KR970053266A - General-purpose inspection board applied to the same integrated circuit device of different package types - Google Patents

General-purpose inspection board applied to the same integrated circuit device of different package types Download PDF

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Publication number
KR970053266A
KR970053266A KR1019950068099A KR19950068099A KR970053266A KR 970053266 A KR970053266 A KR 970053266A KR 1019950068099 A KR1019950068099 A KR 1019950068099A KR 19950068099 A KR19950068099 A KR 19950068099A KR 970053266 A KR970053266 A KR 970053266A
Authority
KR
South Korea
Prior art keywords
integrated circuit
circuit device
socket
wiring pattern
general
Prior art date
Application number
KR1019950068099A
Other languages
Korean (ko)
Inventor
조인섭
김종우
김정동
이진석
Original Assignee
김광호
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 김광호, 삼성전자 주식회사 filed Critical 김광호
Priority to KR1019950068099A priority Critical patent/KR970053266A/en
Publication of KR970053266A publication Critical patent/KR970053266A/en

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Abstract

본 발명은 동일한 제품이 패키지 유형만 다를 경우 검사용 기판 및 프로그램을 별도로 제작하지 않고 동일한 검사용 기판을 사용하여 소자의 전기적인 특성 검사가 가능하도록 하기 위해서, 패키지된 집적회로 소자의 전기적 특성을 검사하는 데에 사용되며, 검사장비와 전기적으로 연결되는 코넥터와, 상기 코넥터와 연결되는 전도성 배선 패턴을 갖는 검사용 기판에 있어서, 상기 집적회로 소자가 실장되는 소켓의 핀이 삽입 실장되는 복수 개의 핀 삽입 구멍이 배열되어 있는 소켓 실장 영역을 구비하며, 상기 핀 삽입 구멍은 상기 전도성 배선 패턴과 연결되어 있는 것을 특징으로 하는 검사용 기판이 개시되어 있다.The present invention is to inspect the electrical characteristics of the packaged integrated circuit device in order to enable the electrical characteristics of the device using the same inspection substrate without separately producing a test board and a program if the same product is different only in the package type In the inspection substrate having a connector electrically connected to the inspection equipment, and a conductive wiring pattern connected to the connector, a plurality of pin insertion is inserted into the pin of the socket on which the integrated circuit element is mounted Disclosed is a test substrate having a socket mounting region in which holes are arranged, wherein the pin insertion hole is connected to the conductive wiring pattern.

Description

패키지 유형이 다른 동일 집적회로 소자에 적용되는 범용 검사용 기판General-purpose inspection board applied to the same integrated circuit device of different package types

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제2도는 본 발명에 따른 검사용 기판과 이 검사용 기판에 삽입 실장되는 기판 소켓 및 이 기판 소켓에 삽입 실장되는 집적회로 소자를 나타내는 사시도2 is a perspective view showing an inspection substrate according to the present invention, a substrate socket inserted into and mounted on the inspection substrate, and an integrated circuit element inserted into and mounted on the substrate socket.

Claims (3)

패키지된 집적회로 소자의 전기적 특성을 검사하는 데에 사용되며, 검사장비와 전기적으로 연결되는 코넥터와, 상기 코넥터와 연결되는 전도성 배선 패턴을 갖는 검사용 기판에 있어서, 상기 집적회로 소자가 실장되는 소켓의 핀이 삽입 실장되는 복수 개의 핀 삽입 구멍이 배열되어 있는 소켓 실장 영역을 구비하며, 상기 핀 삽입 구멍은 상기 전도성 배선 패턴과 연결되어 있는 것을 특징으로 하는 집적회로 소자 검사용 기판An inspection board having a connector electrically connected to an inspection device and a conductive wiring pattern connected to the connector, the socket for mounting the integrated circuit device to inspect electrical characteristics of a packaged integrated circuit device. And a socket mounting area in which a plurality of pin insertion holes into which pins are inserted are arranged, and the pin insertion holes are connected to the conductive wiring pattern. 제1항에 있어서, 상기 소켓은 집적회로 소자의 리드와 연결되는 것을 리드 삽입 구멍과, 상기 리드 삽입 구멍과 상기 소켓 핀을 전기적으로 연결시키는 전도성 배선을 구비하는 것을 특징으로 하는 집적회로 소자 검사용 기판.2. The integrated circuit device test according to claim 1, wherein the socket has a lead insertion hole connecting the lead of the integrated circuit device and a conductive wire electrically connecting the lead insertion hole and the socket pin. Board. 제1항에 있어서, 상기 리드 삽입 구멍의 배열은 상기 집적회로 소자의 패키지 유형과 대응하는 것을 특징으로 하는 집적회로 소자 검사용 기판.The substrate of claim 1, wherein the arrangement of the lead insertion holes corresponds to a package type of the integrated circuit device. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950068099A 1995-12-30 1995-12-30 General-purpose inspection board applied to the same integrated circuit device of different package types KR970053266A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950068099A KR970053266A (en) 1995-12-30 1995-12-30 General-purpose inspection board applied to the same integrated circuit device of different package types

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950068099A KR970053266A (en) 1995-12-30 1995-12-30 General-purpose inspection board applied to the same integrated circuit device of different package types

Publications (1)

Publication Number Publication Date
KR970053266A true KR970053266A (en) 1997-07-31

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950068099A KR970053266A (en) 1995-12-30 1995-12-30 General-purpose inspection board applied to the same integrated circuit device of different package types

Country Status (1)

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KR (1) KR970053266A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100868452B1 (en) * 2006-12-08 2008-11-11 동부일렉트로닉스 주식회사 Universal Package Test Board Assembly
KR100897153B1 (en) * 2002-09-05 2009-05-14 주식회사 케이티 Component Software Devices Design Method to use Multi-Plug
KR20120012511A (en) * 2010-08-02 2012-02-10 세크론 주식회사 Apparatus for inspecting a hi-fix board

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100897153B1 (en) * 2002-09-05 2009-05-14 주식회사 케이티 Component Software Devices Design Method to use Multi-Plug
KR100868452B1 (en) * 2006-12-08 2008-11-11 동부일렉트로닉스 주식회사 Universal Package Test Board Assembly
KR20120012511A (en) * 2010-08-02 2012-02-10 세크론 주식회사 Apparatus for inspecting a hi-fix board

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