KR930014867A - 본딩와이어 검사장치 - Google Patents
본딩와이어 검사장치 Download PDFInfo
- Publication number
- KR930014867A KR930014867A KR1019920021558A KR920021558A KR930014867A KR 930014867 A KR930014867 A KR 930014867A KR 1019920021558 A KR1019920021558 A KR 1019920021558A KR 920021558 A KR920021558 A KR 920021558A KR 930014867 A KR930014867 A KR 930014867A
- Authority
- KR
- South Korea
- Prior art keywords
- bonding wire
- wire inspection
- inspection device
- view
- lead
- Prior art date
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
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- H01L24/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
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- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/1015—Shape
- H01L2924/1016—Shape being a cuboid
- H01L2924/10162—Shape being a cuboid with a square active surface
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3025—Electromagnetic shielding
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Wire Bonding (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 한실시예에 의한 본딩와이어 검사장치의 구성을 도시하는 단면도.
제2도는 제1도의 대물렌즈군의 Z방향 구동구조의 사시도.
제3도는 제1도의 링형상 조명수단의 단면도.
제4도는 제3도의 링형상 조명수단의 배치설명도.
제5도는 조명전환회로의 블록도이다.
제6도는 제1도의 본딩와이어 검사장치의 제어회로 블록도.
제7도는 본딩와이어 검사방법의 1실시예를 예시하는 설명도.
제8도는 제7도의 경우에 있어서 적합치 않음을 나타내는 설명도.
제9(a)도, 제9(b)도, 제9(c)도는 제8도 경우의 영상설명도.
제10도는 본딩와이어 검사방법의 다른 실시예를 도시하는 설명도.
제11도는 제10도의 방법에 의해 검출된 볼형상의 설명도.
제12도는 크레센트 검사방법의 설명도.
제13도는 와이어높이의 검사방법으로 반도체칩에 촛점을 맞춘 설명도.
제14도는 와이어높이의 검사방법으로 리이드에 촛점을 맞춘 설명도.
제15도는 와이어본딩된 반도체장치의 평면도.
제16도는 제15도의 정면도.
제17도는 본딩와이어의 확대정면 설명도.
제18도는 제17도의 평면도.
제19도는 종래의 본딩와이어 검사장치의 구성도.
* 도면의 주요부분에 대한 부호의 설명
1 : 반도체 칩 2 : 패드
3 : 리이드 프레임 4 : 리이드
5 : 와이어 6 : 시료(검사대상물)
38 : 수직조명수단 40 : 저배율용 결상렌즈
41 : 저배율용 카메라 42 : 고배율용 결상렌즈
44 : 고배율용 카메라 50 : 전동조리개
Claims (1)
- 반도체칩의 패드와 리이드프레임의 리이드에 본딩된 와이어를 검사하는 본딩 와이어 검사장치에 있어서 검사대상물의 위쪽에서 조명하는 수직조명수단과, 이 수직조명수단에 의한 반사광을 받아서 검사대상으로부분을 결상시키는 광학적수단과 이 광학적수단에 의해서 결성된 상을 촬영하는 카메라와 상기 수직조명수단의 밑쪽에 배설되어 개구의 직경을 전기적으로 변화시킬 수 있는 전동조리개를 갖춘 것을 특징으로 하는 본딩와이어 검사장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP91-341833 | 1991-12-02 | ||
JP3341833A JP2969403B2 (ja) | 1991-12-02 | 1991-12-02 | ボンデイングワイヤ検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR930014867A true KR930014867A (ko) | 1993-07-23 |
KR960005091B1 KR960005091B1 (ko) | 1996-04-20 |
Family
ID=18349107
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019920021558A KR960005091B1 (ko) | 1991-12-02 | 1992-11-17 | 본딩와이어 검사장치 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5396334A (ko) |
JP (1) | JP2969403B2 (ko) |
KR (1) | KR960005091B1 (ko) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5519496A (en) * | 1994-01-07 | 1996-05-21 | Applied Intelligent Systems, Inc. | Illumination system and method for generating an image of an object |
US5642158A (en) * | 1994-05-02 | 1997-06-24 | Cognex Corporation | Method and apparatus to detect capillary indentations |
JP3298753B2 (ja) * | 1994-10-14 | 2002-07-08 | 株式会社新川 | ワイヤ曲がり検査装置 |
IT1273968B (it) * | 1995-02-24 | 1997-07-11 | Finmeccanica Spa | Apparecchiatura per il rilevamento ottico di difetti superficiali in particolare per nastri laminati |
WO1997002708A1 (en) * | 1995-06-30 | 1997-01-23 | Precision Assembly Systems, Inc. | Automated system for placement of components |
US6040895A (en) * | 1997-10-08 | 2000-03-21 | Siemens Aktiengesellschaft | Method and device for controlled illumination of an object for improving identification of an object feature in an image of the object |
US6359694B1 (en) | 1997-11-10 | 2002-03-19 | Siemens Aktiengesellschaft | Method and device for identifying the position of an electrical component or terminals thereof, and equipping head employing same |
JPH11219425A (ja) * | 1998-01-30 | 1999-08-10 | Lintec Corp | 観測装置及び該装置の発光制御方法 |
DE10128476C2 (de) * | 2001-06-12 | 2003-06-12 | Siemens Dematic Ag | Optische Sensorvorrichtung zur visuellen Erfassung von Substraten |
US7527186B2 (en) * | 2001-07-24 | 2009-05-05 | Kulicke And Soffa Industries, Inc. | Method and apparatus for mapping a position of a capillary tool tip using a prism |
US7523848B2 (en) * | 2001-07-24 | 2009-04-28 | Kulicke And Soffa Industries, Inc. | Method and apparatus for measuring the size of free air balls on a wire bonder |
JP4365292B2 (ja) * | 2004-09-02 | 2009-11-18 | 株式会社カイジョー | ワイヤボンディングにおけるボール圧着厚の測定方法 |
GB2442152A (en) * | 2005-07-08 | 2008-03-26 | Electro Scient Ind Inc | Optimizing use and performance of optical systems implemented with telecentric on-axis dark field illumination |
US20120128229A1 (en) * | 2010-11-23 | 2012-05-24 | Kulicke And Soffa Industries, Inc. | Imaging operations for a wire bonding system |
SG2013084975A (en) * | 2013-11-11 | 2015-06-29 | Saedge Vision Solutions Pte Ltd | An apparatus and method for inspecting asemiconductor package |
WO2019082558A1 (ja) * | 2017-10-26 | 2019-05-02 | 株式会社新川 | ボンディング装置 |
WO2021202211A1 (en) * | 2020-03-29 | 2021-10-07 | Kulicke And Soffa Industries, Inc. | Methods of optimizing clamping of a semiconductor element against a support structure on a wire bonding machine, and related methods |
CN112179920B (zh) * | 2020-11-29 | 2021-04-13 | 惠州高视科技有限公司 | 一种芯片焊线缺陷的检测方法及系统 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2329014C2 (de) * | 1973-06-07 | 1983-04-28 | Agfa-Gevaert Ag, 5090 Leverkusen | Blendenanordnung mit mindestens einem Flüssigkristallelement |
JPS5740234A (en) * | 1980-08-22 | 1982-03-05 | Canon Inc | Ttl light measurement |
US5059559A (en) * | 1987-11-02 | 1991-10-22 | Hitachi, Ltd. | Method of aligning and bonding tab inner leads |
US5030008A (en) * | 1988-10-11 | 1991-07-09 | Kla Instruments, Corporation | Method and apparatus for the automated analysis of three-dimensional objects |
JPH07111998B2 (ja) * | 1989-08-18 | 1995-11-29 | 株式会社東芝 | ワイヤボンディング検査装置 |
-
1991
- 1991-12-02 JP JP3341833A patent/JP2969403B2/ja not_active Expired - Fee Related
-
1992
- 1992-11-17 KR KR1019920021558A patent/KR960005091B1/ko not_active IP Right Cessation
- 1992-12-01 US US07/983,650 patent/US5396334A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP2969403B2 (ja) | 1999-11-02 |
US5396334A (en) | 1995-03-07 |
KR960005091B1 (ko) | 1996-04-20 |
JPH05160232A (ja) | 1993-06-25 |
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