MY115726A - Guest tray transfer apparatus of semiconductor device tester - Google Patents

Guest tray transfer apparatus of semiconductor device tester

Info

Publication number
MY115726A
MY115726A MYPI96001078A MYPI9601078A MY115726A MY 115726 A MY115726 A MY 115726A MY PI96001078 A MYPI96001078 A MY PI96001078A MY PI9601078 A MYPI9601078 A MY PI9601078A MY 115726 A MY115726 A MY 115726A
Authority
MY
Malaysia
Prior art keywords
guest
loader
unloader
stacker
guest tray
Prior art date
Application number
MYPI96001078A
Inventor
Woo Yeol Park
Original Assignee
Mirae Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=19412320&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=MY115726(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Mirae Corp filed Critical Mirae Corp
Publication of MY115726A publication Critical patent/MY115726A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/6773—Conveying cassettes, containers or carriers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67736—Loading to or unloading from a conveyor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Types And Forms Of Lifts (AREA)
  • Stacking Of Articles And Auxiliary Devices (AREA)
  • Warehouses Or Storage Devices (AREA)

Abstract

A GUEST TRAY TRANSFERRING APPARATUS OF A SEMICONDUCTOR DEVICE TESTER FOR TRANSFERRING GUEST TRAYS (3) LOADED AT THE UPPER AND LOWER PORTIONS OF A STACKER (2) OF A LOADER/UNLOADER (1) PORTION TO A STAGE OF THE LOADER/UNLOADER (1) PORTION, INCLUDING A LOADER/UNLOADER (1) PORTION WHERE A GUEST TRAY (3) IS SELECTIVELY LOADED/UNLOADED, A STACKER (2) DISPOSED UNDER THE LOADER/UNLOADER (1) PORTION, CONTAINING A MULTITUDE OF THE GUEST TRAYS (3), A HOLDING DEVICE (10) FOR HOLDING AND SEPARATING THE GUEST TRAY (3) FROM THE STACKER (2) BY HORIZONTALLY MOVING BETWEEN THE LOADER/UNLOADER (1) PORTION AND THE STACKER (2) AND SELECTIVELY MOVING TOWARD THE UPPER SURFACE OF THE GUEST TRAY (3), AND A PLACING PLATE (13) FOR ASCENDING THE GUEST TRAY (3) FROM THE LOADER/UNLOADER PORTION WHEN THE HOLDING DEVICE (10) SEPARATES FROM THE STACKER (2) BY HORIZONTAL MOVEMENT AFTER RECEIVING THE GUEST TRAY (3) SEPARATED BY THE HOLDING DEVICE (10). (FIG. 2)
MYPI96001078A 1995-04-17 1996-03-22 Guest tray transfer apparatus of semiconductor device tester MY115726A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950008975A KR0143334B1 (en) 1995-04-17 1995-04-17 The customer tray conveyor for the tester of semiconductor device

Publications (1)

Publication Number Publication Date
MY115726A true MY115726A (en) 2003-08-30

Family

ID=19412320

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI96001078A MY115726A (en) 1995-04-17 1996-03-22 Guest tray transfer apparatus of semiconductor device tester

Country Status (4)

Country Link
JP (1) JPH08290830A (en)
KR (1) KR0143334B1 (en)
DE (1) DE19613616A1 (en)
MY (1) MY115726A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100287558B1 (en) * 1998-12-09 2001-11-02 정문술 device and method for circulating pallet ot elevator wnit in modrl I.C handler
KR102312865B1 (en) * 2015-06-25 2021-10-14 세메스 주식회사 Unit for loading customer tray
KR102322242B1 (en) * 2015-09-16 2021-11-05 (주)테크윙 Stacker of handler for testing semiconductor and handler for testing semiconductor
KR102183377B1 (en) * 2019-03-20 2020-11-26 마구야오 Vertical conveyor for agv, vertical conveyor system for agv, vertical conveyor for pallet and vertical conveyor system for pallet
CN110993536B (en) * 2019-12-18 2021-01-22 深圳新美化光电设备有限公司 Chip picking and placing operation device of chip detection jig

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4930205Y1 (en) * 1969-09-06 1974-08-15
JPS5118162Y2 (en) * 1971-02-23 1976-05-15
JPS62191786U (en) * 1986-05-27 1987-12-05
JPH01187192A (en) * 1988-01-18 1989-07-26 Kanayama Kikai Kk Holding tool for hoisting transporting box
EP0391707A1 (en) * 1989-04-05 1990-10-10 Sanyo Electric Co., Ltd. Parts feeding apparatus
DE3912590A1 (en) * 1989-04-17 1990-10-18 Willberg Hans Heinrich DEVICE FOR LOADING AND / OR UNLOADING ELECTRONIC COMPONENTS, IN PARTICULAR IC'S, ON OR FROM CARRIERS
KR950001245Y1 (en) * 1991-09-13 1995-02-24 금성일렉트론 주식회사 Apparatus for autotransmitting device of handler
JP3372586B2 (en) * 1993-04-19 2003-02-04 株式会社アドバンテスト Loader / Unloader for IC test equipment
JP2595207Y2 (en) * 1993-04-28 1999-05-24 株式会社アドバンテスト Tray transport device for IC test equipment
JPH0712378U (en) * 1993-08-03 1995-02-28 健 和美 A suspender with a spring inside
TW287235B (en) * 1994-06-30 1996-10-01 Zenshin Test Co

Also Published As

Publication number Publication date
JPH08290830A (en) 1996-11-05
KR960038410A (en) 1996-11-21
KR0143334B1 (en) 1998-08-17
DE19613616A1 (en) 1996-10-24

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