KR970053266A - General-purpose inspection board applied to the same integrated circuit device of different package types - Google Patents
General-purpose inspection board applied to the same integrated circuit device of different package types Download PDFInfo
- Publication number
- KR970053266A KR970053266A KR1019950068099A KR19950068099A KR970053266A KR 970053266 A KR970053266 A KR 970053266A KR 1019950068099 A KR1019950068099 A KR 1019950068099A KR 19950068099 A KR19950068099 A KR 19950068099A KR 970053266 A KR970053266 A KR 970053266A
- Authority
- KR
- South Korea
- Prior art keywords
- integrated circuit
- circuit device
- socket
- wiring pattern
- general
- Prior art date
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
본 발명은 동일한 제품이 패키지 유형만 다를 경우 검사용 기판 및 프로그램을 별도로 제작하지 않고 동일한 검사용 기판을 사용하여 소자의 전기적인 특성 검사가 가능하도록 하기 위해서, 패키지된 집적회로 소자의 전기적 특성을 검사하는 데에 사용되며, 검사장비와 전기적으로 연결되는 코넥터와, 상기 코넥터와 연결되는 전도성 배선 패턴을 갖는 검사용 기판에 있어서, 상기 집적회로 소자가 실장되는 소켓의 핀이 삽입 실장되는 복수 개의 핀 삽입 구멍이 배열되어 있는 소켓 실장 영역을 구비하며, 상기 핀 삽입 구멍은 상기 전도성 배선 패턴과 연결되어 있는 것을 특징으로 하는 검사용 기판이 개시되어 있다.The present invention is to inspect the electrical characteristics of the packaged integrated circuit device in order to enable the electrical characteristics of the device using the same inspection substrate without separately producing a test board and a program if the same product is different only in the package type In the inspection substrate having a connector electrically connected to the inspection equipment, and a conductive wiring pattern connected to the connector, a plurality of pin insertion is inserted into the pin of the socket on which the integrated circuit element is mounted Disclosed is a test substrate having a socket mounting region in which holes are arranged, wherein the pin insertion hole is connected to the conductive wiring pattern.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.
제2도는 본 발명에 따른 검사용 기판과 이 검사용 기판에 삽입 실장되는 기판 소켓 및 이 기판 소켓에 삽입 실장되는 집적회로 소자를 나타내는 사시도2 is a perspective view showing an inspection substrate according to the present invention, a substrate socket inserted into and mounted on the inspection substrate, and an integrated circuit element inserted into and mounted on the substrate socket.
Claims (3)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950068099A KR970053266A (en) | 1995-12-30 | 1995-12-30 | General-purpose inspection board applied to the same integrated circuit device of different package types |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950068099A KR970053266A (en) | 1995-12-30 | 1995-12-30 | General-purpose inspection board applied to the same integrated circuit device of different package types |
Publications (1)
Publication Number | Publication Date |
---|---|
KR970053266A true KR970053266A (en) | 1997-07-31 |
Family
ID=66638393
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950068099A KR970053266A (en) | 1995-12-30 | 1995-12-30 | General-purpose inspection board applied to the same integrated circuit device of different package types |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR970053266A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100868452B1 (en) * | 2006-12-08 | 2008-11-11 | 동부일렉트로닉스 주식회사 | Universal Package Test Board Assembly |
KR100897153B1 (en) * | 2002-09-05 | 2009-05-14 | 주식회사 케이티 | Component Software Devices Design Method to use Multi-Plug |
KR20120012511A (en) * | 2010-08-02 | 2012-02-10 | 세크론 주식회사 | Apparatus for inspecting a hi-fix board |
-
1995
- 1995-12-30 KR KR1019950068099A patent/KR970053266A/en not_active Application Discontinuation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100897153B1 (en) * | 2002-09-05 | 2009-05-14 | 주식회사 케이티 | Component Software Devices Design Method to use Multi-Plug |
KR100868452B1 (en) * | 2006-12-08 | 2008-11-11 | 동부일렉트로닉스 주식회사 | Universal Package Test Board Assembly |
KR20120012511A (en) * | 2010-08-02 | 2012-02-10 | 세크론 주식회사 | Apparatus for inspecting a hi-fix board |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WITN | Withdrawal due to no request for examination |