KR20100064361A - Cu/Mo 금속용 에칭 조성물 및 에칭 방법 - Google Patents
Cu/Mo 금속용 에칭 조성물 및 에칭 방법 Download PDFInfo
- Publication number
- KR20100064361A KR20100064361A KR1020107004302A KR20107004302A KR20100064361A KR 20100064361 A KR20100064361 A KR 20100064361A KR 1020107004302 A KR1020107004302 A KR 1020107004302A KR 20107004302 A KR20107004302 A KR 20107004302A KR 20100064361 A KR20100064361 A KR 20100064361A
- Authority
- KR
- South Korea
- Prior art keywords
- weight
- layer
- etchant composition
- composition
- acid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K13/00—Etching, surface-brightening or pickling compositions
- C09K13/04—Etching, surface-brightening or pickling compositions containing an inorganic acid
- C09K13/08—Etching, surface-brightening or pickling compositions containing an inorganic acid containing a fluorine compound
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
- C23F1/10—Etching compositions
- C23F1/14—Aqueous compositions
- C23F1/16—Acidic compositions
- C23F1/18—Acidic compositions for etching copper or alloys thereof
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
- C23F1/10—Etching compositions
- C23F1/14—Aqueous compositions
- C23F1/16—Acidic compositions
- C23F1/26—Acidic compositions for etching refractory metals
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
- H10P50/60—Wet etching
- H10P50/66—Wet etching of conductive or resistive materials
- H10P50/663—Wet etching of conductive or resistive materials by chemical means only
- H10P50/667—Wet etching of conductive or resistive materials by chemical means only by liquid etching only
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Weting (AREA)
- ing And Chemical Polishing (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW096137710 | 2007-10-08 | ||
| TW96137710A TW200916605A (en) | 2007-10-08 | 2007-10-08 | Etchant compositions and etching method for metals Cu/Mo |
| CNA2007101673174A CN101418449A (zh) | 2007-10-22 | 2007-10-22 | 用于铜/钼金属的蚀刻液组成物及蚀刻方法 |
| CN200710167317.4 | 2007-10-22 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20100064361A true KR20100064361A (ko) | 2010-06-14 |
Family
ID=40219299
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020107004302A Withdrawn KR20100064361A (ko) | 2007-10-08 | 2008-10-02 | Cu/Mo 금속용 에칭 조성물 및 에칭 방법 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20100301010A1 (https=) |
| JP (1) | JP2010537444A (https=) |
| KR (1) | KR20100064361A (https=) |
| WO (1) | WO2009047203A1 (https=) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8785935B2 (en) | 2010-12-15 | 2014-07-22 | Samsung Display Co., Ltd. | Etchant, display device and method for manufacturing display device using the same |
| KR20160001074A (ko) * | 2014-06-26 | 2016-01-06 | 동우 화인켐 주식회사 | 금속막의 식각액 조성물 및 이를 이용한 액정표시장치용 어레이 기판의 제조방법 |
| US9741827B2 (en) | 2014-04-28 | 2017-08-22 | Samsung Display Co., Ltd. | Etchant and method of manufacturing display device by using the same |
| KR20220003693A (ko) * | 2020-07-01 | 2022-01-11 | 삼성디스플레이 주식회사 | 표시 장치 및 그 제조 방법 |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102690605B (zh) | 2009-02-16 | 2015-01-21 | 日立化成株式会社 | 铜研磨用研磨剂和使用了其的研磨方法 |
