KR20010040324A - 기판에 질화 탄탈륨을 침착시키기 위한 아미드화 탄탈륨전구체 - Google Patents
기판에 질화 탄탈륨을 침착시키기 위한 아미드화 탄탈륨전구체 Download PDFInfo
- Publication number
- KR20010040324A KR20010040324A KR1020007007507A KR20007007507A KR20010040324A KR 20010040324 A KR20010040324 A KR 20010040324A KR 1020007007507 A KR1020007007507 A KR 1020007007507A KR 20007007507 A KR20007007507 A KR 20007007507A KR 20010040324 A KR20010040324 A KR 20010040324A
- Authority
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- South Korea
- Prior art keywords
- group
- alkyl
- tantalum
- perfluoroalkyl
- formula
- Prior art date
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F7/00—Compounds containing elements of Groups 4 or 14 of the Periodic Table
- C07F7/02—Silicon compounds
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F9/00—Compounds containing elements of Groups 5 or 15 of the Periodic Table
- C07F9/005—Compounds of elements of Group 5 of the Periodic Table without metal-carbon linkages
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/18—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metallo-organic compounds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/34—Nitrides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/10—Heating of the reaction chamber or the substrate
- C30B25/105—Heating of the reaction chamber or the substrate by irradiation or electric discharge
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/38—Nitrides
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Metallurgy (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mechanical Engineering (AREA)
- Inorganic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Physical Vapour Deposition (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/012,679 | 1998-01-23 | ||
| US09/012,679 US6015917A (en) | 1998-01-23 | 1998-01-23 | Tantalum amide precursors for deposition of tantalum nitride on a substrate |
| PCT/US1999/001277 WO1999037655A1 (en) | 1998-01-23 | 1999-01-21 | Tantalum amide precursors for deposition of tantalum nitride on a substrate |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020077014724A Division KR20070086743A (ko) | 1998-01-23 | 1999-01-21 | 기판에 질화 탄탈륨을 침착시키기 위한 아미드화 탄탈륨전구체 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20010040324A true KR20010040324A (ko) | 2001-05-15 |
Family
ID=21756172
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020007007507A Ceased KR20010040324A (ko) | 1998-01-23 | 1999-01-21 | 기판에 질화 탄탈륨을 침착시키기 위한 아미드화 탄탈륨전구체 |
| KR1020087018548A Ceased KR20080075561A (ko) | 1998-01-23 | 1999-01-21 | 기판에 질화 탄탈륨을 침착시키기 위한 아미드화 탄탈륨전구체 |
| KR1020077014724A Ceased KR20070086743A (ko) | 1998-01-23 | 1999-01-21 | 기판에 질화 탄탈륨을 침착시키기 위한 아미드화 탄탈륨전구체 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020087018548A Ceased KR20080075561A (ko) | 1998-01-23 | 1999-01-21 | 기판에 질화 탄탈륨을 침착시키기 위한 아미드화 탄탈륨전구체 |
| KR1020077014724A Ceased KR20070086743A (ko) | 1998-01-23 | 1999-01-21 | 기판에 질화 탄탈륨을 침착시키기 위한 아미드화 탄탈륨전구체 |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US6015917A (enExample) |
| JP (1) | JP2002501075A (enExample) |
| KR (3) | KR20010040324A (enExample) |
| AU (1) | AU2332199A (enExample) |
| DE (1) | DE19982730C2 (enExample) |
| GB (1) | GB2354762B (enExample) |
| WO (1) | WO1999037655A1 (enExample) |
Families Citing this family (170)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7323581B1 (en) * | 1990-07-06 | 2008-01-29 | Advanced Technology Materials, Inc. | Source reagent compositions and method for forming metal films on a substrate by chemical vapor deposition |
| US6153519A (en) * | 1997-03-31 | 2000-11-28 | Motorola, Inc. | Method of forming a barrier layer |
| US6461675B2 (en) | 1998-07-10 | 2002-10-08 | Cvc Products, Inc. | Method for forming a copper film on a substrate |
| US6190732B1 (en) | 1998-09-03 | 2001-02-20 | Cvc Products, Inc. | Method and system for dispensing process gas for fabricating a device on a substrate |
| KR20000022003A (ko) * | 1998-09-10 | 2000-04-25 | 이경수 | 금속과규소를포함한3성분질화물막의형성방법 |
| US6974766B1 (en) * | 1998-10-01 | 2005-12-13 | Applied Materials, Inc. | In situ deposition of a low κ dielectric layer, barrier layer, etch stop, and anti-reflective coating for damascene application |
| US7012292B1 (en) * | 1998-11-25 | 2006-03-14 | Advanced Technology Materials, Inc | Oxidative top electrode deposition process, and microelectronic device structure |
| US6294836B1 (en) * | 1998-12-22 | 2001-09-25 | Cvc Products Inc. | Semiconductor chip interconnect barrier material and fabrication method |
| US6616972B1 (en) * | 1999-02-24 | 2003-09-09 | Air Products And Chemicals, Inc. | Synthesis of metal oxide and oxynitride |
| US6204204B1 (en) * | 1999-04-01 | 2001-03-20 | Cvc Products, Inc. | Method and apparatus for depositing tantalum-based thin films with organmetallic precursor |
| US6245655B1 (en) | 1999-04-01 | 2001-06-12 | Cvc Products, Inc. | Method for planarized deposition of a material |
| US6503561B1 (en) * | 1999-07-08 | 2003-01-07 | Air Products And Chemicals, Inc. | Liquid precursor mixtures for deposition of multicomponent metal containing materials |
| US6238734B1 (en) * | 1999-07-08 | 2001-05-29 | Air Products And Chemicals, Inc. | Liquid precursor mixtures for deposition of multicomponent metal containing materials |
| US6156743A (en) * | 1999-10-18 | 2000-12-05 | Whitcomb; John E. | Method of decreasing fatigue |
| FI20000099A0 (fi) | 2000-01-18 | 2000-01-18 | Asm Microchemistry Ltd | Menetelmä metalliohutkalvojen kasvattamiseksi |
| US6743473B1 (en) * | 2000-02-16 | 2004-06-01 | Applied Materials, Inc. | Chemical vapor deposition of barriers from novel precursors |
| US6319766B1 (en) | 2000-02-22 | 2001-11-20 | Applied Materials, Inc. | Method of tantalum nitride deposition by tantalum oxide densification |
| US6627995B2 (en) | 2000-03-03 | 2003-09-30 | Cvc Products, Inc. | Microelectronic interconnect material with adhesion promotion layer and fabrication method |
| US6984591B1 (en) * | 2000-04-20 | 2006-01-10 | International Business Machines Corporation | Precursor source mixtures |
| US20020003085A1 (en) * | 2000-05-19 | 2002-01-10 | Chandran Ravi R. | Multilayer electrochemical cell technology using sol-gel processing applied to ceramic oxygen generator |
| US6620723B1 (en) | 2000-06-27 | 2003-09-16 | Applied Materials, Inc. | Formation of boride barrier layers using chemisorption techniques |
| US7101795B1 (en) * | 2000-06-28 | 2006-09-05 | Applied Materials, Inc. | Method and apparatus for depositing refractory metal layers employing sequential deposition techniques to form a nucleation layer |
| US7405158B2 (en) * | 2000-06-28 | 2008-07-29 | Applied Materials, Inc. | Methods for depositing tungsten layers employing atomic layer deposition techniques |
