KR20010051502A - 포토리소그래피 포토마스크의 보호용 프레임식 펠리클 - Google Patents
포토리소그래피 포토마스크의 보호용 프레임식 펠리클 Download PDFInfo
- Publication number
- KR20010051502A KR20010051502A KR1020000066013A KR20000066013A KR20010051502A KR 20010051502 A KR20010051502 A KR 20010051502A KR 1020000066013 A KR1020000066013 A KR 1020000066013A KR 20000066013 A KR20000066013 A KR 20000066013A KR 20010051502 A KR20010051502 A KR 20010051502A
- Authority
- KR
- South Korea
- Prior art keywords
- pellicle
- frame
- photomask
- gas
- vents
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
- G03F1/64—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof characterised by the frames, e.g. structure or material, including bonding means therefor
Abstract
Description
Claims (6)
- 포토리소그래피에서의 포토마스크의 방진용 프레임식 펠리클로서,(a) 강성 재료로 제조되며 서로에 대해 평행한 두 개의 단부면을 갖춘 펠리클 프레임, 및(b) 상기 펠리클 프레임의 일 단부면에 팽팽하게 펼쳐져서 접착되는 투명한 플라스틱수지막으로 제조된 펠리클 멤브레인을 일체식 본체로서 포함하고 있으며,상기 펠리클 프레임은 상기 펠리클 멤브레인과 펠리클 프레임으로 둘러싸인 공간을 펠리클 프레임의 외부 환경과 각각 연통시키는 둘 이상의 통기구를 구비하는 프레임식 펠리클.
- 제 1 항에 있어서, 상기 통기구 각각은 필터부재로 덮여지거나 막혀지는 것을 특징으로 하는 프레임식 펠리클.
- 제 1 항에 있어서, 상기 통기구 중 하나 이상이 가스 노즐을 갖춘 커버부재로 덮여지는 것을 특징으로 하는 프레임식 펠리클.
- 기판면 상의 포토레지스트층을 포토마스크를 통해 자외선에 노출시키는 방법으로서,(a) 제 1 항에 따른 프레임식 펠리클을 포토마스크상에 장착하는 단계와,(b) 포토마스크와 프레임식 펠리클로 둘러싸인 공간을 무산소 가스로 충진하는 단계와,(c) 프레임식 펠리클을 지지하는 포토마스크를 기판면에 밀착하거나 또는 그 위쪽에 고정하는 단계와, 그리고(d) 포토레지스트층을 펠리클 멤브레인과 포토마스크를 통해 자외선에 노출시키는 단계를 포함하는 노출방법.
- 제 4 항에 있어서, 상기 무산소 가스는 질소인 것을 특징으로 하는 노출방법.
- 제 4 항에 있어서, 상기 단계(b)에서 모든 통기구가 아닌 하나 이상의 통기구로부터 가스를 도입하고 나머지 통기구를 통해 공간 내의 공기를 배출함으로써 상기 공간을 가스로 충진하는 것을 특징으로 하는 노출방법.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP99-316407 | 1999-11-08 | ||
JP31640799A JP2001133960A (ja) | 1999-11-08 | 1999-11-08 | リソグラフィー用ペリクル及びペリクルの使用方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20010051502A true KR20010051502A (ko) | 2001-06-25 |
KR100746864B1 KR100746864B1 (ko) | 2007-08-07 |
Family
ID=18076740
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020000066013A KR100746864B1 (ko) | 1999-11-08 | 2000-11-08 | 포토리소그래피 포토마스크의 보호용 프레임식 펠리클 |
Country Status (4)
Country | Link |
---|---|
US (2) | US6593034B1 (ko) |
JP (1) | JP2001133960A (ko) |
KR (1) | KR100746864B1 (ko) |
TW (1) | TW482947B (ko) |
Cited By (4)
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KR20180109177A (ko) * | 2017-03-27 | 2018-10-08 | 삼성전자주식회사 | 펠리클의 제조 방법 및 펠리클 조립 장치 |
US10488751B2 (en) | 2014-09-19 | 2019-11-26 | Mitsui Chemicals, Inc. | Pellicle, production method thereof, exposure method |
US10585348B2 (en) | 2014-09-19 | 2020-03-10 | Mitsui Chemicals, Inc. | Pellicle, pellicle production method and exposure method using pellicle |
KR20210002185A (ko) * | 2019-06-27 | 2021-01-07 | 주식회사 에프에스티 | 펠리클용 벤트 필터 및 이를 포함하는 펠리클 |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001133960A (ja) * | 1999-11-08 | 2001-05-18 | Shin Etsu Chem Co Ltd | リソグラフィー用ペリクル及びペリクルの使用方法 |
