NL1015738A1 - Schuifapparaat en bijbehorend platformmechanisme voor gebruik in vacu³m. - Google Patents
Schuifapparaat en bijbehorend platformmechanisme voor gebruik in vacu³m.Info
- Publication number
- NL1015738A1 NL1015738A1 NL1015738A NL1015738A NL1015738A1 NL 1015738 A1 NL1015738 A1 NL 1015738A1 NL 1015738 A NL1015738 A NL 1015738A NL 1015738 A NL1015738 A NL 1015738A NL 1015738 A1 NL1015738 A1 NL 1015738A1
- Authority
- NL
- Netherlands
- Prior art keywords
- slider
- vacuum
- platform mechanism
- associated platform
- platform
- Prior art date
Links
Classifications
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16C—SHAFTS; FLEXIBLE SHAFTS; ELEMENTS OR CRANKSHAFT MECHANISMS; ROTARY BODIES OTHER THAN GEARING ELEMENTS; BEARINGS
- F16C32/00—Bearings not otherwise provided for
- F16C32/06—Bearings not otherwise provided for with moving member supported by a fluid cushion formed, at least to a large extent, otherwise than by movement of the shaft, e.g. hydrostatic air-cushion bearings
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16C—SHAFTS; FLEXIBLE SHAFTS; ELEMENTS OR CRANKSHAFT MECHANISMS; ROTARY BODIES OTHER THAN GEARING ELEMENTS; BEARINGS
- F16C29/00—Bearings for parts moving only linearly
- F16C29/02—Sliding-contact bearings
- F16C29/025—Hydrostatic or aerostatic
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
- G03F7/70816—Bearings
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
- G03F7/70841—Constructional issues related to vacuum environment, e.g. load-lock chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16C—SHAFTS; FLEXIBLE SHAFTS; ELEMENTS OR CRANKSHAFT MECHANISMS; ROTARY BODIES OTHER THAN GEARING ELEMENTS; BEARINGS
- F16C2300/00—Application independent of particular apparatuses
- F16C2300/40—Application independent of particular apparatuses related to environment, i.e. operating conditions
- F16C2300/62—Application independent of particular apparatuses related to environment, i.e. operating conditions low pressure, e.g. elements operating under vacuum conditions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/139—Associated with semiconductor wafer handling including wafer charging or discharging means for vacuum chamber
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T74/00—Machine element or mechanism
- Y10T74/20—Control lever and linkage systems
- Y10T74/20207—Multiple controlling elements for single controlled element
- Y10T74/20341—Power elements as controlling elements
- Y10T74/20354—Planar surface with orthogonal movement only
Applications Claiming Priority (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21424499 | 1999-07-28 | ||
JP11214244A JP2001044107A (ja) | 1999-07-28 | 1999-07-28 | 真空用スライド装置及びそのステージ機構 |
JP11227958A JP2001052988A (ja) | 1999-08-11 | 1999-08-11 | 真空用スライド装置及びそのステージ機構 |
JP22795899 | 1999-08-11 | ||
JP27388999A JP2001091681A (ja) | 1999-09-28 | 1999-09-28 | Xyステージ機構及び露光装置 |
JP27388999 | 1999-09-28 | ||
JP2000123880 | 2000-04-25 | ||
JP2000123880A JP4548898B2 (ja) | 2000-04-25 | 2000-04-25 | 真空用ステ−ジ機構 |
Publications (2)
Publication Number | Publication Date |
---|---|
NL1015738A1 true NL1015738A1 (nl) | 2001-01-30 |
NL1015738C2 NL1015738C2 (nl) | 2002-10-15 |
Family
ID=27476678
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL1015738A NL1015738C2 (nl) | 1999-07-28 | 2000-07-18 | Schuifapparaat en bijbehorend platformmechanisme voor gebruik in vacu³m. |
Country Status (3)
Country | Link |
---|---|
US (2) | US6510755B1 (nl) |
