KR930009681A - 연속적으로 주조한 강편에 존재하는 핀호울을 탐지하기 위한 방법 - Google Patents

연속적으로 주조한 강편에 존재하는 핀호울을 탐지하기 위한 방법 Download PDF

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Publication number
KR930009681A
KR930009681A KR1019920021750A KR920021750A KR930009681A KR 930009681 A KR930009681 A KR 930009681A KR 1019920021750 A KR1019920021750 A KR 1019920021750A KR 920021750 A KR920021750 A KR 920021750A KR 930009681 A KR930009681 A KR 930009681A
Authority
KR
South Korea
Prior art keywords
metal
scanning
detected
light source
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
KR1019920021750A
Other languages
English (en)
Korean (ko)
Inventor
오토 비요르네스톨 칼
토르 말모 잔
스트롬 잉베
비크하겐 에이올프
Original Assignee
원본미기재
엘켐 테크놀로지 에이/에스
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 원본미기재, 엘켐 테크놀로지 에이/에스 filed Critical 원본미기재
Publication of KR930009681A publication Critical patent/KR930009681A/ko
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/894—Pinholes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/889—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a bare video image, i.e. without visual measurement aids

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Continuous Casting (AREA)
KR1019920021750A 1991-11-22 1992-11-19 연속적으로 주조한 강편에 존재하는 핀호울을 탐지하기 위한 방법 Ceased KR930009681A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NO914574 1991-11-22
NO91914574A NO914574L (no) 1991-11-22 1991-11-22 Fremgangsmaate for detektering av pin-hull i strengestoeptemetallemne

Publications (1)

Publication Number Publication Date
KR930009681A true KR930009681A (ko) 1993-06-21

Family

ID=19894618

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019920021750A Ceased KR930009681A (ko) 1991-11-22 1992-11-19 연속적으로 주조한 강편에 존재하는 핀호울을 탐지하기 위한 방법

Country Status (7)

Country Link
US (1) US5363901A (enExample)
EP (1) EP0543677A1 (enExample)
JP (1) JPH05232044A (enExample)
KR (1) KR930009681A (enExample)
CA (1) CA2083449A1 (enExample)
NO (1) NO914574L (enExample)
TW (1) TW224435B (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5920735A (en) * 1997-01-16 1999-07-06 Gelphman; Janet L. Method and apparatus to observe the geometry of relative motion
US7324681B2 (en) 2002-12-03 2008-01-29 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
US6950546B2 (en) 2002-12-03 2005-09-27 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
US7460703B2 (en) * 2002-12-03 2008-12-02 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
EP1792890A4 (en) * 2004-09-21 2008-08-06 Asahi Kasei Chemicals Corp METHOD FOR THE INDUSTRIAL SEPARATION OF BYPRODUCTIVE ALCOHOLS
KR100891842B1 (ko) * 2007-08-28 2009-04-07 주식회사 포스코 원형 선재 광학결함 검출장치 및 방법
JP6136892B2 (ja) * 2013-11-27 2017-05-31 トヨタ自動車株式会社 引上式連続鋳造装置及び引上式連続鋳造方法
DE102014011268A1 (de) * 2014-07-29 2016-02-04 Brückner Maschinenbau GmbH & Co. KG Optische Fehlstellendetektion

