NL2011710C2 - Device for cleaning a stylus of a measuring probe. - Google Patents

Device for cleaning a stylus of a measuring probe. Download PDF

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Publication number
NL2011710C2
NL2011710C2 NL2011710A NL2011710A NL2011710C2 NL 2011710 C2 NL2011710 C2 NL 2011710C2 NL 2011710 A NL2011710 A NL 2011710A NL 2011710 A NL2011710 A NL 2011710A NL 2011710 C2 NL2011710 C2 NL 2011710C2
Authority
NL
Netherlands
Prior art keywords
cleaning
measuring
agent
cleaning chamber
chamber
Prior art date
Application number
NL2011710A
Other languages
English (en)
Dutch (nl)
Inventor
Gerhardus Hendrikus Albertus Maria Schopman
Original Assignee
F G J Lammertink Beheer B V
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to NL2011710A priority Critical patent/NL2011710C2/en
Application filed by F G J Lammertink Beheer B V filed Critical F G J Lammertink Beheer B V
Priority to CN201480060322.3A priority patent/CN105792950B/zh
Priority to PL14799044.4T priority patent/PL3062938T3/pl
Priority to JP2016552398A priority patent/JP6505731B2/ja
Priority to PCT/NL2014/050749 priority patent/WO2015065183A1/en
Priority to EP14799044.4A priority patent/EP3062938B1/en
Priority to MX2016005435A priority patent/MX2016005435A/es
Priority to US15/033,341 priority patent/US10232411B2/en
Priority to BR112016009520-0A priority patent/BR112016009520B1/pt
Priority to CN201810962889.XA priority patent/CN109092770A/zh
Priority to ES14799044T priority patent/ES2935195T3/es
Application granted granted Critical
Publication of NL2011710C2 publication Critical patent/NL2011710C2/en

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/02—Cleaning by the force of jets or sprays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/02—Cleaning by the force of jets or sprays
    • B08B3/022—Cleaning travelling work
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/02—Cleaning by the force of jets or sprays
    • B08B3/024—Cleaning by means of spray elements moving over the surface to be cleaned
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B5/00—Cleaning by methods involving the use of air flow or gas flow
    • B08B5/02—Cleaning by the force of jets, e.g. blowing-out cavities
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B5/00—Cleaning by methods involving the use of air flow or gas flow
    • B08B5/02—Cleaning by the force of jets, e.g. blowing-out cavities
    • B08B5/023—Cleaning travelling work
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • G01B5/012—Contact-making feeler heads therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1004—Cleaning sample transfer devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Cleaning In General (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
NL2011710A 2013-10-31 2013-10-31 Device for cleaning a stylus of a measuring probe. NL2011710C2 (en)

Priority Applications (11)

Application Number Priority Date Filing Date Title
NL2011710A NL2011710C2 (en) 2013-10-31 2013-10-31 Device for cleaning a stylus of a measuring probe.
PL14799044.4T PL3062938T3 (pl) 2013-10-31 2014-10-29 Zespół zawierający końcówkę stykową sondy pomiarowej 3d i urządzenie do czyszczenia końcówki stykowej
JP2016552398A JP6505731B2 (ja) 2013-10-31 2014-10-29 測定プローブの針を洗浄するための装置
PCT/NL2014/050749 WO2015065183A1 (en) 2013-10-31 2014-10-29 Device for cleaning a stylus of a measuring probe
CN201480060322.3A CN105792950B (zh) 2013-10-31 2014-10-29 用于清洁测量探头的探针的设备
EP14799044.4A EP3062938B1 (en) 2013-10-31 2014-10-29 Assembly comprising a 3d measuring probe stylus and a device for cleaning the stylus
MX2016005435A MX2016005435A (es) 2013-10-31 2014-10-29 Dispositivo para limpiar una aguja de una sonda de medición.
US15/033,341 US10232411B2 (en) 2013-10-31 2014-10-29 Device for cleaning a stylus of a measuring probe
BR112016009520-0A BR112016009520B1 (pt) 2013-10-31 2014-10-29 conjunto de dispositivo de limpeza de haste de sonda de medição para a limpeza de haste de sonda de medição e dispositivo de medição 3d
CN201810962889.XA CN109092770A (zh) 2013-10-31 2014-10-29 用于清洁测量探头的探针的设备
ES14799044T ES2935195T3 (es) 2013-10-31 2014-10-29 Conjunto compuesto por un palpador de sonda de medición 3D y un dispositivo de limpieza del palpador

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL2011710 2013-10-31
NL2011710A NL2011710C2 (en) 2013-10-31 2013-10-31 Device for cleaning a stylus of a measuring probe.

Publications (1)

Publication Number Publication Date
NL2011710C2 true NL2011710C2 (en) 2015-05-04

Family

ID=50031466

Family Applications (1)

Application Number Title Priority Date Filing Date
NL2011710A NL2011710C2 (en) 2013-10-31 2013-10-31 Device for cleaning a stylus of a measuring probe.

Country Status (10)

Country Link
US (1) US10232411B2 (OSRAM)
EP (1) EP3062938B1 (OSRAM)
JP (1) JP6505731B2 (OSRAM)
CN (2) CN105792950B (OSRAM)
BR (1) BR112016009520B1 (OSRAM)
ES (1) ES2935195T3 (OSRAM)
MX (1) MX2016005435A (OSRAM)
NL (1) NL2011710C2 (OSRAM)
PL (1) PL3062938T3 (OSRAM)
WO (1) WO2015065183A1 (OSRAM)

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* Cited by examiner, † Cited by third party
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WO2017145672A1 (ja) * 2016-02-24 2017-08-31 株式会社日立ハイテクノロジーズ 自動分析装置および洗浄方法
GB2550549B (en) 2016-05-09 2019-05-08 Markes International Ltd A sampling apparatus
GB2550548A (en) * 2016-05-09 2017-11-29 Markes International Ltd A sampling apparatus
CN109070148B (zh) * 2016-05-11 2022-02-01 西门子医疗保健诊断公司 用于分析仪器的探针清洗站
CN107030061B (zh) * 2017-04-06 2019-07-23 武汉华星光电技术有限公司 探针清洗装置及探针清洗方法
CN108931415B (zh) * 2017-05-23 2021-02-19 北京诚智光辉科技有限公司 带有清洗机构的细胞制片染色一体机
CN108508061A (zh) * 2018-03-09 2018-09-07 上海宝钢工业技术服务有限公司 钢板在线力学性能检测系统及方法
CN109622482B (zh) * 2018-11-13 2021-10-01 迪瑞医疗科技股份有限公司 生化分析仪的探针清洗槽、生化分析仪及探针清洗方法
DE102019212768B3 (de) * 2019-08-26 2020-11-05 Carl Zeiss Industrielle Messtechnik Gmbh Tasterreinigung bei Koordinatenmessgeräten
CA3180492A1 (en) * 2020-05-01 2021-11-04 Agilent Technologies, Inc. Pipette tip washing devices and methods
CN114405887B (zh) * 2020-11-28 2022-12-06 法特迪精密科技（苏州）有限公司 测试探针清洁方法的摩阻刮除方法
CN113061835A (zh) * 2021-03-24 2021-07-02 鑫光热处理工业(昆山)有限公司 一种热处理炉内氮势监控装置
CN112845230B (zh) * 2021-04-23 2022-02-08 南京摆渡人网络信息技术有限公司 一种农业大棚监控装置
CN113189165B (zh) * 2021-06-03 2024-03-01 南京普来森仪器有限公司 一种利用电化学原理测量铝酸钠成分的装置
CN118491916B (zh) * 2024-07-19 2024-09-17 泰州市成兴环境检测技术有限公司 一种土壤检测仪辅助清洁装置及其使用方法

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Publication number Priority date Publication date Assignee Title
WO1997001750A1 (en) * 1995-06-29 1997-01-16 Coulter International Corp. Apparatus for cleaning a fluid sample probe
DE19610607A1 (de) * 1996-03-18 1997-09-25 Boehringer Mannheim Gmbh Vorrichtung zur Reinigung von Pipettiernadeln oder Rührern
DE10207499A1 (de) * 2002-02-22 2003-09-25 Evotec Ag Verfahren zum Reinigen von Fluidabgabeeinrichtungen und Reinigungsvorrichtung
US20080099057A1 (en) * 2006-10-27 2008-05-01 Dade Behring Inc. Method and Device for Cleaning a Liquid Aspiration and Dispense Probe
EP2025418A1 (en) * 2007-08-09 2009-02-18 Hitachi High-Technologies Corporation Automatic analyzer with pipette cleaning
WO2013099498A1 (ja) * 2011-12-26 2013-07-04 株式会社日立ハイテクノロジーズ 自動分析装置

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CN202366900U (zh) * 2011-12-16 2012-08-08 长春迪瑞医疗科技股份有限公司 全自动尿液分析仪清洗池
CN202527417U (zh) * 2012-03-22 2012-11-14 北京京东方光电科技有限公司 一种非接触式清洗装置
CN202700869U (zh) * 2012-06-30 2013-01-30 长春迪瑞医疗科技股份有限公司 探针清洗机构

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997001750A1 (en) * 1995-06-29 1997-01-16 Coulter International Corp. Apparatus for cleaning a fluid sample probe
DE19610607A1 (de) * 1996-03-18 1997-09-25 Boehringer Mannheim Gmbh Vorrichtung zur Reinigung von Pipettiernadeln oder Rührern
DE10207499A1 (de) * 2002-02-22 2003-09-25 Evotec Ag Verfahren zum Reinigen von Fluidabgabeeinrichtungen und Reinigungsvorrichtung
US20080099057A1 (en) * 2006-10-27 2008-05-01 Dade Behring Inc. Method and Device for Cleaning a Liquid Aspiration and Dispense Probe
EP2025418A1 (en) * 2007-08-09 2009-02-18 Hitachi High-Technologies Corporation Automatic analyzer with pipette cleaning
WO2013099498A1 (ja) * 2011-12-26 2013-07-04 株式会社日立ハイテクノロジーズ 自動分析装置

Also Published As

Publication number Publication date
JP2017501034A (ja) 2017-01-12
US20160263626A1 (en) 2016-09-15
BR112016009520B1 (pt) 2021-05-18
MX2016005435A (es) 2016-09-07
WO2015065183A1 (en) 2015-05-07
JP6505731B2 (ja) 2019-04-24
CN105792950A (zh) 2016-07-20
ES2935195T3 (es) 2023-03-02
PL3062938T3 (pl) 2023-02-20
US10232411B2 (en) 2019-03-19
CN105792950B (zh) 2019-05-21
EP3062938B1 (en) 2022-12-07
CN109092770A (zh) 2018-12-28
EP3062938A1 (en) 2016-09-07

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