KR970075924A - Tester Interface - Google Patents

Tester Interface Download PDF

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Publication number
KR970075924A
KR970075924A KR1019960016397A KR19960016397A KR970075924A KR 970075924 A KR970075924 A KR 970075924A KR 1019960016397 A KR1019960016397 A KR 1019960016397A KR 19960016397 A KR19960016397 A KR 19960016397A KR 970075924 A KR970075924 A KR 970075924A
Authority
KR
South Korea
Prior art keywords
test board
conductive
connector
control unit
conductive cable
Prior art date
Application number
KR1019960016397A
Other languages
Korean (ko)
Other versions
KR100217068B1 (en
Inventor
조의선
Original Assignee
박병재
현대자동차 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 박병재, 현대자동차 주식회사 filed Critical 박병재
Priority to KR1019960016397A priority Critical patent/KR100217068B1/en
Publication of KR970075924A publication Critical patent/KR970075924A/en
Application granted granted Critical
Publication of KR100217068B1 publication Critical patent/KR100217068B1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/005—Testing of electric installations on transport means
    • G01R31/006—Testing of electric installations on transport means on road vehicles, e.g. automobiles or trucks

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Combustion & Propulsion (AREA)
  • Connections Arranged To Contact A Plurality Of Conductors (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)

Abstract

차량에 장착되는 전기 및 전자장치의 데이타 값 측정시에 피복을 상하게 하지 않고 소정의 측정 데이타 값을 측정할 수 있도록 함으로서 완성 차량의 품질을 증대시키고, 측정데이타의 신뢰도를 향상시키기 위하여, 차량의 전기 및 전자장치와 연결되는 다수의 도전 케이블과 연결되는 컨넥터와, 상기 컨넥터와 또다른 컨넥터와 연결되며 다수의 도전 케이블과 연결되며 도전 케이블을 통하여 전기 및 전자장치를 제어하는 컨트롤 유닛과, 상기 컨넥터와 컨트롤 유닛을 연결하는 도전 케이블의 중간부를 분지하여 역시 컨넥터로 연결되며 도전 케이블과 대응하도록 다수의 단자공이 형성되는 테스트 보드와, 상기 테스트 보드의 단자공과 연결되어 도선 케이블을 통하여 소정의 데이타 값을 측정하는 측정기를 포함하는 테스터기 인터페이스를 제공한다.In order to increase the quality of the finished vehicle and improve the reliability of the measurement data by making it possible to measure a predetermined measurement data value without damaging the cover during the measurement of the data values of the electric and electronic devices mounted on the vehicle, A control unit connected to the connector and connected to the plurality of conductive cables and controlling the electric and electronic devices through a conductive cable; and a control unit connected to the connector and the plurality of conductive cables, A test board having a terminal board connected to the test board through which a middle part of a conductive cable connecting the control unit is branched and connected to the test board so as to correspond to the conductive cable; To provide a tester interface .

Description

테스터기 인터페이스Tester Interface

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is a trivial issue, I did not include the contents of the text.

제1도는 본 발명에 따른 실시예를 도시한 구성도, 제2도는 본 발명에 따른 테스터기 인터페이스를 도시한 사시도.FIG. 1 is a configuration diagram showing an embodiment according to the present invention, and FIG. 2 is a perspective view showing a tester interface according to the present invention.

Claims (2)

차량의 전기 및 전자장치와 연결되는 다수의 도전 케이블(7)과 연결되는 컨넥터(3)와, 상기 컨넥터(3)와 또다른 컨넥터(5)와 연결되며 다수의 도전 케이블(7)과 연결되며 도전 케이블(7)을 통하여 전기 및 전자장치를 제어하는 컨트롤 유닛(9)과, 상기 컨넥터(3)와 컨트롤 유닛(9)을 연결하는 도전 케이블(7)의 중간부를 분지하여 연결되며 도전 케이블(7)과 대응하도록 다수의 단자공(15)이 형성되는 테스트 보드(11)와, 상기 테스트 보드(11)의 단자공(15)과 연결되어 도선 케이블을 통하여 소정의 데이타 값을 측정하는 측정기(23)을 포함하는 테스터기 인터페이스.A connector 3 connected to a plurality of conductive cables 7 connected to electrical and electronic devices of the vehicle and connected to the connector 3 and another connector 5 and connected to a plurality of conductive cables 7, A control unit 9 for controlling the electric and electronic devices through the conductive cable 7 and a conductive cable 7 connected to the intermediate portion of the conductive cable 7 connecting the connector 3 and the control unit 9, A test board 11 in which a plurality of terminal holes 15 are formed so as to correspond to the test board 11 and a meter 15 for measuring predetermined data values through a lead cable connected to the terminal holes 15 of the test board 11 23). 제1항에 있어서, 테스트 보드(11)는 일면에 형성되는 다수의 단자공(15)과 도전 케이블(21)로 연결되며 컨넥터(13)가 끼움 결합될 수 있도록 측면에는 다수의 도전핀(19)이 형성됨을 특징으로 하는 테스터기 인터페이스.The test board according to claim 1, wherein the test board is connected to a plurality of terminal holes formed on one surface by a conductive cable and a plurality of conductive fins are formed on a side surface of the test board, ) Is formed on the surface of the tester. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: It is disclosed by the contents of the first application.
KR1019960016397A 1996-05-16 1996-05-16 Test instrument interface KR100217068B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019960016397A KR100217068B1 (en) 1996-05-16 1996-05-16 Test instrument interface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019960016397A KR100217068B1 (en) 1996-05-16 1996-05-16 Test instrument interface

Publications (2)

Publication Number Publication Date
KR970075924A true KR970075924A (en) 1997-12-10
KR100217068B1 KR100217068B1 (en) 1999-09-01

Family

ID=19458884

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019960016397A KR100217068B1 (en) 1996-05-16 1996-05-16 Test instrument interface

Country Status (1)

Country Link
KR (1) KR100217068B1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20000025232A (en) * 1998-10-09 2000-05-06 김영환 Bit error rate test board supporting multiple driver/receiver in cdma system

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100796022B1 (en) 2006-05-23 2008-01-21 한국단자공업 주식회사 Apparatus for testing of intelligent power distribution module

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20000025232A (en) * 1998-10-09 2000-05-06 김영환 Bit error rate test board supporting multiple driver/receiver in cdma system

Also Published As

Publication number Publication date
KR100217068B1 (en) 1999-09-01

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