KR970003188Y1 - Socket for semiconductor device test - Google Patents

Socket for semiconductor device test Download PDF

Info

Publication number
KR970003188Y1
KR970003188Y1 KR93015478U KR930015478U KR970003188Y1 KR 970003188 Y1 KR970003188 Y1 KR 970003188Y1 KR 93015478 U KR93015478 U KR 93015478U KR 930015478 U KR930015478 U KR 930015478U KR 970003188 Y1 KR970003188 Y1 KR 970003188Y1
Authority
KR
South Korea
Prior art keywords
socket
semiconductor device
device test
test
semiconductor
Prior art date
Application number
KR93015478U
Other languages
Korean (ko)
Inventor
Suk-Kwon Jung
Original Assignee
Lg Semicon Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lg Semicon Co Ltd filed Critical Lg Semicon Co Ltd
Priority to KR93015478U priority Critical patent/KR970003188Y1/en
Application granted granted Critical
Publication of KR970003188Y1 publication Critical patent/KR970003188Y1/en

Links

KR93015478U 1993-08-12 1993-08-12 Socket for semiconductor device test KR970003188Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR93015478U KR970003188Y1 (en) 1993-08-12 1993-08-12 Socket for semiconductor device test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR93015478U KR970003188Y1 (en) 1993-08-12 1993-08-12 Socket for semiconductor device test

Publications (1)

Publication Number Publication Date
KR970003188Y1 true KR970003188Y1 (en) 1997-04-14

Family

ID=19361036

Family Applications (1)

Application Number Title Priority Date Filing Date
KR93015478U KR970003188Y1 (en) 1993-08-12 1993-08-12 Socket for semiconductor device test

Country Status (1)

Country Link
KR (1) KR970003188Y1 (en)

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