KR960012671U - 프로브카드 특성을 측정하는 웨이퍼 검사장치 - Google Patents
프로브카드 특성을 측정하는 웨이퍼 검사장치Info
- Publication number
- KR960012671U KR960012671U KR2019940025280U KR19940025280U KR960012671U KR 960012671 U KR960012671 U KR 960012671U KR 2019940025280 U KR2019940025280 U KR 2019940025280U KR 19940025280 U KR19940025280 U KR 19940025280U KR 960012671 U KR960012671 U KR 960012671U
- Authority
- KR
- South Korea
- Prior art keywords
- inspection device
- probe card
- wafer inspection
- card characteristics
- measures probe
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR94025280U KR0115035Y1 (en) | 1994-09-29 | 1994-09-29 | Test apparatus of probe card |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR94025280U KR0115035Y1 (en) | 1994-09-29 | 1994-09-29 | Test apparatus of probe card |
Publications (2)
Publication Number | Publication Date |
---|---|
KR960012671U true KR960012671U (ko) | 1996-04-17 |
KR0115035Y1 KR0115035Y1 (en) | 1998-04-15 |
Family
ID=19394332
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR94025280U KR0115035Y1 (en) | 1994-09-29 | 1994-09-29 | Test apparatus of probe card |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR0115035Y1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100385398B1 (ko) * | 2001-02-12 | 2003-05-23 | 프롬써어티 주식회사 | 접속 점검 기능을 가진 집적 회로 번인 장치, 검사용 기판 및 접속 점검 방법 |
-
1994
- 1994-09-29 KR KR94025280U patent/KR0115035Y1/ko not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100385398B1 (ko) * | 2001-02-12 | 2003-05-23 | 프롬써어티 주식회사 | 접속 점검 기능을 가진 집적 회로 번인 장치, 검사용 기판 및 접속 점검 방법 |
Also Published As
Publication number | Publication date |
---|---|
KR0115035Y1 (en) | 1998-04-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 20081125 Year of fee payment: 12 |
|
EXPY | Expiration of term |