KR20180028882A - Handler for testing electronic devices - Google Patents

Abstract

The present invention relates to a handler for testing electronic parts. According to the present invention, the handler for testing electronic parts comprises a moving chamber for accommodating a test tray on which the electronic parts are loaded and moving along a predetermined moving path. The moving chamber includes a first chamber part for controlling the temperature of the electronic parts loaded in the test tray and a second chamber part for returning the temperature of the electronic parts loaded in the test tray to the room temperature. According to the present invention, an installation space can be drastically reduced compared to a processing capacity since a plurality of test windows can be provided in a cell form by configuring the moving chamber. In addition, an installation region can be minimized by dividing one chamber into two so that functions of the two divided chambers are set differently.

Description

[0001] HANDLER FOR TESTING ELECTRONIC DEVICES [0002]

The present invention relates to a handler for testing electronic components.

The produced electronic parts are tested by a tester and divided into good and defective parts, so only good parts are shipped.

Electrical connection between the tester and the electronic component is performed by a handler for testing electronic components (hereinafter, referred to as a 'handler'), and there are various types of handlers depending on the type of electronic component. The present invention relates to a handler to which a test tray to which a plurality of electronic parts can be loaded is applied.

The handler to which the test tray is applied may have various forms including Korean Patent Laid-Open No. 10-2013-0105104 and the like. Generally, the handler includes a loading unit 110, a first chamber 120, A first chamber 130, a connector 140, a second chamber 150, and an unloading unit 160.

The loading unit 110 loads electronic components to be tested loaded in the customer tray CT ₁ into a test tray TT in a loading position LP.

The first chamber 120 is provided to pre-adjust (preheat or precool) the temperature according to the test temperature condition prior to testing the electronic components loaded in the received test tray TT.

The test chamber 130 is provided to test the electronic components of the test tray TT that have been preheated / precooled in the first chamber 120 and then transferred to the test position TP (TEST POSITION). That is, the test chamber 130 is provided to maintain the temperature of the electronic components loaded in the received test tray TT at the test temperature condition.

The connector 140 electrically connects the electronic components loaded in the test tray TT of the test position TP to the tester.

The second chamber 150 is provided to cool the electronic components in a heated state of the test tray TT transferred from the test chamber 130 and to return the temperature to a temperature at which no problem occurs at room temperature or unloading .

The unloading unit 160 unloads the electronic components from the test tray TT in the unloading position UP and moves the unclassified customer tray CT ₂ into the unclassified customer tray CT ₂ according to the test grade.

As has been seen, the test tray TT is circulated along the circulation path CC leading to the loading position LP via the loading position LP, the test position TP and the unloading position UP, A plurality of conveyers not shown for conveying the test tray TT in each of the sections constituting the circulation path CC.

The handler 100 shown in FIG. 1 transports the test tray TT in a closed circulation path CC and a structure in which the test chamber 130 is placed between the first chamber 110 and the second chamber 150 , It is difficult to provide four or more test windows (TW) in consideration of the width and height of the equipment. Here, the test window TW refers to a window in which electronic components are electrically connected to a tester, and one test tray TT corresponds to one test window TW. Of course, the tester TESTER is coupled to the handler 100 via the test window TW.

 Thus, the number of electronic components that can be tested at one time is limited to the number of test trays (TT) loaded from one to at least three test trays (TT), which allows the handler 100, which can not expand indefinitely, .

It is an object of the present invention to provide a technique by which one temperature control chamber can supply test trays to multiple test windows or receive test trays from multiple test windows.

According to a first aspect of the present invention, there is provided a handler for testing electronic parts, comprising: a movable chamber capable of receiving a test tray on which electronic parts are loaded and moving in a predetermined movement path; A conveyor for conveying the moving chamber on the moving path; A test window provided on at least one side of the movement path for receiving a test tray from the movement chamber or for supplying a test tray to the movement chamber and for electrically testing the electronic parts mounted on the test tray, A connector for electrically connecting or disconnecting the electronic component to the tester; And at least one mobile device for moving a test tray between the mobile chamber and the connector; .

The at least one mobile device may be installed in the mobile chamber and move with the mobile chamber.

The transfer chamber includes: a first chamber portion for regulating the temperature of the electronic component loaded in the test tray; And a second chamber portion disposed in parallel with the first chamber portion in a vertical direction and returning the temperature of the electronic component loaded in the test tray to room temperature; Wherein the first chamber portion and the second chamber portion are separated from each other by a mutual separation wall.

Wherein the first chamber portion includes an opening / closing door for opening / closing a first transfer hole for receiving a test tray in a loading position or for sending a test tray to the connector, and the second chamber portion sending a test tray to an unloading position And a second moving hole for receiving the test tray coming from the connector, and the inside of the second chamber portion communicates with the outside through the second moving hole.

An elevator for lifting the movable chamber to a position where the test tray can be sent from the first chamber portion to the connector or a position where the second chamber portion can receive the test tray from the connector; As shown in FIG.

The test window is a plurality of test windows, and the connector is provided for each of the plurality of test windows.

A plurality of test chambers for accommodating the test trays coming from the mobile chamber and provided at each test window side to maintain a test temperature condition of the electronic components; Wherein the moving chamber and the test chamber have a one-to-many number relationship.

The plurality of connectors are arranged on both sides of the movement path.

A test chamber for receiving a test tray from the mobile chamber and maintaining the temperature of the electronic components loaded in the received test tray at a test temperature condition; And a circuit breaker for blocking the electronic components of the test tray on the path from the moving chamber to the test chamber to outside air; As shown in FIG.

The handler comprising: a first buffer chamber in which a test tray on which an electronic component to be tested is loaded, waits before moving to the transfer chamber; And a second buffer chamber for receiving and waiting the test tray on which the tested electronic component from the transfer chamber is loaded; The first buffer chamber and the second buffer chamber may be fixedly mounted.

The thermal state inside the first buffer chamber through the closed passage formed between the first buffer chamber and the transfer chamber is shifted from the first transfer chamber to the transfer chamber before the test tray moves into the transfer chamber inside the first buffer chamber, And the temperature of the interior of the transfer chamber is adjusted to the temperature inside the first buffer chamber.

A handler for testing electronic parts according to a second aspect of the present invention includes: an accommodating chamber capable of accommodating a test tray on which electronic parts are loaded; An electronic component is electrically connected to a tester coupled to a test window so as to be able to receive a test tray from the accommodating chamber or to give a test tray to the accommodating chamber, A connector provided on one side of the accommodating chamber for connecting or disconnecting the connector; And a plurality of mobile devices for moving a test tray between the accommodating chamber and the connector; The accommodating chamber comprising: a first chamber portion for regulating the temperature of the electronic component loaded in the test tray; And a second chamber part for integrally connecting with the first chamber part and disposed side by side, the first chamber part being separated from the inside by a separating wall and returning the temperature of the electronic part loaded on the test tray to room temperature, ; Wherein some of the plurality of mobile devices move the test tray from the first chamber portion to the connector and another portion moves the test tray from the connector to the second chamber portion.

