KR970064651U - 회로기판 검사장치 - Google Patents

회로기판 검사장치

Info

Publication number
KR970064651U
KR970064651U KR2019960013407U KR19960013407U KR970064651U KR 970064651 U KR970064651 U KR 970064651U KR 2019960013407 U KR2019960013407 U KR 2019960013407U KR 19960013407 U KR19960013407 U KR 19960013407U KR 970064651 U KR970064651 U KR 970064651U
Authority
KR
South Korea
Prior art keywords
circuit board
inspection device
board inspection
circuit
inspection
Prior art date
Application number
KR2019960013407U
Other languages
English (en)
Other versions
KR0138291Y1 (ko
Inventor
김익태
Original Assignee
김익태
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 김익태 filed Critical 김익태
Priority to KR2019960013407U priority Critical patent/KR0138291Y1/ko
Publication of KR970064651U publication Critical patent/KR970064651U/ko
Application granted granted Critical
Publication of KR0138291Y1 publication Critical patent/KR0138291Y1/ko

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • H05K1/0268Marks, test patterns or identification means for electrical inspection or testing

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
KR2019960013407U 1996-05-28 1996-05-28 회로기판 검사장치 KR0138291Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019960013407U KR0138291Y1 (ko) 1996-05-28 1996-05-28 회로기판 검사장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019960013407U KR0138291Y1 (ko) 1996-05-28 1996-05-28 회로기판 검사장치

Publications (2)

Publication Number Publication Date
KR970064651U true KR970064651U (ko) 1997-12-11
KR0138291Y1 KR0138291Y1 (ko) 1999-05-15

Family

ID=19457021

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019960013407U KR0138291Y1 (ko) 1996-05-28 1996-05-28 회로기판 검사장치

Country Status (1)

Country Link
KR (1) KR0138291Y1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102382485B1 (ko) * 2015-02-12 2022-04-04 에스케이매직 주식회사 정수기의 피시비 모듈 체결구조

Also Published As

Publication number Publication date
KR0138291Y1 (ko) 1999-05-15

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Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
LAPS Lapse due to unpaid annual fee