TW202309511A - 光透射性積層體之檢查方法 - Google Patents

光透射性積層體之檢查方法 Download PDF

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Publication number
TW202309511A
TW202309511A TW111126483A TW111126483A TW202309511A TW 202309511 A TW202309511 A TW 202309511A TW 111126483 A TW111126483 A TW 111126483A TW 111126483 A TW111126483 A TW 111126483A TW 202309511 A TW202309511 A TW 202309511A
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TW
Taiwan
Prior art keywords
light
height
main surface
aforementioned
laminate
Prior art date
Application number
TW111126483A
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English (en)
Chinese (zh)
Inventor
山下裕司
自然浩次
尹炡玭
Original Assignee
日商日東電工股份有限公司
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Publication date
Application filed by 日商日東電工股份有限公司 filed Critical 日商日東電工股份有限公司
Publication of TW202309511A publication Critical patent/TW202309511A/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8858—Flaw counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8861—Determining coordinates of flaws

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
TW111126483A 2021-08-17 2022-07-14 光透射性積層體之檢查方法 TW202309511A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021132506 2021-08-17
JP2021-132506 2021-08-17

Publications (1)

Publication Number Publication Date
TW202309511A true TW202309511A (zh) 2023-03-01

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ID=85240457

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111126483A TW202309511A (zh) 2021-08-17 2022-07-14 光透射性積層體之檢查方法

Country Status (5)

Country Link
JP (1) JPWO2023021854A1 (https=)
KR (1) KR20240045215A (https=)
CN (1) CN117795288A (https=)
TW (1) TW202309511A (https=)
WO (1) WO2023021854A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI853522B (zh) * 2023-04-07 2024-08-21 住華科技股份有限公司 光學膜缺陷檢測系統及應用其之光學膜缺陷檢測方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005062165A (ja) 2003-07-28 2005-03-10 Nitto Denko Corp シート状製品の検査方法、検査システム、シート状製品、及び、画像表示装置
JP6191204B2 (ja) * 2012-09-27 2017-09-06 日産自動車株式会社 自動車車体の外観検査装置および外観検査方法
JP2017166903A (ja) * 2016-03-15 2017-09-21 株式会社大真空 欠陥検査装置及び欠陥検査方法
WO2019039331A1 (ja) * 2017-08-24 2019-02-28 日本電気硝子株式会社 板ガラスの製造方法
JP2019219357A (ja) * 2018-06-22 2019-12-26 名古屋電機工業株式会社 撮影装置、撮影方法および撮影プログラム
JP7451227B2 (ja) * 2020-02-28 2024-03-18 日東電工株式会社 光透過性積層体の検査方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI853522B (zh) * 2023-04-07 2024-08-21 住華科技股份有限公司 光學膜缺陷檢測系統及應用其之光學膜缺陷檢測方法

Also Published As

Publication number Publication date
JPWO2023021854A1 (https=) 2023-02-23
WO2023021854A1 (ja) 2023-02-23
CN117795288A (zh) 2024-03-29
KR20240045215A (ko) 2024-04-05

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