The first chamber portion and the second chamber portion are arranged side by side in the vertical direction.

The present invention has the following effects.

First, by configuring a mobile chamber that can access the test window, a plurality of test windows can be provided in a cell form, thereby minimizing the size of the handler compared to the processing capacity.

Second, since one moving chamber can be connected to a plurality of test chambers (or connectors) while moving, the number of conveyors for passing the test tray to each test chamber is greatly reduced, so that the size can be further minimized, Savings.

 Third, it is possible to increase or decrease the number of cells with the same structure, which makes it easier to manufacture the handler according to the customer's request. That is, a separate design is not required to increase or decrease the capacity.

Fourth, since one mobile chamber can be accessed to each test chamber (or connector), it is possible to test in various temperature environments by dividing the mobile chamber into two regions and setting the functions differently, Can be further minimized.

Fifth, it may be an equipment optimized for a facility having a test time longer than the environment composition time in the mobile chamber.

1 is a conceptual plan view of a conventional handler for testing electronic components.
2 is a conceptual plan view of a handler according to a first embodiment of the present invention.
3 is a schematic front cross-sectional view of the mobile chamber applied to the handler of FIG. 2;
Fig. 4 is a conceptual perspective view of a lifting cam that is applied to the moving chamber of Fig. 3;
Fig. 5 is a reference diagram for explaining the operation of the elevating cam of Fig. 4. Fig.
Figure 6 is a conceptual front view of the elevator applied to the handler of Figure 2;
Fig. 7 is a reference diagram for explaining the operation of the elevator of Fig. 6; Fig.
Figure 8 is a conceptual top view of the conveyor applied to the handler of Figure 2;
Figure 9 is a conceptual front view of a test chamber applied to the handler of Figure 2;
Figure 10 is a conceptual side cross-sectional view of the connector applied to the handler of Figure 2;
11 is a reference diagram for explaining the operation of the connector of Fig.
12 is a conceptual perspective view of a mobile device applied to the handler of FIG. 2;
13 is a reference diagram for explaining the operation of the mobile device of Fig.
Figure 14 is a conceptual front view of a circuit breaker applied to the handler of Figure 2;
Fig. 15 is a reference diagram for explaining the operation and function of the circuit breaker of Fig. 12; Fig.
16 is a conceptual plan view of a handler according to a second embodiment of the present invention.
17 is a conceptual plan view of a handler according to a modification of the second embodiment of the present invention.
18 is a conceptual plan view of a handler according to a third embodiment of the present invention.
FIG. 19 is a reference view showing a state in which the handler of FIG.
20 is a conceptual plan view of a handler according to a fourth embodiment of the present invention.

Preferred embodiments according to the present invention will be described with reference to the accompanying drawings, wherein redundant description of the same constitution is omitted or compressed as much as possible for brevity of description.

≪ Embodiment 1 >

1. An overview of the configuration

2 is a conceptual plan view of a handler 200 according to a first embodiment of the present invention.

The handler 200 according to the present embodiment includes a moving chamber 210, an elevator 220, a conveyor 230, eight test chambers 241 to 248, eight connectors 251 to 258, The first and second openers 281 and 282 and the driving tester DT are connected to the first and second moving devices 261a and 261b, the two second mobile devices 262a and 262b, the loading device 271, the unloading device 272, ), And two breakers 291 and 292.

The moving chamber 210 reciprocates in a predetermined movement path MC in the forward and backward directions. The transfer chamber 210 may be provided with a test tray TT.

The elevator 220 moves the movable chamber 210 up and down. This is because the transfer chamber 210 can be provided with the test tray TT in the test chamber 241 to 248 or the unloading position UP or from the test chamber 241 to 248 or the loading position LP .

The conveyor 230 moves the moving chamber 210 on the movement path MC.

The eight test chambers 241 to 248 are provided on the left and right sides of the movement path MC in four parts and are provided to maintain the electronic components of the accommodated test tray TT at the test temperature condition.

Eight connectors 251 to 258 electrically connect the electronic components of the test tray TT accommodated in the test chambers 241 to 248 to a tester (not shown). Each of the connectors 251 to 258 is provided to receive a test tray TT from the transfer chamber 210 or to give a test tray TT to the transfer chamber 210. Therefore, the eight connectors 251 to 258 are also arranged on the left and right sides of the movement path MC by four.

Two first mobile devices 261a and 261b and two second mobile devices 262a and 262b are installed in the mobile chamber 210 and move together with the mobile chamber 210. [ Here, the first mobile units 261a and 261b bring the test tray TT that has been loaded with the electronic components from the loading position LP to the mobile chamber 210 or the test tray TT accommodated in the mobile chamber 210 To the test chambers 241 to 248, respectively. The second mobile devices 262a and 262b perform the function of bringing the test tray TT in the test chambers 241 to 248 to the moving chamber 210 or sending the test tray TT to the unloading position UP.

Loading machine 271 moves the electronic component in the customer tray (CT ₁₎ a test tray (TT) in the loading position (LP).

Unloading dinghy 272 moves the electronic component to the empty customer tray (CT _2, CT ₃₎ from the test tray (TT) in the unloading position (UP).

The first opener 281 opens the test tray TT in the loading position LP so that the electronic component can be properly loaded in the test tray TT.

The second opener 282 opens the test tray TT in the unloading position UP so that the electronic component can be properly drawn out from the test tray TT.

The drive tester (DT) is provided to simply test whether the electronic components are electrically driven.

The two breakers 291 and 292 are installed in the moving chamber 210 and function to shut off the test tray TT from the moving chamber 210 to the test chambers 241 to 248 from the outside air.

2. Explanation of Individual Configurations

end. Description of the mobile chamber 210

3, the moving chamber 210 is divided into a first chamber portion 211 on the lower side and a second chamber portion 212 on the upper side by the partition wall DW. Here, it is preferable that the separating wall DW is provided as a heat insulating material to block thermal movement.

The first chamber portion 211 is provided to pre-adjust the temperature of the electronic component loaded in the test tray TT so as to correspond to the test temperature environmental condition. The first chamber portion 211 may have a heater (HT) for the high temperature environment composition and / or a cooling module (CM) for the low temperature environment composition, depending on the utilization conditions of the handler (200). In this case, it is preferable that the heater HT is provided under the first chamber part 211 in consideration of the movement of air according to the temperature state of the air, and the cooling module CM is provided at the upper part of the first chamber part 211 . Here, the cooling module CM may be provided with the evaporator 1, the circulating fan 2, and the housing 3, and the air inside the first chamber portion 211 is circulated by the circulating fan 2 to the housing 3, And circulates to be discharged from the housing 3 via the evaporator 1, thereby cooling the electronic components of the test tray TT. Here, the driving motor 2a of the circulating fan 2 is preferably provided outside the first chamber part 211 to prevent damage due to heat or condensation.

