KR940004344U - 반도체 디바이스 테스트용 매뉴얼 소켓 - Google Patents

반도체 디바이스 테스트용 매뉴얼 소켓

Info

Publication number
KR940004344U
KR940004344U KR2019920012529U KR920012529U KR940004344U KR 940004344 U KR940004344 U KR 940004344U KR 2019920012529 U KR2019920012529 U KR 2019920012529U KR 920012529 U KR920012529 U KR 920012529U KR 940004344 U KR940004344 U KR 940004344U
Authority
KR
South Korea
Prior art keywords
semiconductor device
device testing
manual socket
socket
manual
Prior art date
Application number
KR2019920012529U
Other languages
English (en)
Other versions
KR960002806Y1 (ko
Inventor
윤대현
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR92012529U priority Critical patent/KR960002806Y1/ko
Publication of KR940004344U publication Critical patent/KR940004344U/ko
Application granted granted Critical
Publication of KR960002806Y1 publication Critical patent/KR960002806Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
KR92012529U 1992-07-08 1992-07-08 반도체 디바이스 테스트용 매뉴얼 소켓 KR960002806Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR92012529U KR960002806Y1 (ko) 1992-07-08 1992-07-08 반도체 디바이스 테스트용 매뉴얼 소켓

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR92012529U KR960002806Y1 (ko) 1992-07-08 1992-07-08 반도체 디바이스 테스트용 매뉴얼 소켓

Publications (2)

Publication Number Publication Date
KR940004344U true KR940004344U (ko) 1994-02-24
KR960002806Y1 KR960002806Y1 (ko) 1996-04-08

Family

ID=19336313

Family Applications (1)

Application Number Title Priority Date Filing Date
KR92012529U KR960002806Y1 (ko) 1992-07-08 1992-07-08 반도체 디바이스 테스트용 매뉴얼 소켓

Country Status (1)

Country Link
KR (1) KR960002806Y1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100333526B1 (ko) * 1998-10-10 2002-04-25 정운영 테스트 소켓 및 소켓용 콘택 핀 제조방법

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100333526B1 (ko) * 1998-10-10 2002-04-25 정운영 테스트 소켓 및 소켓용 콘택 핀 제조방법

Also Published As

Publication number Publication date
KR960002806Y1 (ko) 1996-04-08

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