JPWO2023021854A1 - - Google Patents

Info

Publication number
JPWO2023021854A1
JPWO2023021854A1 JP2022545358A JP2022545358A JPWO2023021854A1 JP WO2023021854 A1 JPWO2023021854 A1 JP WO2023021854A1 JP 2022545358 A JP2022545358 A JP 2022545358A JP 2022545358 A JP2022545358 A JP 2022545358A JP WO2023021854 A1 JPWO2023021854 A1 JP WO2023021854A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022545358A
Other languages
Japanese (ja)
Other versions
JPWO2023021854A5 (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023021854A1 publication Critical patent/JPWO2023021854A1/ja
Publication of JPWO2023021854A5 publication Critical patent/JPWO2023021854A5/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8858Flaw counting
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8861Determining coordinates of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2022545358A 2021-08-17 2022-06-29 Pending JPWO2023021854A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021132506 2021-08-17
PCT/JP2022/025868 WO2023021854A1 (ja) 2021-08-17 2022-06-29 光透過性積層体の検査方法

Publications (2)

Publication Number Publication Date
JPWO2023021854A1 true JPWO2023021854A1 (https=) 2023-02-23
JPWO2023021854A5 JPWO2023021854A5 (https=) 2025-07-04

Family

ID=85240457

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022545358A Pending JPWO2023021854A1 (https=) 2021-08-17 2022-06-29

Country Status (5)

Country Link
JP (1) JPWO2023021854A1 (https=)
KR (1) KR20240045215A (https=)
CN (1) CN117795288A (https=)
TW (1) TW202309511A (https=)
WO (1) WO2023021854A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI853522B (zh) * 2023-04-07 2024-08-21 住華科技股份有限公司 光學膜缺陷檢測系統及應用其之光學膜缺陷檢測方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014081356A (ja) * 2012-09-27 2014-05-08 Nissan Motor Co Ltd 自動車車体の外観検査装置および外観検査方法
JP2017166903A (ja) * 2016-03-15 2017-09-21 株式会社大真空 欠陥検査装置及び欠陥検査方法
WO2019039331A1 (ja) * 2017-08-24 2019-02-28 日本電気硝子株式会社 板ガラスの製造方法
JP2019219357A (ja) * 2018-06-22 2019-12-26 名古屋電機工業株式会社 撮影装置、撮影方法および撮影プログラム
WO2021172089A1 (ja) * 2020-02-28 2021-09-02 日東電工株式会社 光透過性積層体の検査方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005062165A (ja) 2003-07-28 2005-03-10 Nitto Denko Corp シート状製品の検査方法、検査システム、シート状製品、及び、画像表示装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014081356A (ja) * 2012-09-27 2014-05-08 Nissan Motor Co Ltd 自動車車体の外観検査装置および外観検査方法
JP2017166903A (ja) * 2016-03-15 2017-09-21 株式会社大真空 欠陥検査装置及び欠陥検査方法
WO2019039331A1 (ja) * 2017-08-24 2019-02-28 日本電気硝子株式会社 板ガラスの製造方法
JP2019219357A (ja) * 2018-06-22 2019-12-26 名古屋電機工業株式会社 撮影装置、撮影方法および撮影プログラム
WO2021172089A1 (ja) * 2020-02-28 2021-09-02 日東電工株式会社 光透過性積層体の検査方法

Also Published As

Publication number Publication date
WO2023021854A1 (ja) 2023-02-23
TW202309511A (zh) 2023-03-01
CN117795288A (zh) 2024-03-29
KR20240045215A (ko) 2024-04-05

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