For reference, the first chamber portion 211 functions as a heating chamber, and the second chamber portion 212 functions as a cooling chamber. In this case, considering the principle that the heat is raised and the cold air is lowered and the first chamber part 211 for raising the temperature is taken into account, considering that the structure is generally closed by a lot of structures at the lower part of the structure of the equipment, And the second chamber portion 212 for lowering the temperature is preferably placed on the upper side. In the case of the room temperature test, the upper second chamber portion 212 may be designed to be opened as much as possible. However, in order to return to a predetermined temperature or to cool to a predetermined temperature, the second chamber portion 212 may block the outside air As shown in Fig.

The first chamber portion 211 also receives the test tray TT from the loading position LP on the left side of the movement path MC or the test chamber TT from the test chambers 241 to 248 A left moving hole LH ₁ is formed in the left side wall and a right side moving hole RH ₁ is formed in the right side wall so that the test tray TT can be selectively sent to the test tray TT. The first chamber part 211 is provided with a left opening and closing door LD for opening and closing the left moving hole LH ₁ and a right moving hole RH ₁ (RH ₁ ) for opening and closing the inside of the first chamber part 211, And a right opening / closing door RD for opening / closing the door. Each of the opening and closing doors LD and RD can be configured to open and close the moving holes LH ₁ and RH ₁ while lifting up and down by a separate driving source such as a cylinder CD. Of course, although the opening and closing door may be provided to be opened and closed by the hinge structure, the elevating structure is more preferable in order to prevent the width of the equipment from widening.

The first chamber portion 211 has a pair of support rails 211a and elevating cams 211b.

The pair of support rails 211a support the front and rear ends of the test tray TT accommodated in the first chamber portion 211 while guiding the movement of the test tray TT moving in the left and right directions.

The elevating cam 211b elevates and lowers the pair of supporting rails 211a. 4, the elevating cam 211b includes a drive shaft DS, a driven shaft PS, a transfer belt TB, and a rotary motor RM.

Camshafts CP having a center O 'deviated from the center O of each axis are formed in the drive shaft DS and the driven shaft PS. The pair of support rails 211a are supported by the cam protrusions CP.

The transfer belt TB transfers the rotational force of the drive shaft DS to the driven shaft PS. It is preferable that the transfer belt TB is provided as a timing belt for precisely interlocking the drive shaft DS and the driven shaft PS.

The rotary motor RM rotates the drive shaft DS. Accordingly, when the rotary motor RM is operated, the driving shaft DS and the driven shaft PS are rotated to rotate the cam protrusion CP so that the supporting rail 211a is rotated at a predetermined height H . Of course, the test tray TT placed on the support rail 211a also moves up and down with the lifting and lowering of the support rail 211a.

The second chamber portion 212 is changed to a temperature at which it is possible to change the tested electronic components close to room temperature or at least enable proper unloading of the electronic component without damaging the electronic component or the unloading machine 272 .

The second chamber part 212 may be provided in a sealed structure in accordance with the utilization conditions of the handler 200 and may include a heater for raising the temperature of the electronic part and a cooling module for lowering the temperature of the electronic part, It is possible. In the present embodiment, however, only the simplest cooling structure for lowering the temperature of the electronic component through the blowing fan VP is provided so that the temperature of the tested electronic component is changed close to the room temperature by exposing the electronic component to the outside air have.

This second chamber portion 212 also receives the test tray TT from the test chambers 241 to 248 on the left and right sides of the movement path MC or the test tray TT to the unloading position UP on the right front side, A left moving hole LH ₂ and a right moving hole RH ₂ are formed in the left side wall and the right side wall, respectively. The second chamber portion 212 in this embodiment has a separate opening and closing door for opening and closing the left moving hole LH ₂ and the right moving hole RH ₂ so that the electronic components therein can be exposed to the outside air And communication holes CH are also formed in the front and rear side walls so that the inside thereof is more exposed to the outside air.

Similarly, the second chamber portion 212 also supports a pair of front and rear support rails 212a that can guide the movement of the test tray TT moving in the left and right direction while supporting the received test tray TT, And an elevating cam 212b for elevating the elevating cam 212a.

The first chamber portion 211 functions as a supply chamber for supplying the test tray TT to the test chambers 241 to 248 and the second chamber portion 212 functions as a supply chamber for supplying the test tray TT from the test chambers 241 to 248 TT). Also, the first chamber portion 211 functions as a soak chamber for applying a temperature stimulus to the electronic component, and the second chamber portion 212 functions as a desoke chamber for removing a temperature stimulus from the electronic component. Of course, the upper and lower positions of the two chamber portions 211 and 212 may be mutually exchanged.

I. Description of elevator 220

The elevator 220 moves the movable chamber 210 up and down. The reason for this is to allow the mobile chamber 210 to receive or receive the test tray TT at an appropriate position. The elevator 220 may include an elevating cylinder 221 installed on the moving frame 231 of the conveyor 230 as shown in FIG.

7, the moving holes LH ₁ and RH ₁ of the first chamber portion 211 are flush with the opening and closing holes OH of the test chambers 241 to 248 Or the moving holes LH ₂ and RH ₂ of the second chamber portion 211 are flush with the opening and closing holes OH of the test chambers 241 to 248. The test tray TT can move from the first chamber portion 211 to the test chambers 241 to 248 or from the test chambers 241 to 248 to the second chamber portion 212. Of course, the elevating cylinder 221 may be provided in one or more numbers.

In addition, as a method for adjusting the position, it is also possible to design the structure so as to raise and lower the openers 281 and 282 on both sides rather than the movable chamber 210. However, in this case, since one or more lifting cylinders must be provided for each of the openers 281 and 282, it is more preferable to implement the lifting and lowering of the mobile chamber 210 in terms of production cost, optimization of equipment size, and controllability.

Of course, when the vertical height of the test chambers 241 to 248 is longer than the vertical height of the movable chamber 210 and the structure in which the electronic components are lifted and lowered in the test chamber is applied, the movable chamber 210 and the openers 281, 282 may be separately provided. That is, when the connecting unit, which will be described later, is configured to selectively place the test tray TT at the height of the first chamber portion 211 or the second chamber portion 212, the moving chamber 210 or the opening portion 281, and 282 are not required to be provided.

