MY159459A - Electronic component holding device, electronic component inspecting device provided therewith, and electronic component classification device provided therewith - Google Patents
Electronic component holding device, electronic component inspecting device provided therewith, and electronic component classification device provided therewithInfo
- Publication number
- MY159459A MY159459A MYPI2013700893A MYPI2013700893A MY159459A MY 159459 A MY159459 A MY 159459A MY PI2013700893 A MYPI2013700893 A MY PI2013700893A MY PI2013700893 A MYPI2013700893 A MY PI2013700893A MY 159459 A MY159459 A MY 159459A
- Authority
- MY
- Malaysia
- Prior art keywords
- electronic component
- provided therewith
- device provided
- suction nozzle
- holding device
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/04—Mounting of components, e.g. of leadless components
- H05K13/0404—Pick-and-place heads or apparatus, e.g. with jaws
- H05K13/0413—Pick-and-place heads or apparatus, e.g. with jaws with orientation of the component while holding it; Drive mechanisms for gripping tools, e.g. lifting, lowering or turning of gripping tools
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/02—Feeding of components
- H05K13/021—Loading or unloading of containers
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
- H05K13/0813—Controlling of single components prior to mounting, e.g. orientation, component geometry
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Operations Research (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Specific Conveyance Elements (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2010/006991 WO2012073282A1 (ja) | 2010-11-30 | 2010-11-30 | 電子部品保持装置、及びこれを備える電子部品検査装置、電子部品分類装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
MY159459A true MY159459A (en) | 2017-01-13 |
Family
ID=46171274
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MYPI2013700893A MY159459A (en) | 2010-11-30 | 2010-11-30 | Electronic component holding device, electronic component inspecting device provided therewith, and electronic component classification device provided therewith |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP5252516B2 (zh) |
CN (1) | CN103229610B (zh) |
HK (1) | HK1183400A1 (zh) |
MY (1) | MY159459A (zh) |
WO (1) | WO2012073282A1 (zh) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SG11201404990XA (en) * | 2012-02-28 | 2014-11-27 | Ueno Seiki Co Ltd | Abnormal contact detecting method, electronic component holding apparatus, and electronic component carrying apparatus |
WO2014087548A1 (ja) * | 2012-12-04 | 2014-06-12 | 上野精機株式会社 | 保持手段の移動方法、電子部品保持装置、及び電子部品搬送装置 |
CN105008941B (zh) * | 2012-12-19 | 2018-12-04 | 伊斯梅卡半导体控股公司 | 用于限制力的装置和方法 |
TWI478792B (zh) * | 2012-12-27 | 2015-04-01 | Ueno Seiki Co Ltd | A method of moving the holding means, an electronic component holding means, and an electronic component handling means |
JP5555839B1 (ja) * | 2013-09-02 | 2014-07-23 | 上野精機株式会社 | 外観検査装置 |
KR101543949B1 (ko) | 2014-01-29 | 2015-08-11 | 세메스 주식회사 | 다이 본딩 헤드 및 이를 이용한 다이 본딩 방법 |
JP6329622B2 (ja) * | 2014-03-24 | 2018-05-23 | 株式会社Fuji | ダイ実装システム及びダイ実装方法 |
JP5755361B1 (ja) | 2014-07-02 | 2015-07-29 | 株式会社新川 | 実装装置 |
JP6164624B1 (ja) * | 2016-10-18 | 2017-07-19 | 上野精機株式会社 | 電子部品移動装置及び電子部品搬送装置 |
JP6543686B1 (ja) * | 2017-12-26 | 2019-07-10 | ミネベアミツミ株式会社 | 荷重センサおよび荷重センサ一体型多軸アクチュエータ |
CN108428653B (zh) * | 2018-05-23 | 2023-12-08 | 重庆市嘉凌新科技有限公司 | 功率器件封装设备 |
JP6716654B2 (ja) * | 2018-09-26 | 2020-07-01 | Ntn株式会社 | 塗布部材、塗布装置および塗布方法 |
CN110299312A (zh) * | 2019-07-04 | 2019-10-01 | 深圳市诺泰自动化设备有限公司 | 一种转塔式固晶机 |
JP6817648B1 (ja) * | 2019-09-20 | 2021-01-20 | 上野精機株式会社 | 電子部品の処理装置 |
CN111589728A (zh) * | 2020-06-24 | 2020-08-28 | 金动力智能科技(深圳)有限公司 | 一种5g网分组件的智能测试组件 |
JP6842732B1 (ja) * | 2020-09-24 | 2021-03-17 | 上野精機株式会社 | 電子部品の処理装置 |
JPWO2022195693A1 (zh) * | 2021-03-16 | 2022-09-22 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3848893B2 (ja) * | 2002-04-02 | 2006-11-22 | 松下電器産業株式会社 | 部品の基板への部品押圧接合装置及び接合方法 |
JP2007317995A (ja) * | 2006-05-29 | 2007-12-06 | I-Pulse Co Ltd | 表面実装機 |
JP5372423B2 (ja) * | 2008-07-25 | 2013-12-18 | Juki株式会社 | 電子部品搭載ヘッド |
JP5459820B2 (ja) * | 2008-12-02 | 2014-04-02 | 上野精機株式会社 | 表裏反転装置、表裏反転装置を備えたテストハンドラ |
JP2010131680A (ja) * | 2008-12-02 | 2010-06-17 | Ueno Seiki Kk | 保持手段駆動装置 |
MY159061A (en) * | 2009-05-27 | 2016-12-15 | Ueno Seiki Co Ltd | Classification apparatus |
CN102473665B (zh) * | 2009-07-17 | 2014-11-19 | 上野精机株式会社 | 重新粘贴装置以及分类重新粘贴方法 |
-
2010
- 2010-11-30 WO PCT/JP2010/006991 patent/WO2012073282A1/ja active Application Filing
- 2010-11-30 CN CN201080070390.XA patent/CN103229610B/zh active Active
- 2010-11-30 JP JP2012546570A patent/JP5252516B2/ja active Active
- 2010-11-30 MY MYPI2013700893A patent/MY159459A/en unknown
-
2013
- 2013-09-17 HK HK13110712.1A patent/HK1183400A1/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
CN103229610A (zh) | 2013-07-31 |
HK1183400A1 (zh) | 2013-12-20 |
JP5252516B2 (ja) | 2013-07-31 |
WO2012073282A1 (ja) | 2012-06-07 |
CN103229610B (zh) | 2016-01-20 |
JPWO2012073282A1 (ja) | 2014-05-19 |
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