KR20150131098A - 박막 캡슐화를 위한 n2o 희석 프로세스에 의한 배리어 막 성능의 개선 - Google Patents

박막 캡슐화를 위한 n2o 희석 프로세스에 의한 배리어 막 성능의 개선 Download PDF

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Publication number
KR20150131098A
KR20150131098A KR1020157027762A KR20157027762A KR20150131098A KR 20150131098 A KR20150131098 A KR 20150131098A KR 1020157027762 A KR1020157027762 A KR 1020157027762A KR 20157027762 A KR20157027762 A KR 20157027762A KR 20150131098 A KR20150131098 A KR 20150131098A
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layer
inorganic
oled
substrate
layers
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Korean (ko)
Inventor
영진 최
범수 박
수영 최
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어플라이드 머티어리얼스, 인코포레이티드
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    • H01L51/5253
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00Organic light-emitting devices
    • H10K50/80Constructional details
    • H10K50/84Passivation; Containers; Encapsulations
    • H10K50/844Encapsulations
    • H10K50/8445Encapsulations multilayered coatings having a repetitive structure, e.g. having multiple organic-inorganic bilayers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00Organic light-emitting devices
    • H10K50/80Constructional details
    • H10K50/84Passivation; Containers; Encapsulations
    • H01L51/0002
    • H01L51/5237
    • H01L51/56
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01Manufacture or treatment
    • H10H20/011Manufacture or treatment of bodies, e.g. forming semiconductor layers
    • H10H20/013Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
    • H10H20/0137Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials the light-emitting regions comprising nitride materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/84Coatings, e.g. passivation layers or antireflective coatings
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/85Packages
    • H10H20/852Encapsulations
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/85Packages
    • H10H20/852Encapsulations
    • H10H20/854Encapsulations characterised by their material, e.g. epoxy or silicone resins
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00Organic light-emitting devices
    • H10K50/80Constructional details
    • H10K50/84Passivation; Containers; Encapsulations
    • H10K50/844Encapsulations
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/12Passive devices, e.g. 2 terminal devices
    • H01L2924/1204Optical Diode
    • H01L2924/12044OLED
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/80Constructional details
    • H10K59/87Passivation; Containers; Encapsulations
    • H10K59/873Encapsulations
    • H10K59/8731Encapsulations multilayered coatings having a repetitive structure, e.g. having multiple organic-inorganic bilayers

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroluminescent Light Sources (AREA)
  • Chemical Vapour Deposition (AREA)
KR1020157027762A 2013-03-12 2014-03-10 박막 캡슐화를 위한 n2o 희석 프로세스에 의한 배리어 막 성능의 개선 Ceased KR20150131098A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361778067P 2013-03-12 2013-03-12
US61/778,067 2013-03-12
PCT/US2014/022498 WO2014164465A1 (en) 2013-03-12 2014-03-10 Improvement of barrier film performance with n2o dilution process for thin film encapsulation

Related Child Applications (1)

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KR1020177032410A Division KR102057176B1 (ko) 2013-03-12 2014-03-10 박막 캡슐화를 위한 n2o 희석 프로세스에 의한 배리어 막 성능의 개선

Publications (1)

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KR20150131098A true KR20150131098A (ko) 2015-11-24

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KR1020157027762A Ceased KR20150131098A (ko) 2013-03-12 2014-03-10 박막 캡슐화를 위한 n2o 희석 프로세스에 의한 배리어 막 성능의 개선
KR1020177032410A Active KR102057176B1 (ko) 2013-03-12 2014-03-10 박막 캡슐화를 위한 n2o 희석 프로세스에 의한 배리어 막 성능의 개선

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US (1) US9269923B2 (enExample)
JP (1) JP6312791B2 (enExample)
KR (2) KR20150131098A (enExample)
CN (1) CN105190932A (enExample)
TW (1) TWI578592B (enExample)
WO (1) WO2014164465A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20210102992A (ko) * 2019-01-15 2021-08-20 어플라이드 머티어리얼스, 인코포레이티드 Hmdso 열적 안정성을 위한 방법들

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CN108305954B (zh) * 2018-01-24 2020-07-31 武汉华星光电半导体显示技术有限公司 Oled器件的薄膜封装方法及oled器件
GB201806865D0 (en) 2018-04-26 2018-06-13 Spts Technologies Ltd Method of depositing a SiN film
KR102766447B1 (ko) * 2019-04-25 2025-02-10 어플라이드 머티어리얼스, 인코포레이티드 낮은 굴절률 및 낮은 수증기 투과율을 갖는 수분 배리어 막
CN113053941B (zh) * 2019-12-27 2025-05-27 中芯国际集成电路制造(上海)有限公司 半导体结构及其形成方法
KR102741002B1 (ko) 2020-04-29 2024-12-12 삼성디스플레이 주식회사 유기발광 디스플레이 장치 및 그 제조방법
US11508590B2 (en) 2021-04-15 2022-11-22 Jnk Tech Substrate inspection system and method of use thereof
US11987884B2 (en) 2021-04-15 2024-05-21 Jnk Tech Glass and wafer inspection system and a method of use thereof
CN115623811A (zh) * 2022-11-10 2023-01-17 中山大学 一种柔性oled面板的封装方法及封装结构

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Publication number Priority date Publication date Assignee Title
KR20210102992A (ko) * 2019-01-15 2021-08-20 어플라이드 머티어리얼스, 인코포레이티드 Hmdso 열적 안정성을 위한 방법들

Also Published As

Publication number Publication date
TW201503444A (zh) 2015-01-16
JP6312791B2 (ja) 2018-04-18
US9269923B2 (en) 2016-02-23
US20140264296A1 (en) 2014-09-18
JP2016512651A (ja) 2016-04-28
KR20170126519A (ko) 2017-11-17
WO2014164465A1 (en) 2014-10-09
CN105190932A (zh) 2015-12-23
TWI578592B (zh) 2017-04-11
KR102057176B1 (ko) 2019-12-18

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