All. Description of the conveyor 230

The conveyor 230 moves the moving chamber 210 on the movement path MC. The movement path MC is a long backward and forward path capable of reciprocating between the loading position LP and the unloading position UP of the left and right and the test chambers 241 to 248. The conveyor 230 includes a moving frame 231, a rotating shaft 232, a conveying motor 233, and a pair of guide rails 234 as shown in FIG.

The moving frame 231 is coupled with the rotating shaft 232 in a bolt-coupled manner, and can be moved in the forward and backward directions according to the rotation of the rotating shaft 232. The moving frame 210 is connected to the elevator 220 and the moving chamber 210 is coupled to the elevator 220 so that the moving chamber 210 and the elevator 220 are moved in accordance with the movement of the moving frame 231. [ (220) are moved together.

The rotation axis 232 is provided in a long form in the forward and backward directions to provide the movement path MC.

The feed motor 233 rotates the normal and reverse rotation shafts 232.

The pair of guide rails 234 guides the back and forth movement of the moving frame 231.

la. Description of test chambers 241 to 248

The eight test chambers 241 to 248 are divided into four on the right and left sides of the movement path MC.

The test chambers 241 are provided with the opening and closing holes OH on the moving path MC for moving the test tray TT coming from the moving chamber 210 or moving to the moving chamber 210 as shown in the schematic front sectional view of FIG. Is formed. Naturally, there is provided an intermittent door CG for interrupting the opening / closing holes OH for insulation.

On the other hand, a test window TW is formed below the test chamber 241, and the tester TESTER is coupled to the test window TW side. In general, one test chamber 241 to 248 is provided with one test window TW, so that a total of eight test windows TW are provided in the handler 200 according to the present embodiment. Here, the test window TW means an area where the test site (test area), i.e., the test chamber and the tester meet with each other.

Of course, the test chamber 241 may have a heater (HT) for a high-temperature environment composition and a cooling module (CM) for forming a low-temperature environment depending on the utilization conditions of the handler (200). Of course, it is preferable to further include an air circulation fan (PAN) for uniform distribution of heat or cool air.

The test chamber 241 is provided with an electromagnet EM on its opening / closing hole OH side. When power is applied to the electromagnet EM, the breaker 291 is operated.

The test chambers 242 to 248 are the same as the test chambers 241 or are mutually symmetric with respect to the movement path MC as the reference lines, and therefore the description thereof will be omitted.

Since the handler 200 according to the present invention includes the tester 241 to 248 in the form of a cell divided into left and right tiers, even when a handler with an expanded processing capacity is required, the conveyor 230, which will be described later, It is possible to simplify the design.

It is needless to say that it is not necessary to provide a test chamber when it is provided as an equipment for a room temperature test which does not need to maintain the electronic components at a constant temperature during a test. That is, it is sufficient to provide the test chamber 241 only in the equipment in which the electronic component needs to be tested in a predetermined temperature range. Of course, the test chamber may be provided in an open form even if it is implemented as a room temperature test equipment.

hemp. Description of connectors 251 to 258

Eight connectors 251 to 258 connect the electronic components to the tester (not shown) by pressing the electronic components loaded in the test tray TT in the test chambers 241 to 248 to the tester TESTER side TESTER). 10, the connector 251 is provided with a gripping member GE and a pressure source PS.

The gripping member GE is provided inside the test chamber 241 and has a gripping groove GH for gripping both ends of the test tray TT. Here, the grip grooves GH are elongated in the left-right direction, and may guide the movement of the test tray TT moving in the left-right direction.

The pressure source PS may be provided with a motor and moves the gripping member GE up and down to lower or raise the test tray TT gripped by the gripping member GE. 11 (a), when the connector 251 descends the test tray TT, the electronic component is pressed toward the tester TESTER coupled to the lower side, so that the tester TESTER and the electronic component are electrically . When the connector 251 raises the test tray TT as shown in FIG. 11 (b), the electrical connection between the tester TESTER and the electronic component is released.

Of course, the movement of the test tray TT is performed in a state as shown in FIG. 11 (b).

It is preferable that the pressurizing source PS is provided outside the test chamber 241 (upper side of the test chamber in this embodiment) so as not to be influenced by the temperature environment inside the test chamber 241.

The couplers 252 to 258 are the same as the coupler of the numeral 251, or are mutually symmetrical with respect to the movement path C as the reference line, and therefore the description thereof will be omitted.

bar. A description of the mobile devices 261a, 261b, 262a, and 262b

The first mobile devices 261a and 261b are installed in the first chamber portion 211. The first mobile device 261a is responsible for the movement of the test tray TT in the left direction of the movement path C, The first mobile device of the first embodiment is responsible for the movement of the test tray TT in the right direction of the movement path C.

The second mobile device 262a and 262b are installed in the second chamber part 212. The second mobile device 262a is responsible for the movement of the test tray TT in the left direction of the movement path C, The second mobile device of the second embodiment is responsible for the movement of the test tray TT in the right direction of the movement path C.

As shown in FIG. 12, the first mobile unit 261a includes a grip unit GS and a mobile station MS.

The gripper GS has a grip pin GP for gripping a test tray TT at its left end, and a rack gear RG is formed in the right and left direction. 13 (a) and 13 (b), the gripping pin GP is inserted into the gripping hole GH of the test tray TT when the test tray TT rises by the operation of the elevating cam 211b The test tray TT is held, and when the test tray TT descends, the test tray TT comes out of the gripping hole GH.

The moving source MS moves the test tray TT held by the gripper GS in the left and right directions by moving the grip unit GS in the left and right directions. To this end, the moving source MS has a rack gear RG of a grip GS and a pinion gear PG which is gear-engaged. It is preferable that such a source MS is provided outside the mobile chamber 210 to prevent thermal damage. When the source MS operates in the state of FIG. 13A, the test tray TT also moves to the left together with the pusher GS moving to the left as shown in FIG. 13C.

Since the first mobile device 261 and the second mobile devices 262a and 262b denoted by reference numeral 261b are substantially the same in structure, their description will be omitted.

four. Description of the loading device 271 and the unloading device 272

The loading unit 271 and the unloading unit 272 may have a structure for moving the electronic parts. The loading unit 271 and the unloading unit 272 are tools for gripping and moving the electronic components and then releasing the electronic components to the required points. The loading units 271 and the unloading units 272 may have various gripping structures according to the types of the electronic components. Techniques relating to various types of gripping structures according to the types of electronic parts are already well known in Korean Patent Laid-Open Nos. 10-2002-0049848 and 10-2003-0016060, and therefore detailed description thereof will be omitted. In some implementations, the electronic part may be supplied to the handler while being loaded on the test tray. In this case, the loading unit 271 may be omitted. The unloading unit 272 may also be omitted if the test tray in which the tested electronic components are loaded is drawn out from the handler and classified by a separate device.

Ah. Description of openers 281 and 282

It is sufficient that the openers 281 and 282 perform the function of opening the test tray TT to load the electronic part with the test tray TT or to withdraw the electronic part from the test tray TT. Of course, the openers 281 and 282 may also have various open structures depending on the type of the electronic parts, depending on the type of the electronic parts. Various technologies related to various open structures according to the types of electronic components are already well known in Korean Patent Laid-Open Nos. 10-2009-0008062 and 10-2011-0136312, and therefore detailed description thereof will be omitted.

For reference, in a horizontal type handler in which a test tray is horizontally tested, an opener may or may not be provided depending on the type of the electronic part.

character. Description of Drive Tester (DT)

The driving tester DT is for testing whether or not the electronic component is properly driven when power is supplied to the electronic component. The driving tester DT is a device for driving the electronic components in the gripped state by the loading device 271, It may be provided at a position where it can be electrically connected to the terminal DT. The driving tester DT in this embodiment is provided in front of the loading position LP in order to minimize the operating radius of the loading unit 271. [

car. Description of breakers 291 and 292

The circuit breakers 291 and 292 block the test tray TT which moves from the transfer chamber 210 to the test chambers 241 to 248 with the outside air and more specifically to shut off the electronic parts moving with the test tray, If you can afford it, you can be in any form.

The circuit breakers 291 and 292 are installed in the moving chamber 210 so as to enclose the moving holes LH ₁ and RH ₁ in the first chamber portion 211 of the moving chamber 210. Of course, depending on the implementation, eight breakers may be preferably provided in the test chambers 241 to 248.

As shown in FIG. 14, the circuit breaker 291 in this embodiment may be composed of a corrugated tube WT and a coupling ring CR.

One side of the corrugated tube WT is coupled to the moving chamber 210 and is configured to be contractible and expandable in the left and right direction and forms a passage through which the test tray TT can pass.

The coupling ring CR is formed of a magnetic material and is provided at the left end of the corrugated tube WT. The coupling ring 291b is magnetically coupled to the right side wall of the test chamber 241 when the electromagnet EM in the test chamber 241 is magnetized as shown in FIG. The moving path MW of the test tray TT sealed with the outside air by the corrugated tube WT is formed between the opening and closing holes OH of the test chamber 241 and the moving hole LH ₁ of the moving chamber 210 . The circuit breaker 291 serves to prevent the loss of heat or cold as much as possible. Particularly, by preventing the occurrence of condensation due to the low-temperature-assimilated test tray (including the TT and the loaded electronic components) in the process of moving from the first chamber portion 211 to the test chambers 241 to 248 in the low temperature test, It is possible to prevent the electronic parts from being damaged due to condensation.

292 is different in direction and has the same structure as that of the circuit breaker of reference numeral 291, and its description will be omitted.

When the first chamber portion 211 functions as a heating chamber and the second chamber portion 212 is configured to function as a cooling chamber in a closed structure, One on each of the left and right sides of the second chamber portion 212 and the left and right sides of the second chamber portion 212, respectively. In other words, if only the room temperature test is performed, a circuit breaker including a corrugated tube may be unnecessary, but a circuit breaker including a corrugated tube may be required if the test must be performed at a predetermined temperature. This is because, if the cooled object meets air at room temperature, it may cause damages to the electronic parts including the semiconductor element due to the principle that condensation occurs. Therefore, if necessary, Or both chambers 211 and 212 may be equipped with a circuit breaker. For example, in the case of a room temperature test, a breaker is not necessary, and the moving chamber does not need to be divided into two chambers, and both chambers can be divided into open chambers. In this case, the mobile chamber will only function to relay the test tray without the temperature control function. In the case of the low temperature test, both chambers should have a closed structure, but a circuit breaker should be provided in both chambers in order to prevent condensation.

3. References

end. A is the loader cart, and B is the unloader cart.

The loader cart A is capable of loading a plurality of customer trays and is detachably mounted on the handler 200. Of course, the customer tray (CT ₁ ) loaded on the loader card (A) contains electronic components to be tested. At this time, the technique of mounting the loader cart A to the handler 200 and the technique of circulating the customer trays CT ₁ in the rotor cart A are disclosed in Korean Patent Application No. 10-2016-0026482 The detailed description thereof will be omitted.

The unloader cart B is also capable of loading a plurality of customer trays CT ₂ and is detachably mounted on the handler 100. In the unloader cart B, the customer trays CT ₂ carrying the tested electronic components are loaded.

Of course, it is also conceivable to provide a loading stacker or an unloading stacker, which is basically mounted on the handler, instead of the loader cart A and the unloader cart B, and may be provided with other types of feeding or retrieving means Can be considered as much as possible.

I. In the unloader bin box (C), there are provided customer trays (CT ₃ ) for loading defective electronic components.

All. The handler 200 may be provided with a buffer table BT for temporarily storing electronic components in accordance with a selection or an identifier (BR, for example, a bar code reader) for identifying electronic components.

la. The test tray TT has a grip hole GH into which the grip pin GP can be inserted as described above, and can have various load structures depending on the type of the electronic part. With regard to these various types of test trays (TT), they are shown in the prior patent documents such as Korean Patent Laid-open Nos. 10-2011-0136312 and 10-2008-0040654, and the description thereof will be omitted.

bar. In this embodiment, the first chamber part 211 is used as a soak chamber for applying thermal stress, and the second chamber part 212 is provided with a desoak chamber for removing thermal stress applied thereto. . The first chamber part 211 is provided with both the heater HT and the cooling module CM.

However, depending on the implementation, the first chamber portion and the second chamber portion may be structured such that both the first chamber portion and the second chamber portion are hermetically sealed. In this case, for example, a heater may be provided in the first chamber portion, The cooling module may be provided in the portion. In this example, in a high temperature test, the first chamber portion functions as a soak chamber and the second chamber portion functions as a desoak chamber, and in the low temperature test, the second chamber portion functions as a soak chamber and the first chamber portion It will function as a desoke chamber.

4. Operation description

Loading machine 271 moves the electronic component to a test tray (TT) in the loading position (LP) from a customer tray (CT ₁₎ placed on the upper side of the cart loader (A). At this time, the first opener 281 holds the test tray TT in the open state. Also, the loading device 281 tests whether the electronic parts are electrically driven by electrically connecting the electronic parts held by the electronic tester during moving the electronic parts with the driving tester DT. If it is determined that there is a problem in electric driving in this process, the electronic parts are loaded in the buffer table BT and the good electronic parts are moved to the test tray TT. Of course, in the process of moving the electronic part by the loading unit 271, the identification of the electronic parts is also performed by the identifier DA, thereby enabling individual history management for the electronic parts.

