KR20110038133A - 감소된 암전류를 갖는 후방 조명되는 이미지 센서 - Google Patents
감소된 암전류를 갖는 후방 조명되는 이미지 센서 Download PDFInfo
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- KR20110038133A KR20110038133A KR1020117003051A KR20117003051A KR20110038133A KR 20110038133 A KR20110038133 A KR 20110038133A KR 1020117003051 A KR1020117003051 A KR 1020117003051A KR 20117003051 A KR20117003051 A KR 20117003051A KR 20110038133 A KR20110038133 A KR 20110038133A
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Images
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/201—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates the substrates comprising an insulating layer on a semiconductor body, e.g. SOI
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/199—Back-illuminated image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
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- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/169,723 | 2008-07-09 | ||
| US12/169,723 US7915067B2 (en) | 2008-07-09 | 2008-07-09 | Backside illuminated image sensor with reduced dark current |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20110038133A true KR20110038133A (ko) | 2011-04-13 |
Family
ID=41061247
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020117003051A Ceased KR20110038133A (ko) | 2008-07-09 | 2009-06-25 | 감소된 암전류를 갖는 후방 조명되는 이미지 센서 |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US7915067B2 (enExample) |
| EP (1) | EP2304796A1 (enExample) |
| JP (1) | JP2011527827A (enExample) |
| KR (1) | KR20110038133A (enExample) |
| CN (1) | CN102077350A (enExample) |
| TW (1) | TW201010070A (enExample) |
| WO (1) | WO2010005490A1 (enExample) |
Families Citing this family (23)
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| US7916362B2 (en) * | 2006-05-22 | 2011-03-29 | Eastman Kodak Company | Image sensor with improved light sensitivity |
| US8031258B2 (en) | 2006-10-04 | 2011-10-04 | Omnivision Technologies, Inc. | Providing multiple video signals from single sensor |
| US8896712B2 (en) * | 2007-07-20 | 2014-11-25 | Omnivision Technologies, Inc. | Determining and correcting for imaging device motion during an exposure |
| US8350952B2 (en) * | 2008-06-04 | 2013-01-08 | Omnivision Technologies, Inc. | Image sensors with improved angle response |
| US7859033B2 (en) | 2008-07-09 | 2010-12-28 | Eastman Kodak Company | Wafer level processing for backside illuminated sensors |
| US7915067B2 (en) * | 2008-07-09 | 2011-03-29 | Eastman Kodak Company | Backside illuminated image sensor with reduced dark current |
| US8224082B2 (en) * | 2009-03-10 | 2012-07-17 | Omnivision Technologies, Inc. | CFA image with synthetic panchromatic image |
| US8068153B2 (en) * | 2009-03-27 | 2011-11-29 | Omnivision Technologies, Inc. | Producing full-color image using CFA image |
| US8045024B2 (en) * | 2009-04-15 | 2011-10-25 | Omnivision Technologies, Inc. | Producing full-color image with reduced motion blur |
| US8203633B2 (en) * | 2009-05-27 | 2012-06-19 | Omnivision Technologies, Inc. | Four-channel color filter array pattern |
| US8237831B2 (en) * | 2009-05-28 | 2012-08-07 | Omnivision Technologies, Inc. | Four-channel color filter array interpolation |
| US8125546B2 (en) * | 2009-06-05 | 2012-02-28 | Omnivision Technologies, Inc. | Color filter array pattern having four-channels |
