KR20110055586A - 템플레이트 및 리소그래피용 고종횡비 템플레이트의 제조방법과 나노스케일로 기판을 천공하기 위한 템플레이트의 용도 - Google Patents

템플레이트 및 리소그래피용 고종횡비 템플레이트의 제조방법과 나노스케일로 기판을 천공하기 위한 템플레이트의 용도 Download PDF

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Publication number
KR20110055586A
KR20110055586A KR20117004711A KR20117004711A KR20110055586A KR 20110055586 A KR20110055586 A KR 20110055586A KR 20117004711 A KR20117004711 A KR 20117004711A KR 20117004711 A KR20117004711 A KR 20117004711A KR 20110055586 A KR20110055586 A KR 20110055586A
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KR
South Korea
Prior art keywords
template
nanostructure
base plate
lithographic
aspect ratio
Prior art date
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Ceased
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KR20117004711A
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English (en)
Korean (ko)
Inventor
아민 살림 무하마드
다비드 브루드
요나스 베리
모하마드 샤피쿨 카비르
뱅상 디마리
Original Assignee
스몰텍 에이비
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Publication of KR20110055586A publication Critical patent/KR20110055586A/ko
Ceased legal-status Critical Current

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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/002Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor using materials containing microcapsules; Preparing or processing such materials, e.g. by pressure; Devices or apparatus specially designed therefor
    • G03F7/0022Devices or apparatus
    • G03F7/0027Devices or apparatus characterised by pressure means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/0271Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
    • H01L21/0273Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
    • H01L21/0274Photolithographic processes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/902Specified use of nanostructure
    • Y10S977/932Specified use of nanostructure for electronic or optoelectronic application

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • General Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Shaping Of Tube Ends By Bending Or Straightening (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)
  • Manufacture Or Reproduction Of Printing Formes (AREA)
  • Catalysts (AREA)
KR20117004711A 2008-08-05 2009-07-23 템플레이트 및 리소그래피용 고종횡비 템플레이트의 제조방법과 나노스케일로 기판을 천공하기 위한 템플레이트의 용도 Ceased KR20110055586A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE0801770 2008-08-05
SE0801770-9 2008-08-05

Publications (1)

Publication Number Publication Date
KR20110055586A true KR20110055586A (ko) 2011-05-25

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KR20117004711A Ceased KR20110055586A (ko) 2008-08-05 2009-07-23 템플레이트 및 리소그래피용 고종횡비 템플레이트의 제조방법과 나노스케일로 기판을 천공하기 위한 템플레이트의 용도

Country Status (7)

Country Link
US (1) US9028242B2 (enExample)
EP (1) EP2307928A2 (enExample)
JP (1) JP5405574B2 (enExample)
KR (1) KR20110055586A (enExample)
CN (1) CN102119363B (enExample)
MY (1) MY153444A (enExample)
WO (1) WO2010015333A2 (enExample)

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KR102267904B1 (ko) * 2020-04-01 2021-06-22 한국기계연구원 유리전이온도를 이용한 미세구조체 전사방법 및 이를 이용하여 제작된 미세구조체 소자

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CN107175939B (zh) * 2016-03-09 2020-02-28 华邦电子股份有限公司 用于印刷线路制程的印章及其制造方法以及印刷线路制程
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Also Published As

Publication number Publication date
JP5405574B2 (ja) 2014-02-05
CN102119363B (zh) 2015-10-21
WO2010015333A2 (en) 2010-02-11
US20110195141A1 (en) 2011-08-11
EP2307928A2 (en) 2011-04-13
JP2011530803A (ja) 2011-12-22
CN102119363A (zh) 2011-07-06
US9028242B2 (en) 2015-05-12
WO2010015333A3 (en) 2010-05-27
MY153444A (en) 2015-02-13

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