When the loading of the electronic component into the test tray TT in the loading position LP is completed, the first moving member of the reference numeral 261a operates to move the test tray TT of the loading position LP to the first chamber portion 211, As shown in FIG. The electronic components loaded in the test tray TT start to be assimilated into the internal temperature environment of the first chamber portion 211. [ At the same time, the mobile chamber 210 moves to the empty test chamber 241/242/243/244/245/246/247/248 side, and the first mobile unit 261a or 261b operates to move the test tray TT, From the first chamber portion 211 to the test chamber 241/242/243/244/245/246/247/248. At this time, the circuit breaker 291/292 is placed in a closed traveling path (in which the test tray TT can move) between the moving chamber 210 and the test chambers 241 to 248 (particularly between the first test portion and the test chamber) MW). The test tray TT accommodated in the test chambers 241 to 248 is held by the gripping members GE and the pressure source PS is operated so that the test tray TT is moved toward the tester TESTER side . When the lowering of the test tray TT is completed, the electronic components mounted on the test tray TT are electrically connected to the tester TESTER, and the electronic components are tested in this state.

On the other hand, when the test for the electronic components is finished, the connector 251/252/253/254/255/256/257/258 raises the test tray TT and the second mobile device 262a or 262b Thereby moving the test tray TT to the second chamber portion 212. At this time, since the movable chamber 210 is in a state of being lowered by the elevator 220, the moving hole LH ₂ / RH ₂ of the second chamber portion 212 is moved to the test chamber 241/242/243/244 / 245/246/247) of the opening / closing hole (OH). Subsequently, when the test tray TT is moved to the inside of the second chamber portion 212, the moving chamber 210 moves forward and is located on the left side of the unloading position UP. In this state, The second mobile unit operates to move the test tray TT to the unloading position UP. Then moves the electronic component to the empty customer tray (CT ₂₎ is placed on the upper side of the unloader cart (B) from the test tray (TT) in the unloading position (UP) by the unloading dinghy 272 operation. At this time, the electronic component determined to be defective is loaded into the customer tray (CT ₃ ) in the unloader bin box (C).

≪ Embodiment 2 >

16 is a conceptual plan view of a handler 300 according to a second embodiment of the present invention.

The handler 300 according to the present embodiment includes a moving chamber 310, an elevator 320, a conveyor 330, eight test chambers 341 to 348, eight connectors 351 to 358, The first and second motors 361a and 361b, the two second mobile devices 362a and 362b, the loading / unloading device 370, the first opening device 381, the second opening device 382, the driving tester DT, Circuit breakers 391 and 392, respectively. Among them, the moving chamber 310, the elevator 320, the conveyor 330, the eight test chambers 341 to 348, the eight connectors 351 to 358, the two first mobile devices 361a and 361b, The second openers 381 and 382 and the drive testers DT and the two breakers 391 and 392 are connected to the handler 300 according to the first embodiment, The elevator 220, the conveyor 230, the eight test chambers 241 to 248, the eight connectors 251 to 258, the two first mobile devices 261a and 261b, The second opener 282, the drive tester DT and the two breakers 291 and 292 are the same in structure and function as the two second mobile devices 262a and 262b, the first opener 281, the second opener 282, The description will be omitted.

However, in the handler 300 according to the present embodiment, there is no distinction between the loading position LP and the unloading position UP, and is divided into the first position 1P and the second position 2P. The first position 1P and the second position 2P can be switched to the loading position or the unloading position according to the operation state of the loading / unloading device 370. [ That is, the loading / unloading unit 370 loads the electronic components to be tested with the empty test tray TT in the first position 1P or the second position 2P, And unloads the electronic components from the test tray TT on which the tested electronic components in the position 2P are loaded.

In order to minimize the movement path of the loading / unloading unit 370, the handler 300 according to the present embodiment is preferably arranged so that the driving tester DT is provided in front of the moving chamber 310. Of course, the drive testers may be provided in more than two numbers.

It is also conceivable to divide the loading / unloading device into a first picking machine and a second picking machine. In this case, a control method or operation in which operation interference between the first picking machine and the second picking machine is prevented Separate design of the area is required.

≪ Modification to the Second Embodiment >

17 is a conceptual plan view of a handler 400 according to a modification of the second embodiment of the present invention.

17, the three unloading boxes C ₁ , C ₂ and C ₃ are arranged in a line in the left-to-right direction on the plane, without being loaded with a separate unloader cart, and unloaded from the test tray TT It is possible to classify good and defective parts among electronic parts. In addition, it is also possible to classify the good products by their respective grades.

≪ Third Embodiment >

18 is a conceptual plan view of a handler 500 according to a third embodiment of the present invention.

The handler 500 according to the present embodiment includes the accommodating chamber 510, the elevator 520, the test chamber 540, the connector 550, the first mobile devices 561a and 561b, the second mobile devices 562a and 562b, A loading / unloading device 570 and an opening device 580. [

In the present embodiment, the accommodating chamber 510 is positioned in front of the test chamber 540.

However, the accommodation chamber 510 has a structure in which the first chamber portion and the second chamber portion are arranged side by side in the up-and-down direction with the partition wall being divided in the vertical direction as in the first embodiment. That is, the first chamber portion and the second chamber portion are integrally combined to form one receiving chamber 510. The accommodating chamber 510 in the present embodiment does not move back and forth but can only move up and down by the elevator 520. [

The remaining components, the elevator 520, the test chamber 540, the coupler 550, the first mobile devices 561a and 562b, the second mobile devices 562a and 562b, the loading / unloading device 570 and the opener 580, The test chambers 341 to 348, the couplers 351 to 358, the first mobile devices 361a and 361b, the second mobile devices 362a and 362b, and the second mobile devices of the handler 300 in the second embodiment, The loading / unloading unit 370 and the opening unit 380, the description thereof will be omitted.

19 shows a state in which several handlers 500 of FIG. 18 are installed and used.

Similarly, in the present embodiment, when the height of the accommodating chamber 510 and the test chamber 540 are elevated, and the structure for raising and lowering the test tray TT in the test chamber 540 is applied, It is possible.

<Fourth Embodiment>

The present embodiment is an example in which the movement of the test tray TT is facilitated and the electronic parts can reach the temperature required in the test more quickly.

20 is a conceptual plan view of a handler 600 according to a fourth embodiment of the present invention.

The handler 600 according to the present embodiment includes a moving chamber 610, an elevator 620, a conveyor 630, eight test chambers 641 to 648, eight connectors 651 to 658, The first and second motors 661a and 661b, the two second mobile devices 662a and 662b, the loading and unloading device 670, the first opening device 681, the second opening device 682, the driving tester DT, And includes breakers 691 and 692. In addition, the handler 600 according to the present embodiment includes a first buffer chamber BC1 between the first opener 681 and the test chamber 641, and a second buffer chamber BC1 between the second opener 681 and the test chamber 645 And a second buffer chamber BC2 is provided between the test chambers.

