KR20070083501A - 검사 장치 및 검사 방법 및 검사 장치용 센서 - Google Patents

검사 장치 및 검사 방법 및 검사 장치용 센서 Download PDF

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Publication number
KR20070083501A
KR20070083501A KR1020077004264A KR20077004264A KR20070083501A KR 20070083501 A KR20070083501 A KR 20070083501A KR 1020077004264 A KR1020077004264 A KR 1020077004264A KR 20077004264 A KR20077004264 A KR 20077004264A KR 20070083501 A KR20070083501 A KR 20070083501A
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KR
South Korea
Prior art keywords
sensor
inspection
conductor
sensor plate
signal
Prior art date
Application number
KR1020077004264A
Other languages
English (en)
Korean (ko)
Inventor
야스꾸니 니시모또
신이찌 무라까미
슈우지 야마오까
쇼오고 이시오까
Original Assignee
오에이치티 가부시끼가이샤
소시오 다이아 시스템즈 가부시끼가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 오에이치티 가부시끼가이샤, 소시오 다이아 시스템즈 가부시끼가이샤 filed Critical 오에이치티 가부시끼가이샤
Publication of KR20070083501A publication Critical patent/KR20070083501A/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3622—Control of matrices with row and column drivers using a passive matrix
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/06—Passive matrix structure, i.e. with direct application of both column and row voltages to the light emitting or modulating elements, other than LCD or OLED
KR1020077004264A 2004-08-27 2005-08-25 검사 장치 및 검사 방법 및 검사 장치용 센서 KR20070083501A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004247734A JP2006064551A (ja) 2004-08-27 2004-08-27 検査装置及び検査方法並びに検査装置用センサ
JPJP-P-2004-00247734 2004-08-27

Publications (1)

Publication Number Publication Date
KR20070083501A true KR20070083501A (ko) 2007-08-24

Family

ID=35967628

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020077004264A KR20070083501A (ko) 2004-08-27 2005-08-25 검사 장치 및 검사 방법 및 검사 장치용 센서

Country Status (5)

Country Link
JP (1) JP2006064551A (ja)
KR (1) KR20070083501A (ja)
CN (1) CN101023317A (ja)
TW (1) TW200613754A (ja)
WO (1) WO2006022434A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101101848B1 (ko) * 2009-05-14 2012-01-05 니혼덴산리드가부시키가이샤 터치패널 검사장치

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20100102678A (ko) * 2008-01-17 2010-09-24 가부시키가이샤 아이에이치아이 우주 부유 물체의 검출 장치
KR101104903B1 (ko) 2009-08-24 2012-01-12 성균관대학교산학협력단 평판 디스플레이패널 검사용 프로브 유닛의 복층 접속구조 형성방법 및 이를 이용하여 형성된 복층 접속구조
WO2011105363A1 (ja) * 2010-02-23 2011-09-01 本田技研工業株式会社 接触不良測定方法及び接触不良測定装置
TWI478018B (zh) * 2011-01-21 2015-03-21 Egalax Empia Technology Inc 觸控面板感測器斷線檢測方法及裝置
JP6202452B1 (ja) * 2016-06-01 2017-09-27 オー・エイチ・ティー株式会社 非接触型基板検査装置及びその検査方法
CN108226695B (zh) * 2018-01-02 2021-10-15 京东方科技集团股份有限公司 邻近金属线短路的检测及定位装置和方法
JP7084807B2 (ja) * 2018-07-10 2022-06-15 オークマ株式会社 電磁誘導型位置センサ用のセンサ基板、および、センサ基板の製造方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5880411A (en) * 1992-06-08 1999-03-09 Synaptics, Incorporated Object position detector with edge motion feature and gesture recognition
JP3098635B2 (ja) * 1992-09-30 2000-10-16 新光電気工業株式会社 形状検査方法と形状検査装置
JP3225716B2 (ja) * 1993-10-28 2001-11-05 ぺんてる株式会社 情報入力装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101101848B1 (ko) * 2009-05-14 2012-01-05 니혼덴산리드가부시키가이샤 터치패널 검사장치
TWI396852B (zh) * 2009-05-14 2013-05-21 Nidec Read Corp 觸控面板檢驗裝置

Also Published As

Publication number Publication date
TW200613754A (en) 2006-05-01
JP2006064551A (ja) 2006-03-09
CN101023317A (zh) 2007-08-22
WO2006022434A1 (ja) 2006-03-02

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