SG81896A1 - Semiconductor device containing an adjustable voltage generator - Google Patents

Semiconductor device containing an adjustable voltage generator

Info

Publication number
SG81896A1
SG81896A1 SG9610035A SG1996010035A SG81896A1 SG 81896 A1 SG81896 A1 SG 81896A1 SG 9610035 A SG9610035 A SG 9610035A SG 1996010035 A SG1996010035 A SG 1996010035A SG 81896 A1 SG81896 A1 SG 81896A1
Authority
SG
Singapore
Prior art keywords
semiconductor device
voltage generator
device containing
adjustable voltage
adjustable
Prior art date
Application number
SG9610035A
Inventor
Asaumi Masaji
Matsuda Yuji
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Publication of SG81896A1 publication Critical patent/SG81896A1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/148—Charge coupled imagers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00—Details of apparatus for conversion
    • H02M1/08—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Engineering & Computer Science (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Semiconductor Integrated Circuits (AREA)
SG9610035A 1995-06-08 1996-06-08 Semiconductor device containing an adjustable voltage generator SG81896A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14200095 1995-06-08

Publications (1)

Publication Number Publication Date
SG81896A1 true SG81896A1 (en) 2001-07-24

Family

ID=15305061

Family Applications (1)

Application Number Title Priority Date Filing Date
SG9610035A SG81896A1 (en) 1995-06-08 1996-06-08 Semiconductor device containing an adjustable voltage generator

Country Status (3)

Country Link
KR (1) KR100234492B1 (en)
SG (1) SG81896A1 (en)
TW (1) TW364238B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100596869B1 (en) 2003-02-10 2006-07-04 주식회사 하이닉스반도체 An Internal Voltage Generator of a Semiconductor Device Comprising a Device for Controlling a Characteristic of a Internal Voltage
WO2010119666A1 (en) * 2009-04-15 2010-10-21 住友化学株式会社 Method for measuring electrical characteristics of semiconductor substrate

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4077035A (en) * 1976-05-10 1978-02-28 International Business Machines Corporation Two-stage weighted capacitor circuit for analog-to-digital and digital-to-analog converters
EP0451856A1 (en) * 1990-04-13 1991-10-16 Kabushiki Kaisha Toshiba Solid-state image sensing device
EP0494104A2 (en) * 1991-01-04 1992-07-08 Sharp Kabushiki Kaisha A CCD imager

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4077035A (en) * 1976-05-10 1978-02-28 International Business Machines Corporation Two-stage weighted capacitor circuit for analog-to-digital and digital-to-analog converters
EP0451856A1 (en) * 1990-04-13 1991-10-16 Kabushiki Kaisha Toshiba Solid-state image sensing device
EP0494104A2 (en) * 1991-01-04 1992-07-08 Sharp Kabushiki Kaisha A CCD imager

Also Published As

Publication number Publication date
KR970003752A (en) 1997-01-28
KR100234492B1 (en) 1999-12-15
TW364238B (en) 1999-07-11

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