Among the above components, the mobile chamber 610, the elevator 620, the conveyor 630, the eight test chambers 641 to 648, the eight connectors 651 to 658, the two first mobile devices 661a and 661b ), The two second mobile devices 662a and 662b, the first opener 681, the second opener 682, the drive tester DT and the two breakers 691 and 692, The elevator 220, the conveyor 230, the eight test chambers 241 to 248, the eight connectors 251 to 258, the two first mobile devices 261a and 261b, The configurations and the roles of the first and second mobile devices 262a and 262b, the first opener 281, the second opener 282, the drive tester DT and the two breakers 291 and 292 are substantially the same, The description will be omitted.

Loading and unloading dinghy 670 customer tray (CT ₁₎ for the electronic components is moved to the test tray (TT) in the loading position (LP), empty from the test tray (TT) in the unloading position (UP) Move the electronic components to the customer tray (CT ₂ , CT ₃ ). The loading and unloading unit 670 also plays the same role as the loading unit 271 and the unloading unit 272 of the first embodiment. That is, depending on whether the specification supports the quick test or the slow test, whether the loading and unloading is performed by one loading and unloading unit 670 as in the present embodiment, 271) and the unloading unit (272), so that the equipment can be designed.

The first buffer chamber BC1 waits before being moved to the moving chamber 610 after receiving the test tray TT in which loading of electronic components to be tested is completed in the loading position LP. Of course, as described in Korean Patent Laid-Open No. 10-2008-0082591, a plurality of test trays TT may be accommodated in the first buffer chamber BC1 and the accommodated test trays TT may be translationally moved.

Further, the first buffer chamber BC1 may be implemented to provide a temperature environment according to a test condition. In this case, the interior of the first buffer chamber BC1 is maintained at a high temperature in the high temperature test, and the interior of the first buffer chamber BC1 is maintained at the low temperature in the low temperature test.

In the second buffer chamber BC2, the test tray TT loaded with the tested electronic components from the transfer chamber 610 is accommodated and waits before moving to the unloading position UP. This second buffer chamber BC2 may be implemented to remove thermal stimuli from the electronic components loaded in the test tray TT from the transfer chamber 610. [ Similarly, the second buffer chamber BC2 may be provided to accommodate one or more test trays TT.

If the temperature of the electronic component is controlled through the first buffer chamber BC1 and the second buffer chamber BC2 provided as the fixed chamber, the time required for the electronic component to stay in the transfer chamber 610 is reduced, ) Can be improved. Therefore, since the test tray TT can be moved more quickly than the first embodiment in which the temperature of the electronic component is controlled only by the movable chamber 210 which is movably provided to carry out the function of carrying the electronic components, Will be able to rise.

Next, the operation of the handler 600 according to the present embodiment will be described.

When the loader cart A loaded with the customer trays CT ₁ loaded with the electronic components is mounted on the handler 600, the loading and unloading machine 670 loads the customer tray CT ₁ ) To the test tray TT in the loading position LP. In this process, the loading and unloading unit 670 is subjected to the discriminator BR and the drive tester DT so that the electronic component is firstly tested by the drive tester DT after being identified by the identifier BR Electronic components are primarily filtered due to defects due to the primary test. At this time, the electronic parts judged as defective are loaded in the buffer table BT.

When the loading of the electronic component into the test tray TT in the loading position LP is completed, the test tray TT is moved to the first buffer chamber BC1 and waits for movement to the transfer chamber 610 . Subsequently, the test tray TT is moved to the test chambers 641 to 648 which are empty together with the moving chamber 610, and then supplied to the test chambers 641 to 648, TT) is performed in the second test. When the secondary test for the electronic component is completed, the test tray TT moves back to the moving chamber 610, moves to the second buffer chamber BC2, and is moved to the unloading position UP. When all the electronic parts are unloaded from the test tray TT in the unloading position UP by the loading and unloading unit 670, the test tray TT is moved from the unloading position UP to the loading position LP, . Of course, the electronic components unloaded from the test tray TT in the unloading position UP by the loading and unloading unit 670 are moved to the empty customer tray CT ₂ placed on the upper side of the unloader cart B Or the electronic component judged to be defective is moved to the customer tray CT ₃ in the unloading box C.

For reference, the electronic component identification and drive test procedure is added at the time of loading, and since the time at which the thermal stimulation is applied to the electronic component is longer than the time at which the thermal stimulation is removed from the electronic component, It may be more preferably considered to be implemented to accommodate a larger number of test trays TT than the two buffer chambers BC2.

As in the present embodiment, when the first buffer chamber BC1 and the second bumper chamber BC2 are provided, the degree of freedom of design for the moving chamber 610 is increased according to the control.

For example, the temperature of the transfer chamber 610 can be assimilated by the first buffer chamber BC1 during a low-temperature test, as described later.

In the low temperature test, the interior of the first buffer chamber BC1 is formed at a temperature of -40 degrees. When the transfer chamber 610 is located on the side of the first buffer chamber BC1, the breaker 691 operates to open a path between the first buffer chamber BC1 and the transfer chamber 610. [ At this point, the doors of the movable chamber 610 and the doors of the first buffer chamber BC1 are closed.

The air in the passage is sensed by sensing, and the doors of the first buffer chamber BC1 and the moving chamber 610 operate in two stages.

A process of assimilating the internal temperature of the passage opened by the breaker 691 with the internal temperature of the first buffer chamber BC1 is required. To this end, a low-temperature gas enough to assimilate the temperature of the passageway is additionally injected into the first buffer chamber BC1. The door of the first buffer chamber BC1 is slightly opened to the first stage and the low temperature gas further injected into the first buffer chamber BC1 is supplied to the passage opened by the breaker 691 at a necessary low temperature -40 In some cases, a temperature slightly lower than -40 ° C). In other words, the passage opened by the breaker 691 is blocked by the cold air moving at a high speed corresponding to the low temperature gas additionally injected into the first chamber BC1 through the slightly opened opening, It is quickly assimilated into the internal temperature. Of course, at this time, the door of the movable chamber 610 remains closed.

The door of the first buffer chamber BC1 is completely opened to the second stage and the door of the first buffer chamber BC1 is sufficiently opened to assimilate the internal temperature of the transfer chamber 610 The low-temperature gas is additionally supplied to the first buffer chamber BC1. After a sufficient amount of the low-temperature gas is injected, the door of the transfer chamber 610 is opened and the inside of the transfer chamber 610 also starts to be assimilated into the internal temperature of the buffer chamber BC1. Of course, at this time, the internal temperature of the transfer chamber 610 is also sensed. Also, due to the convection phenomenon caused by the difference in air pressure and the temperature difference, the inside of the moving chamber 610 quickly falls to a necessary low temperature. Here too, the door of the mobile chamber 610 can be opened with two or more steps. Here, the door of the first buffer chamber BC1 may be completely opened after the temperature of the inside of the transfer chamber 610 is first assimilated to the required low temperature in a state in which the door of the first buffer chamber BC1 is slightly opened. Depending on the implementation, the door of the mobile chamber 610 may be implemented to be fully open at the first stage.

When the inside of the transfer chamber 610 is moved to a necessary low temperature, the test tray TT is moved from the first buffer chamber BC1 to the transfer chamber 610. [

That is, according to this example, before the test tray TT is moved to the inside of the moving chamber 610 from inside the first buffer chamber BC1, the first buffer chamber BC1 and the moving chamber 610, The thermal state inside the first buffer chamber BC1 is quickly transferred to the inside of the transfer chamber 610 through the closed passage formed by the first transfer chamber 691 so that the temperature inside the transfer chamber 610 is lowered to the first buffer chamber BC1).

When the internal temperature of the moving chamber 610 is equalized to the internal temperature of the first buffer chamber BC1, it is not necessary to configure a separate cooler or a blower fan in the moving chamber 610. In this example, it is preferable to apply the same temperature control method as the temperature control method in the first buffer chamber BC1 and the transfer chamber 610 between the test chambers 641 to 648 and the transfer chamber 610 . Of course, if this example is followed, the heat insulation of the mobile chamber 610 may be realized to be further strengthened.

For example, in the above example, the low temperature gas (for example, LN2 gas) is injected for cooling. However, by supplying cool air by a cooling system using a separate compressor and an evaporator, the inside of the first buffer chamber BC1 Cooling can also be considered sufficiently.

Furthermore, although the above temperature control example is taken as an example of a low temperature test, it can be applied equally to a high temperature test.

Although the present invention has been fully described by way of example only with reference to the accompanying drawings, it is to be understood that the present invention is not limited thereto. It is to be understood that the scope of the present invention is to be construed as being limited only by the following claims and their equivalents.

200: Handler
210: moving chamber
211: first chamber portion 212: second chamber portion
220: Lift
230: conveyor
241 to 248: Test chamber
251 to 258: connector
261a, 261b:
262a, 262b:
271: Loading machine
272: Unloading machine
291, 292: Circuit breaker

Claims (12)

A movable chamber capable of accommodating a test tray on which electronic parts are loaded and moving in a predetermined movement path;
A conveyor for conveying the moving chamber on the moving path;
A test window provided on at least one side of the movement path for receiving a test tray from the movement chamber or for supplying a test tray to the movement chamber and for electrically testing the electronic parts mounted on the test tray, A connector for electrically connecting or disconnecting the electronic component to the tester; And
At least one mobile device for moving a test tray between the mobile chamber and the connector; Containing
Handler for testing electronic components. The method according to claim 1,
Wherein the at least one mobile device is installed in the mobile chamber and moves with the mobile chamber
Handler for testing electronic components. The method according to claim 1,
The moving chamber includes:
A first chamber portion for regulating the temperature of the electronic component loaded in the test tray; And
A second chamber portion disposed in parallel with the first chamber portion in the vertical direction and for returning the temperature of the electronic component loaded in the test tray to room temperature; / RTI &gt;
Wherein the first chamber portion and the second chamber portion are separated from each other by a mutual separation wall
Handler for testing electronic components. The method of claim 3,
Wherein the first chamber portion includes an opening / closing door for opening / closing a first moving hole for receiving a test tray in a loading position or for sending a test tray to the connector,
The second chamber portion having a second moving hole for sending a test tray to an unloading position or for receiving a test tray coming from the connector,
The inside of the second chamber portion is communicated with the outside through the second moving hole
Handler for testing electronic components. The method of claim 3,
An elevator for lifting the movable chamber to a position where the test tray can be sent from the first chamber portion to the connector or a position where the second chamber portion can receive the test tray from the connector; Further comprising
Handler for testing electronic components. The method according to claim 1,
The test window includes a plurality of test windows,
The connector may be provided for each of the plurality of test windows
Handler for testing electronic components. The method according to claim 6,
A plurality of test chambers for accommodating the test trays coming from the mobile chamber and provided at each test window side to maintain a test temperature condition of the electronic components; Further comprising:
Wherein the moving chamber and the test chamber have a one-to-
Handler for testing electronic components. The method according to claim 6,
The plurality of connectors are arranged on both sides of the movement path
Handler for testing electronic components. The method according to claim 1,
A test chamber for receiving a test tray from the mobile chamber and maintaining the temperature of the electronic components loaded in the received test tray at a test temperature condition; And
A circuit breaker for blocking electronic components of the test tray on the path from the mobile chamber to the test chamber to outside air; Further comprising
Handler for testing electronic components. The method according to claim 1,
A first buffer chamber in which a test tray on which an electronic component to be tested is loaded, waits before moving to the transfer chamber; And
A second buffer chamber for receiving and waiting the test tray on which the tested electronic components coming from the mobile chamber are loaded; Further comprising:
The first buffer chamber and the second buffer chamber are fixedly provided.
Handler for testing electronic components. 11. The method of claim 10,
The thermal state inside the first buffer chamber through the closed passage formed between the first buffer chamber and the transfer chamber is shifted from the first transfer chamber to the transfer chamber before the test tray moves into the transfer chamber inside the first buffer chamber, Is transferred to the interior of the chamber so that the temperature inside the transfer chamber is assimilated to the temperature inside the first buffer chamber
Handler for testing electronic components. An accommodating chamber capable of accommodating a test tray on which electronic parts are loaded;
An electronic component is electrically connected to a tester coupled to a test window so as to be able to receive a test tray from the accommodating chamber or to give a test tray to the accommodating chamber, A connector provided on one side of the accommodating chamber for connecting or disconnecting the connector; And
A plurality of mobile devices for moving a test tray between the accommodating chamber and the connector; / RTI &gt;
Wherein the accommodating chamber includes:
A first chamber portion for regulating the temperature of the electronic component loaded in the test tray; And
A second chamber part which is integrally coupled to the first chamber part and is arranged side by side and whose inside is separated by the first chamber part and the separating wall and which returns the temperature of the electronic part loaded on the test tray to room temperature; / RTI &gt;
Wherein a portion of the plurality of mobile devices moves the test tray from the first chamber portion to the connector and another portion moves the test tray from the connector to the second chamber portion,
The first chamber portion and the second chamber portion are arranged side by side in the vertical direction
Handler for testing electronic components.

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