| WO2010092865A1 (ja) | 2009-02-16 | 2010-08-19 | 日立化成工業株式会社 | 研磨剤及び研磨方法 |
| JP5051323B2 (ja) * | 2010-02-15 | 2012-10-17 | 三菱瓦斯化学株式会社 | 銅層及びモリブデン層を含む多層薄膜用エッチング液 |
| JP2013060634A (ja) * | 2011-09-14 | 2013-04-04 | Tosoh Corp | エッチング液 |
| KR20140013310A (ko) | 2012-07-23 | 2014-02-05 | 삼성디스플레이 주식회사 | 식각액 조성물, 및 이를 이용한 금속 배선과 박막 트랜지스터 표시판 제조 방법 |
| KR102209680B1 (ko) * | 2014-06-27 | 2021-01-29 | 동우 화인켐 주식회사 | 금속막의 식각액 조성물 및 이를 이용한 액정 표시 장치용 어레이 기판의 제조방법 |
| TWI618817B (zh) * | 2015-12-29 | 2018-03-21 | Daxin Materials Corporation | 蝕刻液組成物及應用其之蝕刻方法 |
| EP3684148B1 (en) * | 2017-09-12 | 2023-11-29 | Kabushiki Kaisha Toshiba | Method for manufacturing ceramic circuit board |
| US11492709B2 (en) * | 2020-04-14 | 2022-11-08 | Entegris, Inc. | Method and composition for etching molybdenum |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100505328B1 (ko) * | 2002-12-12 | 2005-07-29 | 엘지.필립스 엘시디 주식회사 | 구리 몰리브덴막에서 몰리브덴 잔사를 제거할 수 있는식각용액 및 그 식각 방법 |
| KR101190907B1 (ko) * | 2004-12-07 | 2012-10-12 | 가오 가부시키가이샤 | 박리제 조성물 |
| CN101233601A (zh) * | 2005-06-13 | 2008-07-30 | 高级技术材料公司 | 在金属硅化物形成后用于选择性除去金属或金属合金的组合物及方法 |
| KR101199533B1 (ko) * | 2005-06-22 | 2012-11-09 | 삼성디스플레이 주식회사 | 식각액, 이를 이용하는 배선 형성 방법 및 박막 트랜지스터기판의 제조 방법 |
| TWI378989B (en) * | 2006-09-01 | 2012-12-11 | Taiwan Tft Lcd Ass | Etchant for patterning composite layer and method of fabricating thin film transistor using the same |
| KR101326128B1 (ko) * | 2006-09-29 | 2013-11-06 | 삼성디스플레이 주식회사 | 표시 장치용 배선, 식각액, 박막 트랜지스터 표시판 및 그제조 방법 |
| WO2008121952A1 (en) * | 2007-03-31 | 2008-10-09 | Advanced Technology Materials, Inc. | Methods for stripping material for wafer reclamation |
-
2008
- 2008-10-02 US US12/675,131 patent/US20100301010A1/en not_active Abandoned
- 2008-10-02 KR KR1020107004302A patent/KR20100064361A/ko not_active Withdrawn
- 2008-10-02 WO PCT/EP2008/063221 patent/WO2009047203A1/en not_active Ceased
- 2008-10-02 JP JP2010522406A patent/JP2010537444A/ja active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8785935B2 (en) | 2010-12-15 | 2014-07-22 | Samsung Display Co., Ltd. | Etchant, display device and method for manufacturing display device using the same |
| US9111813B2 (en) | 2010-12-15 | 2015-08-18 | Samsung Display Co., Ltd. | Etchant, display device and method for manufacturing display device using the same |
| US9741827B2 (en) | 2014-04-28 | 2017-08-22 | Samsung Display Co., Ltd. | Etchant and method of manufacturing display device by using the same |
| KR20160001074A (ko) * | 2014-06-26 | 2016-01-06 | 동우 화인켐 주식회사 | 금속막의 식각액 조성물 및 이를 이용한 액정표시장치용 어레이 기판의 제조방법 |
| KR20220003693A (ko) * | 2020-07-01 | 2022-01-11 | 삼성디스플레이 주식회사 | 표시 장치 및 그 제조 방법 |
| US12225782B2 (en) | 2020-07-01 | 2025-02-11 | Samsung Display Co., Ltd. | Display apparatus and method of manufacturing the same |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2009047203A1 (en) | 2009-04-16 |
| US20100301010A1 (en) | 2010-12-02 |
| JP2010537444A (ja) | 2010-12-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| PC1203 | Withdrawal of no request for examination |
St.27 status event code: N-1-6-B10-B12-nap-PC1203 |
|
| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid | ||
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |