KR20030064298A - 형광체 검사 방법 및 형광체 검사 장치 - Google Patents

형광체 검사 방법 및 형광체 검사 장치 Download PDF

Info

Publication number
KR20030064298A
KR20030064298A KR10-2003-0004000A KR20030004000A KR20030064298A KR 20030064298 A KR20030064298 A KR 20030064298A KR 20030004000 A KR20030004000 A KR 20030004000A KR 20030064298 A KR20030064298 A KR 20030064298A
Authority
KR
South Korea
Prior art keywords
phosphor
stripe
signal level
average value
coating
Prior art date
Application number
KR10-2003-0004000A
Other languages
English (en)
Korean (ko)
Inventor
와타누키아키오
Original Assignee
가부시키가이샤 히다치 고쿠사이 덴키
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가부시키가이샤 히다치 고쿠사이 덴키 filed Critical 가부시키가이샤 히다치 고쿠사이 덴키
Publication of KR20030064298A publication Critical patent/KR20030064298A/ko

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/42—Measurement or testing during manufacture

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Gas-Filled Discharge Tubes (AREA)
KR10-2003-0004000A 2002-01-23 2003-01-21 형광체 검사 방법 및 형광체 검사 장치 KR20030064298A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2002-00014181 2002-01-23
JP2002014181 2002-01-23

Publications (1)

Publication Number Publication Date
KR20030064298A true KR20030064298A (ko) 2003-07-31

Family

ID=27650937

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-2003-0004000A KR20030064298A (ko) 2002-01-23 2003-01-21 형광체 검사 방법 및 형광체 검사 장치

Country Status (3)

Country Link
KR (1) KR20030064298A (zh)
CN (1) CN1291226C (zh)
TW (1) TW591206B (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE529711C2 (sv) * 2006-03-22 2007-11-06 Aamic Ab Fluorescensläsare
US7920257B2 (en) * 2008-08-27 2011-04-05 Corning Incorporated Systems and methods for determining the shape of glass sheets
JP6041691B2 (ja) * 2013-01-31 2016-12-14 大塚電子株式会社 測定装置および測定方法
CN109596320B (zh) * 2018-11-29 2021-06-29 江西省晶能半导体有限公司 荧光膜片性能测试方法及荧光膜片中原料配比确定方法

Also Published As

Publication number Publication date
CN1291226C (zh) 2006-12-20
CN1437015A (zh) 2003-08-20
TW200302340A (en) 2003-08-01
TW591206B (en) 2004-06-11

Similar Documents

Publication Publication Date Title
US7412088B2 (en) Inspection method, and inspection device, and manufacturing for display panel
KR100589110B1 (ko) 패턴 결함 검사 장치 및 패턴 결함 검사 방법
KR100531993B1 (ko) 플라즈마디스플레이패널을 제조하기 위한 방법,형광체층을 검사하기 위한 검사방법 및 형광체층을검사하기 위한 검사장치
JP3771901B2 (ja) 蛍光体検査方法及び蛍光体検査装置
KR20030064298A (ko) 형광체 검사 방법 및 형광체 검사 장치
JP3003562B2 (ja) 蛍光面検査装置
KR100880335B1 (ko) 플라즈마 디스플레이 패널의 제조 방법 및 플라즈마디스플레이 패널의 검사 장치
JP4531186B2 (ja) プラズマディスプレイパネル背面板の検査装置および製造方法
JP4009595B2 (ja) パターン欠陥検査装置およびパターン欠陥検査方法
JP3784762B2 (ja) パターン欠陥検査装置およびパターン欠陥検査方法
JP2005024572A (ja) 蛍光体検査方法及び蛍光体検査装置
JP4432011B2 (ja) プラズマディスプレイパネル背面板の検査装置および検査方法
JP2003288843A5 (zh)
JP4614624B2 (ja) パターン欠陥検査装置
JP4705417B2 (ja) ディスプレイパネルの検査方法および装置
JP3367474B2 (ja) プラズマディスプレイパネルの検査装置、プラズマディスプレイパネル背面板の製造方法およびプラズマディスプレイパネル
JP2010014430A (ja) 蛍光体検査装置
JP2000337998A (ja) プラズマディスプレイパネルの検査装置および製造方法
US20080145517A1 (en) Method for manufacturing plasma display panel, and apparatus for inspecting plasma display panel
JP2001221712A (ja) 蛍光体フィルター検査方法
JP2004294274A (ja) ディスプレイパネルの検査装置
JP2004045353A (ja) カラー周期性パターンのムラ検査装置
JP2007010474A (ja) 蛍光体の印刷ずれ検査方法
JP2008014728A (ja) カラーフィルタ検査方法およびカラーフィルタ検査装置
JP2001216900A (ja) プラズマディスプレイパネル背面板の検査装置および方法並びに製造方法

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
AMND Amendment
E601 Decision to refuse application
J201 Request for trial against refusal decision
AMND Amendment
E801 Decision on dismissal of amendment
B601 Maintenance of original decision after re-examination before a trial
J301 Trial decision

Free format text: TRIAL DECISION FOR APPEAL AGAINST DECISION TO DECLINE REFUSAL REQUESTED 20060511

Effective date: 20070626