KR20240045215A - 광투과성 적층체의 검사 방법 - Google Patents

광투과성 적층체의 검사 방법 Download PDF

Info

Publication number
KR20240045215A
KR20240045215A KR1020247004130A KR20247004130A KR20240045215A KR 20240045215 A KR20240045215 A KR 20240045215A KR 1020247004130 A KR1020247004130 A KR 1020247004130A KR 20247004130 A KR20247004130 A KR 20247004130A KR 20240045215 A KR20240045215 A KR 20240045215A
Authority
KR
South Korea
Prior art keywords
light
height
main surface
laminate
transmissive laminate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020247004130A
Other languages
English (en)
Korean (ko)
Inventor
유우지 야마시타
코지 시젠
정빈 윤
Original Assignee
닛토덴코 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 닛토덴코 가부시키가이샤 filed Critical 닛토덴코 가부시키가이샤
Publication of KR20240045215A publication Critical patent/KR20240045215A/ko
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8858—Flaw counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8861—Determining coordinates of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1020247004130A 2021-08-17 2022-06-29 광투과성 적층체의 검사 방법 Pending KR20240045215A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021132506 2021-08-17
JPJP-P-2021-132506 2021-08-17
PCT/JP2022/025868 WO2023021854A1 (ja) 2021-08-17 2022-06-29 光透過性積層体の検査方法

Publications (1)

Publication Number Publication Date
KR20240045215A true KR20240045215A (ko) 2024-04-05

Family

ID=85240457

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020247004130A Pending KR20240045215A (ko) 2021-08-17 2022-06-29 광투과성 적층체의 검사 방법

Country Status (5)

Country Link
JP (1) JPWO2023021854A1 (https=)
KR (1) KR20240045215A (https=)
CN (1) CN117795288A (https=)
TW (1) TW202309511A (https=)
WO (1) WO2023021854A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI853522B (zh) * 2023-04-07 2024-08-21 住華科技股份有限公司 光學膜缺陷檢測系統及應用其之光學膜缺陷檢測方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005062165A (ja) 2003-07-28 2005-03-10 Nitto Denko Corp シート状製品の検査方法、検査システム、シート状製品、及び、画像表示装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6191204B2 (ja) * 2012-09-27 2017-09-06 日産自動車株式会社 自動車車体の外観検査装置および外観検査方法
JP2017166903A (ja) * 2016-03-15 2017-09-21 株式会社大真空 欠陥検査装置及び欠陥検査方法
WO2019039331A1 (ja) * 2017-08-24 2019-02-28 日本電気硝子株式会社 板ガラスの製造方法
JP2019219357A (ja) * 2018-06-22 2019-12-26 名古屋電機工業株式会社 撮影装置、撮影方法および撮影プログラム
JP7451227B2 (ja) * 2020-02-28 2024-03-18 日東電工株式会社 光透過性積層体の検査方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005062165A (ja) 2003-07-28 2005-03-10 Nitto Denko Corp シート状製品の検査方法、検査システム、シート状製品、及び、画像表示装置

Also Published As

Publication number Publication date
JPWO2023021854A1 (https=) 2023-02-23
WO2023021854A1 (ja) 2023-02-23
TW202309511A (zh) 2023-03-01
CN117795288A (zh) 2024-03-29

Similar Documents

Publication Publication Date Title
JP7766141B2 (ja) 光透過性積層体の製造方法
CN114127533B (zh) 边缘强度测试方法及设备
TWI413823B (zh) 影像檢查裝置
KR100722102B1 (ko) 외관 검사 장치 및 외관 검사 방법
CN106133898A (zh) 用于对象检验的可变图像场曲率
CN105103027B (zh) 光学系统中的焦点和其他特征的测量
KR20240045215A (ko) 광투과성 적층체의 검사 방법
US20080285007A1 (en) System and method for measurement of thickness of thin films
JP2025019281A (ja) 光透過性積層体の検査方法および検査装置
JP2008304239A (ja) 円柱透明体中のコア形状測定装置及びコア形状測定方法
TWI920061B (zh) 光透射性積層體之檢查方法
JP2002277411A (ja) 透明積層体の検査方法および検査装置
JP2007139606A (ja) 膜厚測定装置及び膜厚測定方法
JP2006524324A (ja) 独立した認識領域および光学形式を有するバイオチップ、並びにこのバイオチップの浮動読み取り
JP2019109060A (ja) 光学素子の検査方法
JP4675160B2 (ja) 光学的検査装置、および光学フィルム貼り合わせ製品製造装置
CN120820558A (zh) 一种叠合光波导内部缺陷的检测方法
JPH11211437A (ja) シートの界面形状測定装置及び方法
JP2016017784A (ja) ロッドレンズアレイ検査装置及び方法

Legal Events

Date Code Title Description
PA0105 International application
PG1501 Laying open of application
A201 Request for examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 20250623

Comment text: Request for Examination of Application