DE (1) | DE10036217A1 (nl) |
NL (1) | NL1015738C2 (nl) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001242300A (ja) * | 2000-03-02 | 2001-09-07 | Sony Corp | 電子ビーム照射装置 |
US6666611B2 (en) * | 2000-08-18 | 2003-12-23 | Nikon Corporation | Three degree of freedom joint |
JP2002170765A (ja) | 2000-12-04 | 2002-06-14 | Nikon Corp | ステージ装置及び露光装置 |
EP1327912B1 (en) * | 2001-11-30 | 2007-01-03 | ASML Netherlands B.V. | Lithographic apparatus and device manufacturing method |
KR100547943B1 (ko) * | 2001-11-30 | 2006-02-01 | 에이에스엠엘 네델란즈 비.브이. | 리소그래피장치 및 디바이스 제조방법 |
JP4031252B2 (ja) * | 2002-01-31 | 2008-01-09 | キヤノン株式会社 | 排気装置及びその制御方法並びに真空内静圧軸受 |
JP4012024B2 (ja) * | 2002-09-10 | 2007-11-21 | キヤノン株式会社 | 位置決め装置に於ける衝撃吸収装置 |
JP2004144188A (ja) * | 2002-10-24 | 2004-05-20 | Nippon Steel Corp | 静圧気体軸受 |
JP4458322B2 (ja) * | 2003-01-14 | 2010-04-28 | キヤノン株式会社 | 露光装置およびデバイス製造方法 |
JP3987811B2 (ja) * | 2003-03-20 | 2007-10-10 | 株式会社日立ハイテクノロジーズ | Xyステージ、ヘッドキャリッジおよび磁気ヘッドあるいは磁気ディスクのテスタ |
JP2004319902A (ja) * | 2003-04-18 | 2004-11-11 | Advantest Corp | ステージ装置及び露光装置 |
JP4763228B2 (ja) * | 2003-05-23 | 2011-08-31 | キヤノン株式会社 | 電子ビーム露光装置用ステージ装置、位置決め方法、電子ビーム露光装置及びデバイス製造方法 |
JP4480960B2 (ja) * | 2003-06-27 | 2010-06-16 | 東北パイオニア株式会社 | 支持ユニット並びにその支持ユニットを用いた移動テーブル装置及び直動案内装置 |
US20050004689A1 (en) * | 2003-07-02 | 2005-01-06 | Ming-Chang Shih | Design and control method of a micro-nanometer precision servo pneumatic X-Y positioning table |
DE10330506A1 (de) * | 2003-07-05 | 2005-03-31 | Leica Microsystems Semiconductor Gmbh | Vorrichtung zur Waferinspektion |
WO2006023595A2 (en) * | 2004-08-18 | 2006-03-02 | New Way Machine Components, Inc. | Moving vacuum chamber stage with air bearing and differentially pumped grooves |
GB0507681D0 (en) * | 2005-04-15 | 2005-05-25 | Westwind Air Bearings Ltd | Gas bearing spindles |
DE102005053801A1 (de) * | 2005-11-09 | 2007-05-10 | BSH Bosch und Siemens Hausgeräte GmbH | Gaslager |
US20080036084A1 (en) * | 2006-01-30 | 2008-02-14 | International Business Machines Corporation | Laser release process for very thin Si-carrier build |
US20080003377A1 (en) * | 2006-06-30 | 2008-01-03 | The Board Of Regents Of The Nevada System Of Higher Ed. On Behalf Of The Unlv | Transparent vacuum system |
US8069748B1 (en) | 2007-05-24 | 2011-12-06 | Prefix Corporation | XY linear slide mechanism |
NL1036794A1 (nl) * | 2008-04-25 | 2009-10-27 | Asml Netherlands Bv | Robot for in-vacuum use. |
US20100077877A1 (en) * | 2008-09-26 | 2010-04-01 | Ming-Hung Hsieh | Rotary micro-adjustment mechanism for a synchronous double-drive positioning platform |
KR20120007308A (ko) * | 2010-07-14 | 2012-01-20 | 삼성전자주식회사 | 액추에이터 조립체 및 이를 구비한 광학 시스템 |
EP2469339B1 (en) | 2010-12-21 | 2017-08-30 | ASML Netherlands B.V. | Lithographic apparatus and device manufacturing method |
CN102649232B (zh) * | 2011-02-28 | 2014-07-02 | 鸿富锦精密工业(深圳)有限公司 | 直线运动平台 |
CN102852972B (zh) * | 2012-05-14 | 2016-07-06 | 天津市宝坻区东亚光大地毯厂 | 地毯电针滑道装置 |
DE102012211056B4 (de) * | 2012-06-27 | 2017-01-05 | Xenon Automatisierungstechnik Gmbh | Vorrichtung zum Prozessieren von Werkstücken in einer Vakuumprozesskammer |
CN103399387B (zh) * | 2013-07-29 | 2016-01-13 | 中国科学院长春光学精密机械与物理研究所 | 光刻投影物镜系统中光学元件多气囊支撑装置 |
CN103899646B (zh) * | 2014-03-25 | 2016-04-20 | 西安理工大学 | 带磁流变液阻尼器的液体静压导轨 |
JP2016046340A (ja) * | 2014-08-21 | 2016-04-04 | 株式会社ニューフレアテクノロジー | 荷電粒子ビーム装置及び振動減衰機構 |
NL2021948A (en) | 2017-11-14 | 2019-05-17 | Asml Netherlands Bv | Object stage bearing for lithographic apparatus |
