KR930006301B1 - 박막형성방법 및 박막형성장치 - Google Patents
박막형성방법 및 박막형성장치 Download PDFInfo
- Publication number
- KR930006301B1 KR930006301B1 KR1019900009730A KR900009730A KR930006301B1 KR 930006301 B1 KR930006301 B1 KR 930006301B1 KR 1019900009730 A KR1019900009730 A KR 1019900009730A KR 900009730 A KR900009730 A KR 900009730A KR 930006301 B1 KR930006301 B1 KR 930006301B1
- Authority
- KR
- South Korea
- Prior art keywords
- gas
- substrate
- thin film
- separated
- types
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- H01L21/205—
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32422—Arrangement for selecting ions or species in the plasma
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/221—Ion beam deposition
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/452—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by activating reactive gas streams before their introduction into the reaction chamber, e.g. by ionisation or addition of reactive species
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32357—Generation remote from the workpiece, e.g. down-stream
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Analytical Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16815389 | 1989-06-29 | ||
| JP1-168153 | 1989-06-29 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR910001890A KR910001890A (ko) | 1991-01-31 |
| KR930006301B1 true KR930006301B1 (ko) | 1993-07-12 |
Family
ID=15862802
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019900009730A Expired - Lifetime KR930006301B1 (ko) | 1989-06-29 | 1990-06-29 | 박막형성방법 및 박막형성장치 |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US5094879A (enExample) |
| JP (1) | JPH03111578A (enExample) |
| KR (1) | KR930006301B1 (enExample) |
| DE (1) | DE4020816A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20180003254U (ko) | 2017-05-11 | 2018-11-21 | 김종철 | 방충 원단 및 방충복과 방충 이불 |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4204650C1 (enExample) * | 1992-02-15 | 1993-07-08 | Hoffmeister, Helmut, Dr., 4400 Muenster, De | |
| US6531193B2 (en) * | 1997-07-07 | 2003-03-11 | The Penn State Research Foundation | Low temperature, high quality silicon dioxide thin films deposited using tetramethylsilane (TMS) for stress control and coverage applications |
| NL1019781C2 (nl) * | 2002-01-18 | 2003-07-21 | Tno | Deklaag alsmede werkwijzen en inrichtingen voor de vervaardiging daarvan. |
| KR100455430B1 (ko) * | 2002-03-29 | 2004-11-06 | 주식회사 엘지이아이 | 열교환기 표면처리장비의 냉각장치 및 그 제조방법 |
| FI116382B (fi) * | 2003-04-22 | 2005-11-15 | Liekki Oy | Menetelmä hiukkasten varaamiseksi materiaalin valmistusprosessissa sekä hiukkasten varauslaite |
| JP4493926B2 (ja) * | 2003-04-25 | 2010-06-30 | 株式会社半導体エネルギー研究所 | 製造装置 |
| US20050254902A1 (en) * | 2004-05-17 | 2005-11-17 | Rude Richard J | Protective cover for marine mooring bumper |
| TWI275327B (en) * | 2005-09-13 | 2007-03-01 | Quanta Display Inc | Apparatus for producing atomic beam |
| CN101416276B (zh) * | 2005-11-11 | 2011-09-07 | Dsg科技公司 | 热处理系统、部件和方法 |
| US8818322B2 (en) * | 2006-06-09 | 2014-08-26 | Trapeze Networks, Inc. | Untethered access point mesh system and method |
| US20090078202A1 (en) * | 2007-09-26 | 2009-03-26 | Neocera, Llc | Substrate heater for material deposition |
| US8372489B2 (en) * | 2007-09-28 | 2013-02-12 | Tel Epion Inc. | Method for directional deposition using a gas cluster ion beam |
| US7794798B2 (en) * | 2007-09-29 | 2010-09-14 | Tel Epion Inc. | Method for depositing films using gas cluster ion beam processing |
| US20090233004A1 (en) * | 2008-03-17 | 2009-09-17 | Tel Epion Inc. | Method and system for depositing silicon carbide film using a gas cluster ion beam |
| US8202435B2 (en) * | 2008-08-01 | 2012-06-19 | Tel Epion Inc. | Method for selectively etching areas of a substrate using a gas cluster ion beam |
| US20110084214A1 (en) * | 2009-10-08 | 2011-04-14 | Tel Epion Inc. | Gas cluster ion beam processing method for preparing an isolation layer in non-planar gate structures |
| US8237136B2 (en) * | 2009-10-08 | 2012-08-07 | Tel Epion Inc. | Method and system for tilting a substrate during gas cluster ion beam processing |
| US8048788B2 (en) * | 2009-10-08 | 2011-11-01 | Tel Epion Inc. | Method for treating non-planar structures using gas cluster ion beam processing |
| CN102637572A (zh) * | 2011-02-15 | 2012-08-15 | 上海凯世通半导体有限公司 | 离子注入设备 |