| US8253832B2 (en) * | 2009-06-09 | 2012-08-28 | Omnivision Technologies, Inc. | Interpolation for four-channel color filter array |
| US8999798B2 (en) * | 2009-12-17 | 2015-04-07 | Applied Materials, Inc. | Methods for forming NMOS EPI layers |
| JP5870478B2 (ja) * | 2010-09-30 | 2016-03-01 | 富士通セミコンダクター株式会社 | 半導体装置の製造方法 |
| CN102299164A (zh) * | 2011-09-13 | 2011-12-28 | 上海中科高等研究院 | 图像传感器及其制造方法 |
| US8760543B2 (en) | 2011-09-26 | 2014-06-24 | Truesense Imaging, Inc. | Dark reference in CCD image sensors |
| US9099389B2 (en) * | 2012-02-10 | 2015-08-04 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and apparatus for reducing stripe patterns |
| JP2014022448A (ja) * | 2012-07-13 | 2014-02-03 | Toshiba Corp | 固体撮像装置 |
| WO2014164926A1 (en) * | 2013-03-11 | 2014-10-09 | The Regents Of The University Of California | Portable transcutaneous magnetic stimulator and systems and methods of use thereof |
| CN117293156B (zh) * | 2023-11-27 | 2024-02-20 | 合肥晶合集成电路股份有限公司 | 深沟槽的制备方法及图像传感器 |
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| JP4888261B2 (ja) * | 2007-07-12 | 2012-02-29 | セイコーエプソン株式会社 | 光源装置、画像表示装置及びモニタ装置 |
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| US7855740B2 (en) * | 2007-07-20 | 2010-12-21 | Eastman Kodak Company | Multiple component readout of image sensor |
| CN101408677B (zh) * | 2007-10-11 | 2011-07-27 | 鸿富锦精密工业(深圳)有限公司 | 立体投影光学系统 |
| US7871165B2 (en) * | 2007-11-30 | 2011-01-18 | Eastman Kodak Company | Stereo projection apparatus using polarized solid state light sources |
| JP5213670B2 (ja) * | 2008-01-16 | 2013-06-19 | 三洋電機株式会社 | 撮像装置及びぶれ補正方法 |
| WO2009105120A1 (en) * | 2008-02-19 | 2009-08-27 | Sarnoff Corporation | Method and device for reducing crosstalk in back illuminated imagers |
| US8035711B2 (en) * | 2008-05-22 | 2011-10-11 | Panavision Imaging, Llc | Sub-pixel array optical sensor |
| US7915067B2 (en) * | 2008-07-09 | 2011-03-29 | Eastman Kodak Company | Backside illuminated image sensor with reduced dark current |
| US20100006908A1 (en) * | 2008-07-09 | 2010-01-14 | Brady Frederick T | Backside illuminated image sensor with shallow backside trench for photodiode isolation |
| US7859033B2 (en) * | 2008-07-09 | 2010-12-28 | Eastman Kodak Company | Wafer level processing for backside illuminated sensors |
| US8017426B2 (en) * | 2008-07-09 | 2011-09-13 | Omnivision Technologies, Inc. | Color filter array alignment mark formation in backside illuminated image sensors |
-
2008
- 2008-07-09 US US12/169,723 patent/US7915067B2/en active Active
-
2009
- 2009-06-25 JP JP2011517402A patent/JP2011527827A/ja active Pending
- 2009-06-25 WO PCT/US2009/003794 patent/WO2010005490A1/en not_active Ceased
- 2009-06-25 EP EP09788837A patent/EP2304796A1/en not_active Withdrawn
- 2009-06-25 CN CN2009801249042A patent/CN102077350A/zh active Pending
- 2009-06-25 KR KR1020117003051A patent/KR20110038133A/ko not_active Ceased
- 2009-07-08 TW TW098123113A patent/TW201010070A/zh unknown
-
2011
- 2011-01-25 US US13/012,843 patent/US20110115957A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| US20100006970A1 (en) | 2010-01-14 |
| JP2011527827A (ja) | 2011-11-04 |
| CN102077350A (zh) | 2011-05-25 |
| TW201010070A (en) | 2010-03-01 |
| US20110115957A1 (en) | 2011-05-19 |
| US7915067B2 (en) | 2011-03-29 |
| EP2304796A1 (en) | 2011-04-06 |
| WO2010005490A1 (en) | 2010-01-14 |
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