| US6551929B1 (en) * | 2000-06-28 | 2003-04-22 | Applied Materials, Inc. | Bifurcated deposition process for depositing refractory metal layers employing atomic layer deposition and chemical vapor deposition techniques |
| US6455421B1 (en) | 2000-07-31 | 2002-09-24 | Applied Materials, Inc. | Plasma treatment of tantalum nitride compound films formed by chemical vapor deposition |
| US6444263B1 (en) | 2000-09-15 | 2002-09-03 | Cvc Products, Inc. | Method of chemical-vapor deposition of a material |
| US20020036780A1 (en) * | 2000-09-27 | 2002-03-28 | Hiroaki Nakamura | Image processing apparatus |
| US6573150B1 (en) * | 2000-10-10 | 2003-06-03 | Applied Materials, Inc. | Integration of CVD tantalum oxide with titanium nitride and tantalum nitride to form MIM capacitors |
| JP3963078B2 (ja) * | 2000-12-25 | 2007-08-22 | 株式会社高純度化学研究所 | ターシャリーアミルイミドトリス(ジメチルアミド)タンタルとその製造方法及びそれを用いたmocvd用原料溶液並びにそれを用いた窒化タンタル膜の形成方法 |
| EP1370508A2 (en) * | 2001-03-12 | 2003-12-17 | The Queen's University of Belfast | Process catalysed by fluoroalkysulfonated compounds, preferably bis-triflimide compounds |
| US7084080B2 (en) * | 2001-03-30 | 2006-08-01 | Advanced Technology Materials, Inc. | Silicon source reagent compositions, and method of making and using same for microelectronic device structure |
| US7005392B2 (en) * | 2001-03-30 | 2006-02-28 | Advanced Technology Materials, Inc. | Source reagent compositions for CVD formation of gate dielectric thin films using amide precursors and method of using same |
| KR100422565B1 (ko) | 2001-06-12 | 2004-03-12 | 주식회사 하이닉스반도체 | 반도체 소자의 캐패시터 제조방법 |
| KR100418580B1 (ko) | 2001-06-12 | 2004-02-21 | 주식회사 하이닉스반도체 | 반도체 소자의 캐패시터 제조방법 |
| KR100410389B1 (ko) | 2001-06-12 | 2003-12-18 | 주식회사 하이닉스반도체 | 반도체 소자의 캐패시터 제조방법 |
| US7098131B2 (en) * | 2001-07-19 | 2006-08-29 | Samsung Electronics Co., Ltd. | Methods for forming atomic layers and thin films including tantalum nitride and devices including the same |
| US20080268635A1 (en) * | 2001-07-25 | 2008-10-30 | Sang-Ho Yu | Process for forming cobalt and cobalt silicide materials in copper contact applications |
| US8110489B2 (en) * | 2001-07-25 | 2012-02-07 | Applied Materials, Inc. | Process for forming cobalt-containing materials |
| US9051641B2 (en) | 2001-07-25 | 2015-06-09 | Applied Materials, Inc. | Cobalt deposition on barrier surfaces |
| JP2005504885A (ja) | 2001-07-25 | 2005-02-17 | アプライド マテリアルズ インコーポレイテッド | 新規なスパッタ堆積方法を使用したバリア形成 |
| US20030029715A1 (en) * | 2001-07-25 | 2003-02-13 | Applied Materials, Inc. | An Apparatus For Annealing Substrates In Physical Vapor Deposition Systems |
| US20090004850A1 (en) * | 2001-07-25 | 2009-01-01 | Seshadri Ganguli | Process for forming cobalt and cobalt silicide materials in tungsten contact applications |
| US6718126B2 (en) | 2001-09-14 | 2004-04-06 | Applied Materials, Inc. | Apparatus and method for vaporizing solid precursor for CVD or atomic layer deposition |
| US6936906B2 (en) * | 2001-09-26 | 2005-08-30 | Applied Materials, Inc. | Integration of barrier layer and seed layer |
| US7049226B2 (en) * | 2001-09-26 | 2006-05-23 | Applied Materials, Inc. | Integration of ALD tantalum nitride for copper metallization |
| US7780785B2 (en) | 2001-10-26 | 2010-08-24 | Applied Materials, Inc. | Gas delivery apparatus for atomic layer deposition |
| US6916398B2 (en) * | 2001-10-26 | 2005-07-12 | Applied Materials, Inc. | Gas delivery apparatus and method for atomic layer deposition |
