KR970019115U - 회로기판 검사장치 - Google Patents

회로기판 검사장치

Info

Publication number
KR970019115U
KR970019115U KR2019950029506U KR19950029506U KR970019115U KR 970019115 U KR970019115 U KR 970019115U KR 2019950029506 U KR2019950029506 U KR 2019950029506U KR 19950029506 U KR19950029506 U KR 19950029506U KR 970019115 U KR970019115 U KR 970019115U
Authority
KR
South Korea
Prior art keywords
circuit board
inspection device
board inspection
circuit
inspection
Prior art date
Application number
KR2019950029506U
Other languages
English (en)
Other versions
KR0139952Y1 (ko
Inventor
김양희
Original Assignee
삼성전자주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자주식회사 filed Critical 삼성전자주식회사
Priority to KR2019950029506U priority Critical patent/KR0139952Y1/ko
Publication of KR970019115U publication Critical patent/KR970019115U/ko
Application granted granted Critical
Publication of KR0139952Y1 publication Critical patent/KR0139952Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
KR2019950029506U 1995-10-19 1995-10-19 회로기판 검사장치 KR0139952Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019950029506U KR0139952Y1 (ko) 1995-10-19 1995-10-19 회로기판 검사장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019950029506U KR0139952Y1 (ko) 1995-10-19 1995-10-19 회로기판 검사장치

Publications (2)

Publication Number Publication Date
KR970019115U true KR970019115U (ko) 1997-05-26
KR0139952Y1 KR0139952Y1 (ko) 1999-04-01

Family

ID=19426415

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019950029506U KR0139952Y1 (ko) 1995-10-19 1995-10-19 회로기판 검사장치

Country Status (1)

Country Link
KR (1) KR0139952Y1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20140059539A (ko) * 2012-11-08 2014-05-16 삼성디스플레이 주식회사 패널 검사용 가이드 어셈블리 및 이를 포함하는 트레이

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20140059539A (ko) * 2012-11-08 2014-05-16 삼성디스플레이 주식회사 패널 검사용 가이드 어셈블리 및 이를 포함하는 트레이

Also Published As

Publication number Publication date
KR0139952Y1 (ko) 1999-04-01

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