US10948043B2 (en) * | 2018-10-02 | 2021-03-16 | Hiroshi Kurabayashi | Damping device for structure |
Family Cites Families (22)
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---|---|---|---|---|
US3790155A (en) * | 1972-07-17 | 1974-02-05 | Radiant Energy Systems | X-y table for vacuum systems |
US4417770A (en) * | 1981-09-21 | 1983-11-29 | Control Data Corporation | High vacuum compatible air bearing stage |
US4462689A (en) * | 1982-07-09 | 1984-07-31 | Baker Manufacturing Company | Wide band scanning monochromator |
JPS60116506U (ja) * | 1984-01-18 | 1985-08-07 | 日本精工株式会社 | テ−ブルの超精密位置決め機構 |
DE3620969A1 (de) * | 1985-06-24 | 1987-01-02 | Canon Kk | Praezisionszufuehrmechanismus |
JPS6228518A (ja) | 1985-07-31 | 1987-02-06 | Hitachi Ltd | 静圧気体軸受 |
US5218896A (en) * | 1986-11-06 | 1993-06-15 | Canon Kabushiki Kaisha | Driving mechanism with gas bearing |
JP2587227B2 (ja) | 1987-02-06 | 1997-03-05 | キヤノン株式会社 | 気体軸受装置 |
JPH0373513A (ja) | 1989-08-15 | 1991-03-28 | Matsushita Electric Ind Co Ltd | ウエハステージ及びウエハ露光方法 |
US4984960A (en) * | 1989-11-29 | 1991-01-15 | Precision Screen Machines, Inc. | Vacuum track and pallets |
US5268954A (en) * | 1992-10-14 | 1993-12-07 | Wisconsin Alumni Research Foundation | Mounting apparatus for double crystal monochromators and the like |
DE4417770A1 (de) * | 1994-05-20 | 1995-11-23 | Gebe Elektronik Und Feinwerkte | Drucker mit einfacher Transport- und Speichermechanik zum doppelseitigen, ganzseitigen Bedrucken von Einzelblättern |
JP3090396B2 (ja) | 1994-05-31 | 2000-09-18 | 株式会社ミツトヨ | 静圧気体軸受 |
US5623853A (en) * | 1994-10-19 | 1997-04-29 | Nikon Precision Inc. | Precision motion stage with single guide beam and follower stage |
US6134981A (en) * | 1999-12-03 | 2000-10-24 | Nikon Research Corporation Of America | Precision scanning apparatus and method with fixed and movable guide members |
JP3709896B2 (ja) * | 1995-06-15 | 2005-10-26 | 株式会社ニコン | ステージ装置 |
US6222614B1 (en) * | 1996-12-06 | 2001-04-24 | Nikon Corporation | Exposure elements with a cable-relaying support |
US5784925A (en) * | 1996-12-13 | 1998-07-28 | Etec Systems, Inc. | Vacuum compatible linear motion device |
US5982132A (en) * | 1997-10-09 | 1999-11-09 | Electroglas, Inc. | Rotary wafer positioning system and method |
JPH11126817A (ja) * | 1997-10-23 | 1999-05-11 | Jeol Ltd | 高真空用ステージ |
WO1999066221A1 (fr) * | 1998-06-17 | 1999-12-23 | Nikon Corporation | Palier a gaz sous pression statique, etage mettant en oeuvre ce palier, et dispositif optique dote de cet etage |
JP4354039B2 (ja) * | 1999-04-02 | 2009-10-28 | 東京エレクトロン株式会社 | 駆動装置 |
-
2000
- 2000-07-18 NL NL1015738A patent/NL1015738C2/nl not_active IP Right Cessation
- 2000-07-25 DE DE10036217A patent/DE10036217A1/de not_active Withdrawn
- 2000-07-26 US US09/625,656 patent/US6510755B1/en not_active Expired - Fee Related
-
2002
- 2002-11-20 US US10/300,338 patent/US6732610B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
NL1015738C2 (nl) | 2002-10-15 |
DE10036217A1 (de) | 2001-03-01 |
US20030094059A1 (en) | 2003-05-22 |
US6732610B2 (en) | 2004-05-11 |
US6510755B1 (en) | 2003-01-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
AD1A | A request for search or an international type search has been filed | ||
RD2N | Patents in respect of which a decision has been taken or a report has been made (novelty report) |
Effective date: 20020809 |
|
PD2B | A search report has been drawn up | ||
V1 | Lapsed because of non-payment of the annual fee |
Effective date: 20110201 |