JP2002158153A (ja) * | 2000-11-16 | 2002-05-31 | Canon Inc | 露光装置およびペリクル空間内ガス置換方法 |
US6710845B2 (en) * | 2000-12-29 | 2004-03-23 | Intel Corporation | Purging gas from a photolithography enclosure between a mask protective device and a patterned mask |
JP4027085B2 (ja) * | 2001-12-04 | 2007-12-26 | キヤノン株式会社 | デバイス製造関連装置およびデバイス製造方法 |
JP2003315983A (ja) * | 2002-04-22 | 2003-11-06 | Mitsubishi Electric Corp | フォトマスク |
US7014961B2 (en) * | 2002-10-02 | 2006-03-21 | Yazaki Corporation | Photomask assembly incorporating a porous frame |
DE10246788B4 (de) * | 2002-10-08 | 2007-08-30 | Infineon Technologies Ag | Schutzvorrichtung für Reflexionsmasken und Verfahren zur Verwendung einer geschützten Reflexionsmaske |
JP2004157229A (ja) * | 2002-11-05 | 2004-06-03 | Shin Etsu Chem Co Ltd | リソグラフィ用ペリクル及びその製造方法 |
JP4027214B2 (ja) | 2002-11-28 | 2007-12-26 | キヤノン株式会社 | 搬送装置、デバイス製造装置、搬送方法およびデバイス製造方法 |
CN1856740A (zh) * | 2003-09-23 | 2006-11-01 | 皇家飞利浦电子股份有限公司 | 用于保护用在芯片制造中的标线片不被污染的方法和装置 |
KR20060101458A (ko) * | 2003-09-23 | 2006-09-25 | 코닌클리케 필립스 일렉트로닉스 엔.브이. | 칩 생산에 사용된 레티클을 오염으로부터 보호하기 위한방법과 장치 |
US7619718B2 (en) * | 2003-10-07 | 2009-11-17 | Asml Holding N.V. | Method and system for active purging of pellicle volumes |
US20050242341A1 (en) * | 2003-10-09 | 2005-11-03 | Knudson Christopher T | Apparatus and method for supporting a flexible substrate during processing |
US7402362B2 (en) * | 2004-02-26 | 2008-07-22 | Taiwan Semiconductor Manufacturing Co., Inc. | Method and system for reducing and monitoring precipitated defects on masking reticles |
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US7655363B2 (en) * | 2006-04-28 | 2010-02-02 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and apparatus for solving mask precipitated defect issue |
US20070287074A1 (en) * | 2006-06-12 | 2007-12-13 | Texas Instruments, Incorporated | Controlled ambient reticle frame |
US7839480B2 (en) * | 2007-04-25 | 2010-11-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | Photomask haze reduction via ventilation |
US8492283B2 (en) | 2007-08-28 | 2013-07-23 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and structure for automated inert gas charging in a reticle stocker |
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DE102008041592A1 (de) * | 2008-08-27 | 2010-03-04 | Carl Zeiss Smt Ag | Detektion von kontaminierenden Stoffen in einer EUV-Lithographieanlage |
US8268514B2 (en) * | 2009-01-26 | 2012-09-18 | Taiwan Semiconductor Manufacturing Co., Ltd. | Pellicle mounting method and apparatus |
US20110085968A1 (en) * | 2009-10-13 | 2011-04-14 | The Regents Of The University Of California | Articles comprising nano-materials for geometry-guided stem cell differentiation and enhanced bone growth |
