TW364238B - Semiconductor device containing an adjustable voltage generator - Google Patents
Semiconductor device containing an adjustable voltage generatorInfo
- Publication number
- TW364238B TW364238B TW085106637A TW85106637A TW364238B TW 364238 B TW364238 B TW 364238B TW 085106637 A TW085106637 A TW 085106637A TW 85106637 A TW85106637 A TW 85106637A TW 364238 B TW364238 B TW 364238B
- Authority
- TW
- Taiwan
- Prior art keywords
- potential
- semiconductor device
- voltage generator
- capacitors
- voltage
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 4
- 239000003990 capacitor Substances 0.000 abstract 4
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/08—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Semiconductor Integrated Circuits (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14200095 | 1995-06-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW364238B true TW364238B (en) | 1999-07-11 |
Family
ID=15305061
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW085106637A TW364238B (en) | 1995-06-08 | 1996-06-03 | Semiconductor device containing an adjustable voltage generator |
Country Status (3)
| Country | Link |
|---|---|
| KR (1) | KR100234492B1 (ko) |
| SG (1) | SG81896A1 (ko) |
| TW (1) | TW364238B (ko) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI456214B (zh) * | 2009-04-15 | 2014-10-11 | Sumitomo Chemical Co | 半導體基板的電氣特性之測定方法 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100596869B1 (ko) | 2003-02-10 | 2006-07-04 | 주식회사 하이닉스반도체 | 특성 조절 장치를 구비한 반도체 장치의 내부전압 발생장치 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4077035A (en) * | 1976-05-10 | 1978-02-28 | International Business Machines Corporation | Two-stage weighted capacitor circuit for analog-to-digital and digital-to-analog converters |
| JP2601933B2 (ja) * | 1990-04-13 | 1997-04-23 | 株式会社東芝 | 固体撮像装置 |
| JP2725714B2 (ja) * | 1991-01-04 | 1998-03-11 | シャープ株式会社 | Ｃｃｄ固体撮像素子 |
-
1996
- 1996-06-03 TW TW085106637A patent/TW364238B/zh active
- 1996-06-08 SG SG9610035A patent/SG81896A1/en unknown
- 1996-06-08 KR KR1019960020435A patent/KR100234492B1/ko not_active IP Right Cessation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI456214B (zh) * | 2009-04-15 | 2014-10-11 | Sumitomo Chemical Co | 半導體基板的電氣特性之測定方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR100234492B1 (ko) | 1999-12-15 |
| KR970003752A (ko) | 1997-01-28 |
| SG81896A1 (en) | 2001-07-24 |
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