NL8302740A - Inrichting voor het automatisch corrigeren van x-straling. - Google Patents

Inrichting voor het automatisch corrigeren van x-straling. Download PDF

Info

Publication number
NL8302740A
NL8302740A NL8302740A NL8302740A NL8302740A NL 8302740 A NL8302740 A NL 8302740A NL 8302740 A NL8302740 A NL 8302740A NL 8302740 A NL8302740 A NL 8302740A NL 8302740 A NL8302740 A NL 8302740A
Authority
NL
Netherlands
Prior art keywords
radiation
correction
shutter
wave amplitude
standardized
Prior art date
Application number
NL8302740A
Other languages
English (en)
Dutch (nl)
Original Assignee
Seiko Instr & Electronics
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instr & Electronics filed Critical Seiko Instr & Electronics
Publication of NL8302740A publication Critical patent/NL8302740A/nl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NL8302740A 1982-09-24 1983-08-02 Inrichting voor het automatisch corrigeren van x-straling. NL8302740A (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP16626982A JPS5967449A (ja) 1982-09-24 1982-09-24 Ｘ線自動較正装置
JP16626982 1982-09-24

Publications (1)

Publication Number Publication Date
NL8302740A true NL8302740A (nl) 1984-04-16

Family

ID=15828248

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8302740A NL8302740A (nl) 1982-09-24 1983-08-02 Inrichting voor het automatisch corrigeren van x-straling.

Country Status (5)

Country Link
JP (1) JPS5967449A (enExample)
DE (1) DE3334458A1 (enExample)
FR (1) FR2533794B1 (enExample)
GB (1) GB2127538B (enExample)
NL (1) NL8302740A (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03158581A (ja) * 1989-11-15 1991-07-08 Fujita Corp 鍵保管函の解錠装置
EP1097373A2 (en) * 1998-10-29 2001-05-09 PANalytical B.V. X-ray diffraction apparatus with an x-ray optical reference channel
JP6305247B2 (ja) 2014-06-13 2018-04-04 株式会社日立ハイテクサイエンス 蛍光ｘ線分析装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1285885A (en) * 1968-11-07 1972-08-16 Atomic Energy Authority Uk Improvements in or relating to nephelometers
US3983397A (en) * 1972-05-08 1976-09-28 Albert Richard D Selectable wavelength X-ray source
JPS5139188A (en) * 1974-09-30 1976-04-01 Horiba Ltd Hibunsangatakeikoxsenbunsekisochi
US4134012A (en) * 1977-10-17 1979-01-09 Bausch & Lomb, Inc. X-ray analytical system
AU528079B2 (en) * 1979-02-09 1983-04-14 Martin Marietta Corp. Element analysis unit
JPS5758300U (enExample) * 1980-09-22 1982-04-06

Also Published As

Publication number Publication date
FR2533794B1 (fr) 1988-06-03
JPS6259258B2 (enExample) 1987-12-10
GB2127538A (en) 1984-04-11
GB2127538B (en) 1986-06-25
GB8323706D0 (en) 1983-10-05
JPS5967449A (ja) 1984-04-17
DE3334458A1 (de) 1984-06-07
FR2533794A1 (fr) 1984-03-30

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Legal Events

Date Code Title Description
A85 Still pending on 85-01-01
BA A request for search or an international-type search has been filed
BB A search report has been drawn up
BC A request for examination has been filed
BV The patent application has lapsed