KR960019164U - 반도체디바이스용 소켓 - Google Patents

반도체디바이스용 소켓

Info

Publication number
KR960019164U
KR960019164U KR2019940028892U KR19940028892U KR960019164U KR 960019164 U KR960019164 U KR 960019164U KR 2019940028892 U KR2019940028892 U KR 2019940028892U KR 19940028892 U KR19940028892 U KR 19940028892U KR 960019164 U KR960019164 U KR 960019164U
Authority
KR
South Korea
Prior art keywords
socket
semiconductor devices
semiconductor
devices
Prior art date
Application number
KR2019940028892U
Other languages
English (en)
Other versions
KR0123780Y1 (ko
Inventor
문지영
Original Assignee
엘지반도체주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엘지반도체주식회사 filed Critical 엘지반도체주식회사
Priority to KR2019940028892U priority Critical patent/KR0123780Y1/ko
Priority to JP7269848A priority patent/JPH08227771A/ja
Priority to US08/550,238 priority patent/US5655926A/en
Publication of KR960019164U publication Critical patent/KR960019164U/ko
Application granted granted Critical
Publication of KR0123780Y1 publication Critical patent/KR0123780Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/02—Arrangements of circuit components or wiring on supporting structure
    • H05K7/10—Plug-in assemblages of components, e.g. IC sockets
    • H05K7/1015—Plug-in assemblages of components, e.g. IC sockets having exterior leads
    • H05K7/1023—Plug-in assemblages of components, e.g. IC sockets having exterior leads co-operating by abutting, e.g. flat pack

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
  • Details Of Connecting Devices For Male And Female Coupling (AREA)
KR2019940028892U 1994-11-01 1994-11-01 반도체디바이스용 소켓 KR0123780Y1 (ko)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR2019940028892U KR0123780Y1 (ko) 1994-11-01 1994-11-01 반도체디바이스용 소켓
JP7269848A JPH08227771A (ja) 1994-11-01 1995-10-18 半導体素子用ソケット
US08/550,238 US5655926A (en) 1994-11-01 1995-10-30 Socket for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940028892U KR0123780Y1 (ko) 1994-11-01 1994-11-01 반도체디바이스용 소켓

Publications (2)

Publication Number Publication Date
KR960019164U true KR960019164U (ko) 1996-06-19
KR0123780Y1 KR0123780Y1 (ko) 1998-10-01

Family

ID=19397106

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019940028892U KR0123780Y1 (ko) 1994-11-01 1994-11-01 반도체디바이스용 소켓

Country Status (3)

Country Link
US (1) US5655926A (ko)
JP (1) JPH08227771A (ko)
KR (1) KR0123780Y1 (ko)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6464513B1 (en) * 2000-01-05 2002-10-15 Micron Technology, Inc. Adapter for non-permanently connecting integrated circuit devices to multi-chip modules and method of using same
US6407566B1 (en) 2000-04-06 2002-06-18 Micron Technology, Inc. Test module for multi-chip module simulation testing of integrated circuit packages
US7045889B2 (en) * 2001-08-21 2006-05-16 Micron Technology, Inc. Device for establishing non-permanent electrical connection between an integrated circuit device lead element and a substrate
US7049693B2 (en) * 2001-08-29 2006-05-23 Micron Technology, Inc. Electrical contact array for substrate assemblies
JP2021086807A (ja) * 2019-11-29 2021-06-03 株式会社エンプラス ソケット及び検査用ソケット

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3656183A (en) * 1970-02-03 1972-04-11 Acs Ind Inc Connector assembly
US4739257A (en) * 1985-06-06 1988-04-19 Automated Electronic Technology, Inc. Testsite system
US5067904A (en) * 1986-12-29 1991-11-26 Kabushiki Kaisha Hitachi Seisakusho IC socket
JPS63291375A (ja) * 1987-05-22 1988-11-29 Yamaichi Electric Mfg Co Ltd Ｉｃソケット
JPH0668983B2 (ja) * 1990-10-12 1994-08-31 山一電機工業株式会社 Ｉｃソケット
JPH0656784B2 (ja) * 1990-12-25 1994-07-27 山一電機株式会社 電気部品用ソケット
JPH07105257B2 (ja) * 1991-09-13 1995-11-13 山一電機株式会社 Ｉｃソケット
US5521521A (en) * 1994-03-14 1996-05-28 Sgs-Thomson Microelectronics, S.R.L. Testing contactor for small-size semiconductor devices

Also Published As

Publication number Publication date
KR0123780Y1 (ko) 1998-10-01
US5655926A (en) 1997-08-12
JPH08227771A (ja) 1996-09-03

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