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2758712A (en) * 1952-08-18 1956-08-14 Linderman Engineering Company Detecting apparatus
NL282725A (enExample) * 1961-09-05
US3715476A (en) * 1969-01-16 1973-02-06 Nippon Steel Corp Method and apparatus for detecting pinholes on sheet articles
US3781117A (en) * 1972-03-31 1973-12-25 United States Steel Corp Apparatus for surface inspection of moving material
US3795452A (en) * 1973-02-28 1974-03-05 Us Air Force Instrument for automatically inspecting integrated circuit masks for pinholes and spots
US4028728A (en) * 1976-04-02 1977-06-07 Western Electric Company, Inc. Method of and video system for identifying different light-reflective surface areas on articles
IS1094B6 (is) * 1976-12-10 1982-09-24 Ashimori Kogyo Kabushiki Kaisha, (Ashimori Industry Co., Ltd.) Tæki til að búa til nýja gerð af korklínu
GB2019009B (en) * 1978-03-23 1982-11-17 Futec Inc Method of imaging the surface of a continuous cast hot metal strip for detection of scarfs appearing thereon and apparatus for the same
US4223346A (en) * 1979-04-05 1980-09-16 Armco Inc. Automatic defect detecting inspection apparatus
JPS57132042A (en) * 1981-02-09 1982-08-16 Fuji Electric Co Ltd Inspecting method of defect on surface of article
DE3113120C1 (de) * 1981-03-27 1982-09-30 Mannesmann AG, 4000 Düsseldorf Vorrichtung zur Inspektion von Gussstraengen in einer Stranggiessanlage
JPS5892938A (ja) * 1981-11-30 1983-06-02 Matsushita Electric Ind Co Ltd 傷測定装置
DE3200007A1 (de) * 1982-01-02 1983-07-14 Klöckner-Werke AG, 4100 Duisburg Verfahren und vorrichtung zum pruefen von metallischen proben fuer die spektralanalytische untersuchung
CH656466A5 (de) * 1982-02-15 1986-06-30 Alusuisse Verfahren und vorrichtung zur oberflaechenkontrolle eines werkstoffes.
FR2528740A1 (fr) * 1982-06-18 1983-12-23 Clesid Sa Dispositif de controle de la coulee continue de l'acier
JPS60146134A (ja) * 1984-01-11 1985-08-01 Matsushita Electric Ind Co Ltd 表面疵検出用照明装置
CA1229392A (en) * 1984-02-28 1987-11-17 Hirosato Yamane Method and apparatus for detection of surface defects of hot metal body
JPH0676960B2 (ja) * 1984-12-12 1994-09-28 株式会社日立製作所 繰返し荷重を受ける機械構造物の余寿命評価方法およびその装置
JPS6330164A (ja) * 1986-07-22 1988-02-08 Kubota Ltd 連続鋳造における鋳造欠陥の検出方法
DE3810349A1 (de) * 1988-03-26 1989-10-05 Agfa Gevaert Ag Verfahren sowie anordnung zur darstellung von oberflaechenfehlern an aufzeichnungstraegern
IL91492A (en) * 1988-10-03 1994-07-31 Hughes Aircraft Co Optical inspection system for soldering joints and inspection method
EP0370527B1 (en) * 1988-11-24 1994-02-02 Omron Tateisi Electronics Co. Method of and apparatus for inspecting substrate
JPH0739025B2 (ja) * 1988-11-30 1995-05-01 川崎製鉄株式会社 急冷合金薄帯のオンライン検査方法
JP3072998B2 (ja) * 1990-04-18 2000-08-07 株式会社日立製作所 はんだ付け状態検査方法及びその装置

Also Published As

Publication number Publication date
CA2083449A1 (en) 1993-05-23
EP0543677A1 (en) 1993-05-26
NO914574L (no) 1993-05-24
US5363901A (en) 1994-11-15
JPH05232044A (ja) 1993-09-07
TW224435B (enExample) 1994-06-01
NO914574D0 (no) 1991-11-22

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Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 19921119

A201 Request for examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 19930118

Comment text: Request for Examination of Application

Patent event code: PA02011R01I

Patent event date: 19921119

Comment text: Patent Application

PG1501 Laying open of application
E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

Comment text: Notification of reason for refusal

Patent event date: 19960826

Patent event code: PE09021S01D

E601 Decision to refuse application
PE0601 Decision on rejection of patent

Patent event date: 19970107

Comment text: Decision to Refuse Application

Patent event code: PE06012S01D

Patent event date: 19960826

Comment text: Notification of reason for refusal

Patent event code: PE06011S01I