KR20240037970A - 광 검출기, 광 검출기의 제조 방법 및 전자 기기 - Google Patents
광 검출기, 광 검출기의 제조 방법 및 전자 기기 Download PDFInfo
- Publication number
- KR20240037970A KR20240037970A KR1020247002534A KR20247002534A KR20240037970A KR 20240037970 A KR20240037970 A KR 20240037970A KR 1020247002534 A KR1020247002534 A KR 1020247002534A KR 20247002534 A KR20247002534 A KR 20247002534A KR 20240037970 A KR20240037970 A KR 20240037970A
- Authority
- KR
- South Korea
- Prior art keywords
- light
- pixel
- deflection
- photodetector
- photoelectric conversion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/18—Diffraction gratings
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- H01L27/14625—
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/806—Optical elements or arrangements associated with the image sensors
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- H01L27/14603—
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- H01L27/1462—
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- H01L27/1463—
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- H01L27/14685—
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
- H10F39/024—Manufacture or treatment of image sensors covered by group H10F39/12 of coatings or optical elements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/802—Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/805—Coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/805—Coatings
- H10F39/8053—Colour filters
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/805—Coatings
- H10F39/8057—Optical shielding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/806—Optical elements or arrangements associated with the image sensors
- H10F39/8063—Microlenses
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/806—Optical elements or arrangements associated with the image sensors
- H10F39/8067—Reflectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/807—Pixel isolation structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/811—Interconnections
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Solid State Image Pick-Up Elements (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021130073 | 2021-08-06 | ||
| JPJP-P-2021-130073 | 2021-08-06 | ||
| PCT/JP2022/028108 WO2023013408A1 (ja) | 2021-08-06 | 2022-07-19 | 光検出器、光検出器の製造方法及び電子機器 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20240037970A true KR20240037970A (ko) | 2024-03-22 |
Family
ID=85155979
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020247002534A Pending KR20240037970A (ko) | 2021-08-06 | 2022-07-19 | 광 검출기, 광 검출기의 제조 방법 및 전자 기기 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US20250120206A1 (https=) |
| EP (1) | EP4383332A4 (https=) |
| JP (1) | JPWO2023013408A1 (https=) |
| KR (1) | KR20240037970A (https=) |
| CN (1) | CN117616576A (https=) |
| DE (1) | DE112022003847T5 (https=) |
| TW (1) | TW202310378A (https=) |
| WO (1) | WO2023013408A1 (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2024225102A1 (ja) * | 2023-04-28 | 2024-10-31 | ソニーセミコンダクタソリューションズ株式会社 | 光検出装置および測距装置 |
| JP2025030261A (ja) * | 2023-08-23 | 2025-03-07 | ソニーセミコンダクタソリューションズ株式会社 | 光検出装置および電子機器 |
| CN117936559A (zh) * | 2023-12-31 | 2024-04-26 | 深圳阜时科技有限公司 | 光电转换像素阵列以及系统 |
| WO2025177838A1 (ja) * | 2024-02-21 | 2025-08-28 | ソニーセミコンダクタソリューションズ株式会社 | 光検出装置 |
| US20250318298A1 (en) | 2024-04-08 | 2025-10-09 | Visera Technologies Company Ltd. | Image sensor |
| WO2025229714A1 (ja) * | 2024-04-30 | 2025-11-06 | ソニーセミコンダクタソリューションズ株式会社 | 光検出装置及び電子機器 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006156515A (ja) | 2004-11-26 | 2006-06-15 | Sony Corp | 固体撮像装置及びその製造方法 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5342821B2 (ja) * | 2008-07-16 | 2013-11-13 | パナソニック株式会社 | 固体撮像素子 |
| JP5430387B2 (ja) * | 2009-12-22 | 2014-02-26 | キヤノン株式会社 | 固体撮像装置及び固体撮像装置の製造方法 |
| US8981510B2 (en) * | 2010-06-04 | 2015-03-17 | Taiwan Semiconductor Manufacturing Company, Ltd. | Ridge structure for back side illuminated image sensor |
| JP6299058B2 (ja) * | 2011-03-02 | 2018-03-28 | ソニー株式会社 | 固体撮像装置、固体撮像装置の製造方法及び電子機器 |
| JP2015028960A (ja) * | 2011-12-01 | 2015-02-12 | ソニー株式会社 | 固体撮像装置および電子機器 |
| WO2013172232A1 (ja) * | 2012-05-16 | 2013-11-21 | ソニー株式会社 | 固体撮像装置、及び、電子機器 |
| KR102568789B1 (ko) * | 2016-03-10 | 2023-08-21 | 삼성전자주식회사 | 무기 컬러 필터를 포함하는 컬러 필터 어레이, 상기 컬러 필터 어레이를 포함하는 이미지 센서 및 디스플레이 장치 |
| US10050159B2 (en) * | 2016-12-12 | 2018-08-14 | Taiwan Semiconductor Manufacturing Co., Ltd. | Lens structure |
| JP2018098641A (ja) | 2016-12-13 | 2018-06-21 | ソニーセミコンダクタソリューションズ株式会社 | 画像処理装置、画像処理方法、プログラム、および電子機器 |
| JP2018156999A (ja) * | 2017-03-16 | 2018-10-04 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像装置及び電子装置 |
| JP6987529B2 (ja) | 2017-05-15 | 2022-01-05 | ソニーセミコンダクタソリューションズ株式会社 | 撮像素子、撮像素子の製造方法、電子機器、及び、撮像モジュール |
| JP7461294B2 (ja) * | 2017-08-31 | 2024-04-03 | メタレンズ,インコーポレイテッド | 透過型メタサーフェスレンズ統合 |
| JP2021015869A (ja) * | 2019-07-11 | 2021-02-12 | ソニーセミコンダクタソリューションズ株式会社 | 撮像素子および撮像装置 |
| EP3812801B1 (en) * | 2019-10-23 | 2024-06-19 | Samsung Electronics Co., Ltd. | Image sensor including color separating lens array and electronic device including the image sensor |
-
2022
- 2022-07-13 TW TW111126217A patent/TW202310378A/zh unknown
- 2022-07-19 WO PCT/JP2022/028108 patent/WO2023013408A1/ja not_active Ceased
- 2022-07-19 US US18/293,454 patent/US20250120206A1/en active Pending
- 2022-07-19 EP EP22852832.9A patent/EP4383332A4/en active Pending
- 2022-07-19 CN CN202280049236.7A patent/CN117616576A/zh active Pending
- 2022-07-19 KR KR1020247002534A patent/KR20240037970A/ko active Pending
- 2022-07-19 DE DE112022003847.0T patent/DE112022003847T5/de active Pending
- 2022-07-19 JP JP2023540237A patent/JPWO2023013408A1/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006156515A (ja) | 2004-11-26 | 2006-06-15 | Sony Corp | 固体撮像装置及びその製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2023013408A1 (https=) | 2023-02-09 |
| EP4383332A1 (en) | 2024-06-12 |
| WO2023013408A1 (ja) | 2023-02-09 |
| US20250120206A1 (en) | 2025-04-10 |
| TW202310378A (zh) | 2023-03-01 |
| EP4383332A4 (en) | 2024-10-23 |
| DE112022003847T5 (de) | 2024-06-20 |
| CN117616576A (zh) | 2024-02-27 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| A201 | Request for examination | ||
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| D21 | Rejection of application intended |
Free format text: ST27 STATUS EVENT CODE: A-1-2-D10-D21-EXM-PE0902 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |