KR20160078227A - Cutting apparatus and cutting method - Google Patents
Cutting apparatus and cutting method Download PDFInfo
- Publication number
- KR20160078227A KR20160078227A KR1020150153623A KR20150153623A KR20160078227A KR 20160078227 A KR20160078227 A KR 20160078227A KR 1020150153623 A KR1020150153623 A KR 1020150153623A KR 20150153623 A KR20150153623 A KR 20150153623A KR 20160078227 A KR20160078227 A KR 20160078227A
- Authority
- KR
- South Korea
- Prior art keywords
- cutting
- rotary blade
- displacement
- amount
- displacement sensor
- Prior art date
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/799—Apparatus for disconnecting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/98—Methods for disconnecting semiconductor or solid-state bodies
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/7999—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto for disconnecting
Abstract
In the cutting apparatus according to the present invention, the displacement amount in the axial direction and the displacement amount in the radial direction of the rotary blade are measured using one displacement sensor.
In the cutting apparatus according to the present invention, the spindle 1 is provided with the flange 6 having the tapered portion 5 for holding the rotary blade 4 sandwiched therebetween. A displacement sensor 7 is provided at a position facing the tapered portion 5 of the flange 6 in the spindle body 2. [ The amount of displacement in the axial direction and the amount of displacement in the radial direction can be measured by measuring the distance from the distal end of the displacement sensor 7 to the tapered portion 5 of the flange 6. [ The displacement amount of the rotary shaft 3 expanded and contracted by the thermal expansion can be corrected and the position of the center line of the rotary blade 4 can be precisely adjusted to the position of the cutting line of the sealed substrate. The magnitude of the amplitude of the vibration of the rotary blade 4 can be grasped by grasping the vibration of the rotary blade 4 as the amount of displacement in which the distance from the distal end of the displacement sensor 7 to the tapered portion 5 is displaced.
Description
BACKGROUND OF THE
A substrate made of a printed board or a lead frame is virtually divided into a plurality of regions in a lattice shape and a chip type element (for example, a semiconductor chip) is mounted on each region, and then the entire substrate is resin- . The finished substrate is cut off by a cutting mechanism using a rotating blade or the like, and the product is divided into individual areas.
BACKGROUND ART Conventionally, in a cutting apparatus, a predetermined region of a sealed substrate is cut by a cutting means such as a rotary blade by using a cutting mechanism. First, the sealed substrate is placed on the cutting table and adsorbed. Next, the sealed substrate is aligned (aligned). By alignment, the position of a virtual cut line dividing a plurality of regions is set. Next, the cutting table on which the sealed substrate is sucked and the cutting mechanism are relatively moved. The cutting water is sprayed onto the cut portion of the substrate that has been completely sealed, and the seal-completed substrate is cut along the cut line set on the seal-completed substrate by the cutting mechanism. By cutting the encapsulated substrate, the individualized product is produced.
In the cutting mechanism, the rotary blade and the motor are connected via a rotary shaft. The rotating blade is rotated at a high speed by the motor to cut the sealed substrate. When cutting of the sealed substrate is repeated using the cutting mechanism, the rotating shaft rotates at a high speed to generate heat. By heat generation, the rotary shaft expands thermally and extends in the direction along the rotary shaft (axial direction). When the rotary shaft is extended in the axial direction, the rotary blade attached to the tip of the rotary shaft is also displaced in the axial direction. Therefore, the position of the rotary blade in the cutting mechanism and the position of the cutting line of the sealed substrate deviate from each other. There is a fear that if the position of the rotary blade is deviated from the position of the cutting line, the finished substrate is broken, the product may be damaged or deteriorated.
Depending on the structure of the sealed substrate and the condition for cutting the sealed substrate, the cutting load at the time of cutting may be increased. When the cutting load at the time of cutting becomes large, the vibration of the rotary blade becomes large. If the vibration of the rotating blade is large, the rotating blade may be damaged, thereby deteriorating the quality of the product. Further, the wear amount of the rotary blade is increased, and the service life of the rotary blade is reduced. Therefore, in the cutting mechanism, it is important to grasp the magnitude of the amplitude of the vibration during expansion and contraction of the rotary shaft at the time of cutting, and feedback with the optimum cutting conditions.
The present invention relates to a dicing apparatus capable of simply positioning a cutting position. The dicing apparatus includes a cutter for cutting a semiconductor wafer, a microscope for confirming a cutting position of the semiconductor wafer, And a cutting position control means for controlling the cutting position by the cutter on the basis of the distance between the measuring means and the microscope and the distance measured by the measuring means " (See, for example, paragraphs [0008] of
However, the dicing apparatus disclosed in
In such an apparatus, since the optical displacement sensor 14 is used, it is easily affected by water, dirt, and the like attached to the blade 11. Therefore, there is a possibility that an error occurs in the measurement of the distance D 2 from the optical displacement sensor 14 to the blade 11. Further, since the means for measuring the vibration in the radial direction (radial direction) of the blade 11 being cut is not provided, it can not be judged whether or not the cutting is performed efficiently.
The present invention solves the above-mentioned problems, and it is an object of the present invention to provide a cutting apparatus which is provided with a measuring unit facing a predetermined area of a fixing member (for example, a flange) for fixing a rotary blade, And it is an object of the present invention to provide a cutting apparatus and a cutting method which can measure a displacement amount of a cutting position and grasp the cutting efficiency.
In order to solve the above problems, a cutting apparatus according to the present invention comprises:
A table on which the object to be cut is placed; a cutting mechanism for cutting the object to be cut; and a moving mechanism for relatively moving the table and the cutting mechanism, wherein the object to be cut is cut along the cutting line As a cutting apparatus to be used at the time of cutting,
A rotating shaft provided in the cutting mechanism,
A rotary blade attached to a distal end of the rotary shaft,
Two fixing members respectively provided on both side surfaces of the rotary blade for fixing the rotary blade therebetween,
And measurement means provided in the cutting mechanism with a predetermined region of the fixing member facing the predetermined region,
The displacement amount of the rotary blade displaced is measured by detecting the displacement of the fixing member in the predetermined region by the measuring means,
The amount of displacement includes a first amount of displacement caused by the displacement of the rotary blade along the axial direction of the rotary shaft and a second amount of displacement caused by the displacement of the rotary blade along the radial direction of the rotary shaft do.
In the cutting apparatus according to the present invention, the relative positional relationship between the rotary blade and the workpiece is corrected based on the first amount of displacement, whereby the position of the rotary blade and the position of the cutting line are matched.
In the cutting apparatus according to the present invention, the characteristic relating to the vibration of the rotary blade is measured based on the second displacement amount.
Further, in the cutting apparatus according to the present invention, the predetermined region has a tapered portion formed so that the thickness on the center side and the thickness on the peripheral side are different from each other.
Further, in the cutting apparatus according to the present invention, the predetermined region includes an end portion formed perpendicular to the surface of the rotary blade at the outer peripheral portion of the fixing member.
In the cutting apparatus according to the present invention, the predetermined region is made of a material having conductivity.
Further, in the cutting apparatus according to the present invention, the measuring means includes an eddy current type displacement sensor.
Further, in the cutting apparatus according to the present invention, the object to be cut is a sealed substrate.
Further, in the cutting apparatus according to the present invention, there is an aspect in which the to-be-cut object is a substrate in which a functional element corresponding to each of a plurality of regions is formed.
Means for Solving the Problems In order to solve the above problems,
A step of disposing a blank to be cut on a table, a step of relatively moving the cutting tool having a rotary blade and the table, and a step of relatively moving the cutting mechanism and the table, A cutting method comprising cutting along a cutting line,
A step of rotating the rotary blade fixed to the tip of a rotary shaft provided in the cutting mechanism by two fixing members provided on both side surfaces of the rotary blade,
A step of opposing the measuring means provided in the cutting mechanism to a predetermined region of the fixing member,
And measuring the amount of displacement of the rotary blade by detecting the displacement of the fixing member in the predetermined area,
Wherein the step of measuring the amount of displacement comprises:
Measuring a first amount of displacement due to displacement of the rotary blade along an axial direction of the rotary shaft;
And measuring a second displacement amount caused by the displacement of the rotary blade along the radial direction of the rotary shaft.
The cutting method according to the present invention includes a step of adjusting the position of the rotary blade and the position of the cutting line by correcting the relative positional relationship between the rotary blade and the workpiece to be cut based on the first amount of displacement .
The cutting method according to the present invention includes a step of measuring a characteristic relating to the amplitude of vibration of the rotary blades based on the second amount of displacement.
Further, in the cutting method according to the present invention, the predetermined region has a tapered portion formed so that the thickness on the center side and the thickness on the peripheral side are different from each other.
Further, in the cutting method according to the present invention, the predetermined region includes an end portion formed perpendicularly to the surface of the rotary blade at the outer peripheral portion of the fixing member.
Further, in the cutting method according to the present invention, the predetermined region is made of a conductive material.
Further, in the cutting method according to the present invention, the measuring means includes an eddy current type displacement sensor.
Further, in the cutting method according to the present invention, the object to be cut is a sealed substrate.
Further, in the cutting method according to the present invention, there is an aspect in which the object to be cut is a substrate in which a functional element corresponding to each of a plurality of regions is formed.
According to the present invention, there is provided a cutting apparatus comprising a table on which a workpiece is placed, a cutting mechanism for cutting the workpiece, and a moving mechanism for relatively moving the table and the cutting mechanism. The cutting mechanism is provided with two fixing members for fixing the rotary blade on both sides of the rotary blade and the rotary blade attached to the tip of the rotary shaft. The measuring device is provided on the cutting mechanism so as to face a predetermined area of the fixing member. The first displacement amount at which the rotary blade is displaced along the axial direction and the second displacement amount at which the rotary blade is displaced along the radial direction can be measured by detecting the displacement in the predetermined region of the fixing member. Therefore, it is possible to measure both the amount of displacement in the axial direction and the amount of displacement in the radial direction by using one measurement means.
Figs. 1 (a) to 1 (c) are schematic views respectively showing a configuration of a spindle and displacement of a rotary blade in
Fig. 2 (a) to Fig. 2 (c) are schematic views each showing a state in which the rotary blade shown in Fig. 1 moves up and down, (C) is a schematic view showing a state in which the rotary blade has moved to the lowermost part.
3 is a schematic view showing a configuration of an eddy current type displacement sensor used in the present embodiment.
4 is a correlation diagram showing the relationship between the distance measured by the eddy current type displacement sensor and the output voltage versus time.
5A and 5B are schematic views each showing a mounting position of a displacement sensor according to a second embodiment of the cutting apparatus according to the present invention, wherein (a) shows the case where the displacement sensor is attached in the horizontal direction ( b) is a schematic view showing the case where the displacement sensor is attached in the vertical direction.
Fig. 6 is a plan view showing the outline of a cutting apparatus in
As shown in Fig. 1, in the cutting apparatus, a
(Example 1)
1 (a), a
The
The distance from the tip end of the
The sealed substrate is cut by a
As shown in Fig. 1 (c), the
The position of the tapered
With reference to Fig. 2, a state in which the
2B, the distance from the tip of the
The distance from the tip of the
As the
The configuration and operation of the eddy current type displacement sensor used as the
A method of measuring the distance from the tip end of the
The change in the impedance of the
A method of determining the magnitude of the amplitude of the vibration of the
(= D2-d1) of the distance from the amplitude 15 (= V2-V1) of the voltage waveform to the
According to the present embodiment, in the cutting apparatus, the
According to the present embodiment, the tapered
According to the present embodiment, by providing the tapered
In the present embodiment, the displacement sensor 10 is provided at a position facing the tapered
(Example 2)
As shown in Fig. 5 (a), the outer peripheral end 16c (the left end of the uppermost position in the figure) of the flange 16a closer to the spindle
Fig. 5B is a modification of Fig. 5A, in which the attachment position of the
5 (a) and 5 (b), the
According to the present embodiment, in the cutting apparatus, the
The amount of displacement of the
The cycle of the vibration of the
(Example 3)
The substrate supply unit (A) is provided with a substrate supply mechanism (19). The sealed
The cutting
The substrate cutting unit B is provided with a
An inspection table (24) is provided in the inspection unit (C). In the inspection table 24, an assembly made up of a plurality of individual products P cut from the encapsulated
In the present embodiment, the cutting
In each of the embodiments, a washer-type rotary blade having a donut shape (toroidal shape) is used as the
In the description so far, the case where the encapsulated
The present invention is not limited to the above-described embodiments, and can be arbitrarily and suitably combined, modified, or selected as necessary within the scope of the present invention.
1: spindle (cutting mechanism) 2: spindle body
3: rotating shaft 4: rotating blade
5: tapered portion (predetermined region) 6: flange (fixing member)
7: Displacement sensor (measuring means) 8: Sensor coil
9: sensor part 10: converter
11: coaxial cable 12: high frequency magnetic field
13: Eddy current 14: Output characteristics
15: Amplitude of the voltage waveform 16a, 16b: Flange (fixing member)
16c, 16d, 16e, 16f: outer circumferential end (predetermined region)
17: Attachment plate 17a: Portion corresponding to vertical bar
17b: a portion corresponding to a cross bar 18: a cutting device
19: substrate feed mechanism 20: sealed substrate (cut material)
21: cutting table (table) 22: moving mechanism
23: rotation mechanism 24: inspection table
25: cut-off substrate 26: tray
d0, dX, d1, d2: Measuring distance from the tip of the displacement sensor to the tapered part
L0, LX: Distance from the front end of the spindle body to the center line in the thickness direction of the rotary blade
α: fixed value V1, V2, V3: output voltage
A: substrate supply unit B: substrate cutting unit
C: Inspection unit CTL:
P: Products
Claims (18)
A rotating shaft provided in the cutting mechanism,
A rotary blade attached to a distal end of the rotary shaft,
Two fixing members respectively provided on both side surfaces of the rotary blade for fixing the rotary blade therebetween,
And a measuring unit provided in the cutting mechanism so as to face a predetermined region of the fixing member
And,
The displacement amount of the rotary blade displaced is measured by detecting the displacement of the fixed member in the predetermined region by the measuring means,
The amount of displacement,
A first displacement amount caused by the displacement of the rotary blade along the axial direction of the rotary shaft,
And a second displacement amount caused by the displacement of the rotary blade along the radial direction of the rotary shaft.
A step of rotating the rotary blade fixed to the tip of the rotary shaft provided on the cutting mechanism by two fixing members provided on both side surfaces of the rotary blade;
A step of opposing measurement means provided in the cutting mechanism to a predetermined region of the fixing member,
A step of measuring the amount of displacement of the rotary blade by detecting the displacement of the fixing member in the predetermined region by the measuring means
Wherein the step of measuring the amount of displacement comprises:
Measuring a first amount of displacement due to displacement of the rotary blade along an axial direction of the rotary shaft;
And measuring a second displacement amount caused by the displacement of the rotary blade along the radial direction of the rotary shaft.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2014259909A JP6235453B2 (en) | 2014-12-24 | 2014-12-24 | Cutting apparatus and cutting method |
JPJP-P-2014-259909 | 2014-12-24 |
Publications (2)
Publication Number | Publication Date |
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KR20160078227A true KR20160078227A (en) | 2016-07-04 |
KR101749422B1 KR101749422B1 (en) | 2017-06-20 |
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KR1020150153623A KR101749422B1 (en) | 2014-12-24 | 2015-11-03 | Cutting apparatus and cutting method |
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JP (1) | JP6235453B2 (en) |
KR (1) | KR101749422B1 (en) |
CN (1) | CN105742245B (en) |
TW (1) | TWI602641B (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JP6846657B2 (en) * | 2017-01-20 | 2021-03-24 | 株式会社ディスコ | Cutting equipment |
JP7051205B2 (en) * | 2017-12-27 | 2022-04-11 | 株式会社ディスコ | Cutting equipment |
TWI690385B (en) * | 2019-06-28 | 2020-04-11 | 鼎朋企業股份有限公司 | Grinding machine tool with random eccentric orbit motion speed detection |
KR102279726B1 (en) * | 2019-09-26 | 2021-07-20 | 한국광기술원 | Wafer Lens Array Dicing Apparatus Including Dicing Blade for Cutting Wafer Lens Array and Method Using the Same |
JP7394712B2 (en) * | 2020-06-24 | 2023-12-08 | Towa株式会社 | Cutting device and method for manufacturing cut products |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06310596A (en) | 1993-04-23 | 1994-11-04 | Seiko Seiki Co Ltd | Dicing apparatus |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
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JP3049464B2 (en) * | 1993-11-26 | 2000-06-05 | セイコー精機株式会社 | Dicing equipment |
SG118084A1 (en) * | 2001-08-24 | 2006-01-27 | Micron Technology Inc | Method and apparatus for cutting semiconductor wafers |
JP2003203885A (en) * | 2002-01-08 | 2003-07-18 | Disco Abrasive Syst Ltd | Process machine |
JP4559094B2 (en) * | 2004-02-16 | 2010-10-06 | 株式会社ディスコ | Cutting blade mounting device, cutting device |
ITMI20041269A1 (en) * | 2004-06-24 | 2004-09-24 | Paper Converting Machine Co | CUTTING BLADE CONTROL SYSTEM PARTICULARLY FOR CUTTING MACHINES FOR LOG CUTTING OF SHEET MATERIAL |
JP4549818B2 (en) * | 2004-11-10 | 2010-09-22 | 株式会社ディスコ | Amplitude measurement method |
JP4311686B2 (en) * | 2006-09-27 | 2009-08-12 | 日立ビアメカニクス株式会社 | Method for processing printed circuit boards |
JP2009206362A (en) * | 2008-02-28 | 2009-09-10 | Disco Abrasive Syst Ltd | Method of cutting plate-like material |
JP5248250B2 (en) * | 2008-09-26 | 2013-07-31 | 株式会社ディスコ | Cutting device and method for adjusting rotational balance of cutting blade |
CN202278449U (en) * | 2011-08-16 | 2012-06-20 | 北京工业大学 | Device for testing displacement of machine tool combining part relative to tool nose point |
JP5643729B2 (en) * | 2011-09-02 | 2014-12-17 | Towa株式会社 | Spindle locking device in air spindle unit |
CN102554780A (en) * | 2012-02-17 | 2012-07-11 | 上海理工大学 | Measuring device for grinding radial run-out of metal-bonded grinding wheels |
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2014
- 2014-12-24 JP JP2014259909A patent/JP6235453B2/en active Active
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2015
- 2015-10-30 CN CN201510726801.0A patent/CN105742245B/en active Active
- 2015-11-02 TW TW104135969A patent/TWI602641B/en active
- 2015-11-03 KR KR1020150153623A patent/KR101749422B1/en active IP Right Grant
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06310596A (en) | 1993-04-23 | 1994-11-04 | Seiko Seiki Co Ltd | Dicing apparatus |
Also Published As
Publication number | Publication date |
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CN105742245A (en) | 2016-07-06 |
JP2016122673A (en) | 2016-07-07 |
CN105742245B (en) | 2018-12-07 |
TW201622879A (en) | 2016-07-01 |
TWI602641B (en) | 2017-10-21 |
KR101749422B1 (en) | 2017-06-20 |
JP6235453B2 (en) | 2017-11-22 |
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