOR VACUUM EVAPORATION METALLIZATION AND RELATED METHODS |
US6645357B2 (en) | 2001-11-05 | 2003-11-11 | Applied Materials, Inc. | Mesh shield in a sputter reactor |
US6863930B2 (en) | 2002-09-06 | 2005-03-08 | Delphi Technologies, Inc. | Refractory metal mask and methods for coating an article and forming a sensor |
US20090194414A1 (en) * | 2008-01-31 | 2009-08-06 | Nolander Ira G | Modified sputtering target and deposition components, methods of production and uses thereof |
CN103132032A (zh) * | 2013-03-15 | 2013-06-05 | 上海和辉光电有限公司 | 一种用于减少ito溅射损伤衬底的溅射设备及其方法 |
CN112813389A (zh) * | 2019-11-18 | 2021-05-18 | 河北召飞科技服务有限公司 | 一种多弧离子镀膜过程中减少大液滴的方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3528906A (en) * | 1967-06-05 | 1970-09-15 | Texas Instruments Inc | Rf sputtering method and system |
US3699034A (en) * | 1971-03-15 | 1972-10-17 | Sperry Rand Corp | Method for sputter depositing dielectric materials |
US3864239A (en) * | 1974-04-22 | 1975-02-04 | Nasa | Multitarget sequential sputtering apparatus |
DD142568A1 (de) * | 1979-03-22 | 1980-07-02 | Harald Bilz | EINRICHTUNG ZUM REAKTIVEN BESCHICHTEN MIT DEM PLASM&TRON |
US4410407A (en) * | 1981-12-22 | 1983-10-18 | Raytheon Company | Sputtering apparatus and methods |
JPH0624345B2 (ja) * | 1986-04-28 | 1994-03-30 | 日本電気株式会社 | 予備回線監視回路 |
JPH029115A (ja) * | 1988-06-28 | 1990-01-12 | Mitsubishi Electric Corp | 半導体製造装置 |
-
1990
- 1990-10-08 NL NL9002176A patent/NL9002176A/nl not_active Application Discontinuation
-
1991
- 1991-09-30 EP EP91202530A patent/EP0480504B1/en not_active Expired - Lifetime
- 1991-09-30 DE DE69110394T patent/DE69110394T2/de not_active Expired - Lifetime
- 1991-10-07 JP JP25907191A patent/JP3659653B2/ja not_active Expired - Lifetime
-
1995
- 1995-03-06 US US08/400,783 patent/US6059938A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0480504B1 (en) | 1995-06-14 |
DE69110394T2 (de) | 1996-02-08 |
US6059938A (en) | 2000-05-09 |
JPH04288826A (ja) | 1992-10-13 |
DE69110394D1 (de) | 1995-07-20 |
JP3659653B2 (ja) | 2005-06-15 |
EP0480504A1 (en) | 1992-04-15 |
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---|---|---|---|
A1B | A search report has been drawn up | ||
BV | The patent application has lapsed |