GB2127538B - X-ray device - Google Patents

X-ray device

Info

Publication number
GB2127538B
GB2127538B GB8323706A GB8323706A GB2127538B GB 2127538 B GB2127538 B GB 2127538B GB 8323706 A GB8323706 A GB 8323706A GB 8323706 A GB8323706 A GB 8323706A GB 2127538 B GB2127538 B GB 2127538B
Authority
GB
United Kingdom
Prior art keywords
ray device
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB8323706A
Other versions
GB2127538A (en
GB8323706D0 (en
Inventor
Toshiyuki Koga
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Publication of GB8323706D0 publication Critical patent/GB8323706D0/en
Publication of GB2127538A publication Critical patent/GB2127538A/en
Application granted granted Critical
Publication of GB2127538B publication Critical patent/GB2127538B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB8323706A 1982-09-24 1983-09-05 X-ray device Expired GB2127538B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16626982A JPS5967449A (en) 1982-09-24 1982-09-24 X ray automatic calibrator

Publications (3)

Publication Number Publication Date
GB8323706D0 GB8323706D0 (en) 1983-10-05
GB2127538A GB2127538A (en) 1984-04-11
GB2127538B true GB2127538B (en) 1986-06-25

Family

ID=15828248

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8323706A Expired GB2127538B (en) 1982-09-24 1983-09-05 X-ray device

Country Status (5)

Country Link
JP (1) JPS5967449A (en)
DE (1) DE3334458A1 (en)
FR (1) FR2533794B1 (en)
GB (1) GB2127538B (en)
NL (1) NL8302740A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105277579A (en) * 2014-06-13 2016-01-27 日本株式会社日立高新技术科学 X-ray fluorescence analyzer

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03158581A (en) * 1989-11-15 1991-07-08 Fujita Corp Unlocker for key storage box
EP1097373A2 (en) * 1998-10-29 2001-05-09 PANalytical B.V. X-ray diffraction apparatus with an x-ray optical reference channel

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1285885A (en) * 1968-11-07 1972-08-16 Atomic Energy Authority Uk Improvements in or relating to nephelometers
US3983397A (en) * 1972-05-08 1976-09-28 Albert Richard D Selectable wavelength X-ray source
JPS5139188A (en) * 1974-09-30 1976-04-01 Horiba Ltd Hibunsangatakeikoxsenbunsekisochi
US4134012A (en) * 1977-10-17 1979-01-09 Bausch & Lomb, Inc. X-ray analytical system
EP0014580B1 (en) * 1979-02-09 1983-03-02 Martin Marietta Corporation Element analysis unit
JPS5758300U (en) * 1980-09-22 1982-04-06

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105277579A (en) * 2014-06-13 2016-01-27 日本株式会社日立高新技术科学 X-ray fluorescence analyzer

Also Published As

Publication number Publication date
GB2127538A (en) 1984-04-11
JPS6259258B2 (en) 1987-12-10
GB8323706D0 (en) 1983-10-05
FR2533794B1 (en) 1988-06-03
JPS5967449A (en) 1984-04-17
DE3334458A1 (en) 1984-06-07
FR2533794A1 (en) 1984-03-30
NL8302740A (en) 1984-04-16

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19930905