MY121566A - Autohandler and method of measuring devices using the autohandler. - Google Patents

Autohandler and method of measuring devices using the autohandler.

Info

Publication number
MY121566A
MY121566A MYPI95002989A MYPI9502989A MY121566A MY 121566 A MY121566 A MY 121566A MY PI95002989 A MYPI95002989 A MY PI95002989A MY PI9502989 A MYPI9502989 A MY PI9502989A MY 121566 A MY121566 A MY 121566A
Authority
MY
Malaysia
Prior art keywords
externals
autohandler
devices
electrical characteristics
testing
Prior art date
Application number
MYPI95002989A
Other languages
English (en)
Inventor
Toshio Goto
Aritomo Kikuchi
Hisao Hayama
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of MY121566A publication Critical patent/MY121566A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Health & Medical Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Immunology (AREA)
  • Power Engineering (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
MYPI95002989A 1994-10-06 1995-10-06 Autohandler and method of measuring devices using the autohandler. MY121566A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6268230A JPH08105937A (ja) 1994-10-06 1994-10-06 デバイス・テスタ用オートハンドラ及びその装置のデバイス測定方法

Publications (1)

Publication Number Publication Date
MY121566A true MY121566A (en) 2006-02-28

Family

ID=17455720

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI95002989A MY121566A (en) 1994-10-06 1995-10-06 Autohandler and method of measuring devices using the autohandler.

Country Status (6)

Country Link
JP (1) JPH08105937A (ja)
KR (1) KR0162001B1 (ja)
CN (1) CN1102239C (ja)
DE (1) DE19581448C2 (ja)
MY (1) MY121566A (ja)
WO (1) WO1996011392A1 (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL133696A (en) * 1999-12-23 2006-04-10 Orbotech Ltd Cam reference inspection of multi-color and contour images
KR100339014B1 (ko) * 2000-06-02 2002-06-03 김종현 메모리 모듈 비전 검사기
JP4588913B2 (ja) * 2001-04-13 2010-12-01 ヤマハ発動機株式会社 部品搬送装置
JP4566482B2 (ja) * 2001-09-07 2010-10-20 ヤマハ発動機株式会社 部品試験装置
KR100468867B1 (ko) * 2002-05-02 2005-01-29 삼성테크윈 주식회사 부품 검사 및, 분류 방법
JP4372599B2 (ja) * 2004-03-31 2009-11-25 株式会社 東京ウエルズ ワークの分類排出方法
KR100934029B1 (ko) * 2007-06-18 2009-12-28 (주)테크윙 테스트핸들러의 로딩방법
JP5128920B2 (ja) * 2007-12-03 2013-01-23 芝浦メカトロニクス株式会社 基板表面検査装置及び基板表面検査方法
KR101168316B1 (ko) * 2009-12-01 2012-07-25 삼성전자주식회사 발광다이오드 검사 장치

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62174889A (ja) * 1986-01-27 1987-07-31 Fujitsu Ltd 照明条件解析方法および装置
JPH01236640A (ja) * 1988-03-17 1989-09-21 Tokyo Electron Ltd 半導体チップの外観検査装置
JP2587998B2 (ja) * 1988-06-08 1997-03-05 株式会社日立製作所 外観検査装置
JP2751435B2 (ja) * 1989-07-17 1998-05-18 松下電器産業株式会社 電子部品の半田付状態の検査方法
DE4019226A1 (de) * 1990-06-15 1991-12-19 Grundig Emv Vorrichtung zur beleuchtung von leiterplatten in leiterplattenpruefeinrichtungen
AU649291B2 (en) * 1990-12-19 1994-05-19 Bodenseewerk Geratetechnik Gmbh Process and apparatus for examining optical components, especially optical components for the eye and device for illuminating clear-transparent test-objects
JPH05275570A (ja) * 1992-03-27 1993-10-22 Nippon Steel Corp 半導体装置
JPH05340889A (ja) * 1992-06-10 1993-12-24 Nippon Avionics Co Ltd 対象物のモニタ画像表示方法およびその装置
JPH06167459A (ja) * 1992-11-30 1994-06-14 Hitachi Ltd 半導体装置の検査装置およびそれに使用されるローディング装置、トレイ段積み装置、保持装置、位置決め装置

Also Published As

Publication number Publication date
DE19581448T1 (de) 1997-03-27
CN1138898A (zh) 1996-12-25
JPH08105937A (ja) 1996-04-23
CN1102239C (zh) 2003-02-26
WO1996011392A1 (fr) 1996-04-18
KR960706633A (ko) 1996-12-09
KR0162001B1 (ko) 1999-03-30
DE19581448C2 (de) 2002-06-20

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