JP5314631B2 (ja) * | 2010-04-20 | 2013-10-16 | 信越化学工業株式会社 | ペリクルフレームの通気孔内壁に粘着剤を塗布する方法 |
JP5742370B2 (ja) * | 2011-03-29 | 2015-07-01 | 凸版印刷株式会社 | マスク基板の製造方法 |
KR102502727B1 (ko) | 2015-11-09 | 2023-02-23 | 삼성전자주식회사 | 레티클 및 그를 포함하는 노광 장치 |
TWI611479B (zh) * | 2016-09-29 | 2018-01-11 | 台灣積體電路製造股份有限公司 | 薄膜組件的製造方法 |
US11143952B2 (en) | 2017-09-28 | 2021-10-12 | Taiwan Semiconductor Manufacturing Company, Ltd. | Pellicle removal method |
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Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6141255U (ja) * | 1984-08-20 | 1986-03-15 | 株式会社ニコン | マスク保護装置 |
JPH0922111A (ja) * | 1995-07-05 | 1997-01-21 | Shin Etsu Chem Co Ltd | ペリクル |
US5883704A (en) * | 1995-08-07 | 1999-03-16 | Nikon Corporation | Projection exposure apparatus wherein focusing of the apparatus is changed by controlling the temperature of a lens element of the projection optical system |
JPH09197652A (ja) * | 1996-01-19 | 1997-07-31 | Nec Corp | ペリクル及びペリクル付きフォトマスク |
JP3575516B2 (ja) * | 1997-01-07 | 2004-10-13 | 信越化学工業株式会社 | 気圧調整用孔保護フィルター付きペリクル |
KR100253381B1 (ko) * | 1997-12-17 | 2000-06-01 | 김영환 | 재활용 마스크 및 그 제조방법과 재활용방법 |
US6436586B1 (en) * | 1999-04-21 | 2002-08-20 | Shin-Etsu Chemical Co., Ltd. | Pellicle with a filter and method for production thereof |
JP2001133961A (ja) * | 1999-11-02 | 2001-05-18 | Asahi Glass Co Ltd | ペリクル構造体及びペリクル構造体内部の雰囲気置換方法 |
JP2001133960A (ja) * | 1999-11-08 | 2001-05-18 | Shin Etsu Chem Co Ltd | リソグラフィー用ペリクル及びペリクルの使用方法 |
-
1999
- 1999-11-08 JP JP31640799A patent/JP2001133960A/ja active Pending
-
2000
- 2000-11-01 TW TW089123010A patent/TW482947B/zh not_active IP Right Cessation
- 2000-11-07 US US09/706,757 patent/US6593034B1/en not_active Expired - Lifetime
- 2000-11-08 KR KR1020000066013A patent/KR100746864B1/ko active IP Right Grant
-
2003
- 2003-04-22 US US10/419,933 patent/US6803161B2/en not_active Expired - Lifetime
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10488751B2 (en) | 2014-09-19 | 2019-11-26 | Mitsui Chemicals, Inc. | Pellicle, production method thereof, exposure method |
US10585348B2 (en) | 2014-09-19 | 2020-03-10 | Mitsui Chemicals, Inc. | Pellicle, pellicle production method and exposure method using pellicle |
KR20180109177A (ko) * | 2017-03-27 | 2018-10-08 | 삼성전자주식회사 | 펠리클의 제조 방법 및 펠리클 조립 장치 |
KR20210002185A (ko) * | 2019-06-27 | 2021-01-07 | 주식회사 에프에스티 | 펠리클용 벤트 필터 및 이를 포함하는 펠리클 |
Also Published As
Publication number | Publication date |
---|---|
KR100746864B1 (ko) | 2007-08-07 |
US6593034B1 (en) | 2003-07-15 |
US20030207182A1 (en) | 2003-11-06 |
TW482947B (en) | 2002-04-11 |
US6803161B2 (en) | 2004-10-12 |
JP2001133960A (ja) | 2001-05-18 |
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