KR950023961U - 반도체 소자 검사용 테스트 보드 - Google Patents

반도체 소자 검사용 테스트 보드

Info

Publication number
KR950023961U
KR950023961U KR2019940001268U KR19940001268U KR950023961U KR 950023961 U KR950023961 U KR 950023961U KR 2019940001268 U KR2019940001268 U KR 2019940001268U KR 19940001268 U KR19940001268 U KR 19940001268U KR 950023961 U KR950023961 U KR 950023961U
Authority
KR
South Korea
Prior art keywords
semiconductor device
test board
device inspection
inspection
board
Prior art date
Application number
KR2019940001268U
Other languages
English (en)
Other versions
KR200169513Y1 (ko
Inventor
이창용
Original Assignee
현대반도체주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 현대반도체주식회사 filed Critical 현대반도체주식회사
Priority to KR2019940001268U priority Critical patent/KR200169513Y1/ko
Publication of KR950023961U publication Critical patent/KR950023961U/ko
Application granted granted Critical
Publication of KR200169513Y1 publication Critical patent/KR200169513Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F7/00—Magnets
    • H01F7/02—Permanent magnets [PM]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Electromagnetism (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019940001268U 1994-01-24 1994-01-24 반도체 소자 검사용 테스트 보드 KR200169513Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019940001268U KR200169513Y1 (ko) 1994-01-24 1994-01-24 반도체 소자 검사용 테스트 보드

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940001268U KR200169513Y1 (ko) 1994-01-24 1994-01-24 반도체 소자 검사용 테스트 보드

Publications (2)

Publication Number Publication Date
KR950023961U true KR950023961U (ko) 1995-08-23
KR200169513Y1 KR200169513Y1 (ko) 2000-02-01

Family

ID=19376167

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019940001268U KR200169513Y1 (ko) 1994-01-24 1994-01-24 반도체 소자 검사용 테스트 보드

Country Status (1)

Country Link
KR (1) KR200169513Y1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102547617B1 (ko) * 2022-06-23 2023-06-26 큐알티 주식회사 가속환경 제공 반도체 소자 테스트 장치 및 이를 이용한 가속환경에서 반도체 소자 테스트 방법

Also Published As

Publication number Publication date
KR200169513Y1 (ko) 2000-02-01

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