KR960015611U - 반도체 디바이스 테스트용 소켓 - Google Patents

반도체 디바이스 테스트용 소켓

Info

Publication number
KR960015611U
KR960015611U KR2019940027868U KR19940027868U KR960015611U KR 960015611 U KR960015611 U KR 960015611U KR 2019940027868 U KR2019940027868 U KR 2019940027868U KR 19940027868 U KR19940027868 U KR 19940027868U KR 960015611 U KR960015611 U KR 960015611U
Authority
KR
South Korea
Prior art keywords
socket
semiconductor device
device testing
testing
semiconductor
Prior art date
Application number
KR2019940027868U
Other languages
English (en)
Other versions
KR0119741Y1 (ko
Inventor
정석권
Original Assignee
엘지반도체주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엘지반도체주식회사 filed Critical 엘지반도체주식회사
Priority to KR2019940027868U priority Critical patent/KR0119741Y1/ko
Publication of KR960015611U publication Critical patent/KR960015611U/ko
Application granted granted Critical
Publication of KR0119741Y1 publication Critical patent/KR0119741Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Connecting Device With Holders (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019940027868U 1994-10-25 1994-10-25 반도체 디바이스 테스트용 소켓 KR0119741Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019940027868U KR0119741Y1 (ko) 1994-10-25 1994-10-25 반도체 디바이스 테스트용 소켓

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940027868U KR0119741Y1 (ko) 1994-10-25 1994-10-25 반도체 디바이스 테스트용 소켓

Publications (2)

Publication Number Publication Date
KR960015611U true KR960015611U (ko) 1996-05-17
KR0119741Y1 KR0119741Y1 (ko) 1998-08-01

Family

ID=19396276

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019940027868U KR0119741Y1 (ko) 1994-10-25 1994-10-25 반도체 디바이스 테스트용 소켓

Country Status (1)

Country Link
KR (1) KR0119741Y1 (ko)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100682543B1 (ko) * 2005-06-02 2007-02-15 미래산업 주식회사 반도체 소자 테스트 핸들러용 캐리어 모듈
KR100793699B1 (ko) * 2007-09-17 2008-01-09 주식회사 지엔티시스템즈 평판 디스플레이 모듈의 테스트용 지그

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100770030B1 (ko) * 2006-10-17 2007-10-25 주식회사 오킨스전자 디바이스 테스트 소켓

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100682543B1 (ko) * 2005-06-02 2007-02-15 미래산업 주식회사 반도체 소자 테스트 핸들러용 캐리어 모듈
KR100793699B1 (ko) * 2007-09-17 2008-01-09 주식회사 지엔티시스템즈 평판 디스플레이 모듈의 테스트용 지그

Also Published As

Publication number Publication date
KR0119741Y1 (ko) 1998-08-01

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