KR950015134U - 반도체장치의 테스트소켓 - Google Patents

반도체장치의 테스트소켓

Info

Publication number
KR950015134U
KR950015134U KR2019930024840U KR930024840U KR950015134U KR 950015134 U KR950015134 U KR 950015134U KR 2019930024840 U KR2019930024840 U KR 2019930024840U KR 930024840 U KR930024840 U KR 930024840U KR 950015134 U KR950015134 U KR 950015134U
Authority
KR
South Korea
Prior art keywords
semiconductor device
test socket
device test
socket
semiconductor
Prior art date
Application number
KR2019930024840U
Other languages
English (en)
Other versions
KR200142843Y1 (ko
Inventor
신현대
Original Assignee
엘지반도체주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엘지반도체주식회사 filed Critical 엘지반도체주식회사
Priority to KR2019930024840U priority Critical patent/KR200142843Y1/ko
Publication of KR950015134U publication Critical patent/KR950015134U/ko
Application granted granted Critical
Publication of KR200142843Y1 publication Critical patent/KR200142843Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019930024840U 1993-11-24 1993-11-24 반도체장치의 테스트소켓 KR200142843Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019930024840U KR200142843Y1 (ko) 1993-11-24 1993-11-24 반도체장치의 테스트소켓

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019930024840U KR200142843Y1 (ko) 1993-11-24 1993-11-24 반도체장치의 테스트소켓

Publications (2)

Publication Number Publication Date
KR950015134U true KR950015134U (ko) 1995-06-17
KR200142843Y1 KR200142843Y1 (ko) 1999-06-01

Family

ID=19368598

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019930024840U KR200142843Y1 (ko) 1993-11-24 1993-11-24 반도체장치의 테스트소켓

Country Status (1)

Country Link
KR (1) KR200142843Y1 (ko)

Also Published As

Publication number Publication date
KR200142843Y1 (ko) 1999-06-01

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