| US8841574B1 (en) * | 2013-11-18 | 2014-09-23 | Georges J. Gorin | Plasma extension and concentration apparatus and method |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5713178A (en) * | 1980-06-27 | 1982-01-23 | Futaba Corp | Method and device for surface treatment |
| US4440108A (en) * | 1982-09-24 | 1984-04-03 | Spire Corporation | Ion beam coating apparatus |
| JPS60221566A (ja) * | 1984-04-18 | 1985-11-06 | Agency Of Ind Science & Technol | 薄膜形成装置 |
| US4888202A (en) * | 1986-07-31 | 1989-12-19 | Nippon Telegraph And Telephone Corporation | Method of manufacturing thin compound oxide film and apparatus for manufacturing thin oxide film |
| US4740267A (en) * | 1987-02-20 | 1988-04-26 | Hughes Aircraft Company | Energy intensive surface reactions using a cluster beam |
| US4861750A (en) * | 1987-04-20 | 1989-08-29 | Nissin Electric Co., Ltd. | Process for producing superconducting thin film |
| GB8719794D0 (en) * | 1987-08-21 | 1987-09-30 | Scient Coatings Uk Ltd | Depositing surface layers on substrates |
| US4800100A (en) * | 1987-10-27 | 1989-01-24 | Massachusetts Institute Of Technology | Combined ion and molecular beam apparatus and method for depositing materials |
-
1990
- 1990-03-07 JP JP2055576A patent/JPH03111578A/ja active Pending
- 1990-06-27 US US07/544,595 patent/US5094879A/en not_active Expired - Lifetime
- 1990-06-29 DE DE4020816A patent/DE4020816A1/de active Granted
- 1990-06-29 KR KR1019900009730A patent/KR930006301B1/ko not_active Expired - Lifetime
-
1993
- 1993-10-15 US US08/136,615 patent/US5658389A/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20180003254U (ko) | 2017-05-11 | 2018-11-21 | 김종철 | 방충 원단 및 방충복과 방충 이불 |
Also Published As
| Publication number | Publication date |
|---|---|
| DE4020816C2 (enExample) | 1992-08-13 |
| KR910001890A (ko) | 1991-01-31 |
| US5658389A (en) | 1997-08-19 |
| JPH03111578A (ja) | 1991-05-13 |
| US5094879A (en) | 1992-03-10 |
| DE4020816A1 (de) | 1991-01-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR930006301B1 (ko) | 박막형성방법 및 박막형성장치 | |
| US6171662B1 (en) | Method of surface processing | |
| US5626679A (en) | Method and apparatus for preparing a silicon oxide film | |
| US4683838A (en) | Plasma treatment system | |
| CN100524641C (zh) | 等离子体处理装置 | |
| JP4555410B2 (ja) | 半導体上に酸化膜を形成する装置及び方法 | |
| JP3688726B2 (ja) | 半導体装置の製造方法 | |
| KR900005118B1 (ko) | 박막 형성장치 | |
| US6537928B1 (en) | Apparatus and method for forming low dielectric constant film | |
| JPH0831454B2 (ja) | 半導体装置の製造方法 | |
| JPS6243335B2 (enExample) | ||
| KR100781742B1 (ko) | 반도체의 표면처리방법 | |
| CN1662298A (zh) | 利用等离子体进行均相和非均相化学反应的方法 | |
| JP3014334B2 (ja) | 半導体装置の製造方法 | |
| JP3723085B2 (ja) | 半導体装置の製造方法及び製造装置 | |
| CN1802723A (zh) | 用于膨胀热等离子体的电感耦合的系统和方法 | |
| JPH0574763A (ja) | ゲート絶縁膜の形成方法 | |
| JP2002353209A (ja) | 半導体装置用の低誘電率絶縁膜を形成する方法 | |
| JPS58118119A (ja) | 反応性イオンプレ−テイング装置 | |
| JPH10125669A (ja) | プラズマcvd装置及び酸化膜の成膜方法 | |
| JPH0864535A (ja) | プラズマ成膜方法、プラズマ成膜装置及びそれに用いるプラズマ発生装置 | |
| JP4167645B2 (ja) | 半導体装置及びその製造方法 | |
| JP2005123389A (ja) | プラズマ処理方法、プラズマ成膜方法、プラズマエッチング方法およびプラズマ処理装置 | |
| JPH02239616A (ja) | 薄膜形成方法 | |
| JPS5968921A (ja) | 薄膜の形成方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| G160 | Decision to publish patent application | ||
| PG1605 | Publication of application before grant of patent |
St.27 status event code: A-2-2-Q10-Q13-nap-PG1605 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 4 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 5 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 6 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 7 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 8 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 9 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 10 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 11 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 12 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 13 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 14 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 15 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 16 |
|
| FPAY | Annual fee payment |
Payment date: 20090626 Year of fee payment: 17 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 17 |
|
| EXPY | Expiration of term | ||
| PC1801 | Expiration of term |
St.27 status event code: N-4-6-H10-H14-oth-PC1801 Not in force date: 20100630 Ip right cessation event data comment text: Termination Category : EXPIRATION_OF_DURATION |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |