KR970003752A - 반도체장치와 그 검사방법 - Google Patents

반도체장치와 그 검사방법 Download PDF

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Publication number
KR970003752A
KR970003752A KR1019960020435A KR19960020435A KR970003752A KR 970003752 A KR970003752 A KR 970003752A KR 1019960020435 A KR1019960020435 A KR 1019960020435A KR 19960020435 A KR19960020435 A KR 19960020435A KR 970003752 A KR970003752 A KR 970003752A
Authority
KR
South Korea
Prior art keywords
semiconductor device
inspection method
inspection
semiconductor
Prior art date
Application number
KR1019960020435A
Other languages
English (en)
Other versions
KR100234492B1 (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of KR970003752A publication Critical patent/KR970003752A/ko
Application granted granted Critical
Publication of KR100234492B1 publication Critical patent/KR100234492B1/ko

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/148—Charge coupled imagers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00—Details of apparatus for conversion
    • H02M1/08—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electromagnetism (AREA)
  • General Engineering & Computer Science (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Semiconductor Integrated Circuits (AREA)
KR1019960020435A 1995-06-08 1996-06-08 반도체장치와 그 검사방법 KR100234492B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP95-142000 1995-06-08
JP14200095 1995-06-08

Publications (2)

Publication Number Publication Date
KR970003752A true KR970003752A (ko) 1997-01-28
KR100234492B1 KR100234492B1 (ko) 1999-12-15

Family

ID=15305061

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019960020435A KR100234492B1 (ko) 1995-06-08 1996-06-08 반도체장치와 그 검사방법

Country Status (3)

Country Link
KR (1) KR100234492B1 (ko)
SG (1) SG81896A1 (ko)
TW (1) TW364238B (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100596869B1 (ko) 2003-02-10 2006-07-04 주식회사 하이닉스반도체 특성 조절 장치를 구비한 반도체 장치의 내부전압 발생장치
CN102396059A (zh) * 2009-04-15 2012-03-28 住友化学株式会社 半导体基板的电气特性的测量方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4077035A (en) * 1976-05-10 1978-02-28 International Business Machines Corporation Two-stage weighted capacitor circuit for analog-to-digital and digital-to-analog converters
JP2601933B2 (ja) * 1990-04-13 1997-04-23 株式会社東芝 固体撮像装置
JP2725714B2 (ja) * 1991-01-04 1998-03-11 シャープ株式会社 Ｃｃｄ固体撮像素子

Also Published As

Publication number Publication date
TW364238B (en) 1999-07-11
KR100234492B1 (ko) 1999-12-15
SG81896A1 (en) 2001-07-24

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