| US6773507B2 (en) * | 2001-12-06 | 2004-08-10 | Applied Materials, Inc. | Apparatus and method for fast-cycle atomic layer deposition |
| US7081271B2 (en) * | 2001-12-07 | 2006-07-25 | Applied Materials, Inc. | Cyclical deposition of refractory metal silicon nitride |
| US6939801B2 (en) * | 2001-12-21 | 2005-09-06 | Applied Materials, Inc. | Selective deposition of a barrier layer on a dielectric material |
| US6998014B2 (en) | 2002-01-26 | 2006-02-14 | Applied Materials, Inc. | Apparatus and method for plasma assisted deposition |
| US6911391B2 (en) * | 2002-01-26 | 2005-06-28 | Applied Materials, Inc. | Integration of titanium and titanium nitride layers |
| US6833161B2 (en) * | 2002-02-26 | 2004-12-21 | Applied Materials, Inc. | Cyclical deposition of tungsten nitride for metal oxide gate electrode |
| US6972267B2 (en) * | 2002-03-04 | 2005-12-06 | Applied Materials, Inc. | Sequential deposition of tantalum nitride using a tantalum-containing precursor and a nitrogen-containing precursor |
| US6720027B2 (en) * | 2002-04-08 | 2004-04-13 | Applied Materials, Inc. | Cyclical deposition of a variable content titanium silicon nitride layer |
| US6846516B2 (en) * | 2002-04-08 | 2005-01-25 | Applied Materials, Inc. | Multiple precursor cyclical deposition system |
| US7279432B2 (en) * | 2002-04-16 | 2007-10-09 | Applied Materials, Inc. | System and method for forming an integrated barrier layer |
| US20040033371A1 (en) * | 2002-05-16 | 2004-02-19 | Hacker Nigel P. | Deposition of organosilsesquioxane films |
| KR100505043B1 (ko) * | 2002-05-25 | 2005-07-29 | 삼성전자주식회사 | 커패시터 형성 방법 |
| US7041335B2 (en) * | 2002-06-04 | 2006-05-09 | Applied Materials, Inc. | Titanium tantalum nitride silicide layer |
| US6552209B1 (en) * | 2002-06-24 | 2003-04-22 | Air Products And Chemicals, Inc. | Preparation of metal imino/amino complexes for metal oxide and metal nitride thin films |
| US6838125B2 (en) * | 2002-07-10 | 2005-01-04 | Applied Materials, Inc. | Method of film deposition using activated precursor gases |
| US20040009336A1 (en) * | 2002-07-11 | 2004-01-15 | Applied Materials, Inc. | Titanium silicon nitride (TISIN) barrier layer for copper diffusion |
| US7186385B2 (en) * | 2002-07-17 | 2007-03-06 | Applied Materials, Inc. | Apparatus for providing gas to a processing chamber |
| US6955211B2 (en) | 2002-07-17 | 2005-10-18 | Applied Materials, Inc. | Method and apparatus for gas temperature control in a semiconductor processing system |
| US7066194B2 (en) * | 2002-07-19 | 2006-06-27 | Applied Materials, Inc. | Valve design and configuration for fast delivery system |
| US6772072B2 (en) | 2002-07-22 | 2004-08-03 | Applied Materials, Inc. | Method and apparatus for monitoring solid precursor delivery |
| US6915592B2 (en) * | 2002-07-29 | 2005-07-12 | Applied Materials, Inc. | Method and apparatus for generating gas to a processing chamber |
| GB2391555A (en) * | 2002-08-09 | 2004-02-11 | Epichem Ltd | Vapour phase deposition of silicate and oxide films |
| US6995081B2 (en) * | 2002-08-28 | 2006-02-07 | Micron Technology, Inc. | Systems and methods for forming tantalum silicide layers |
| US6794284B2 (en) | 2002-08-28 | 2004-09-21 | Micron Technology, Inc. | Systems and methods for forming refractory metal nitride layers using disilazanes |
| US6967159B2 (en) | 2002-08-28 | 2005-11-22 | Micron Technology, Inc. | Systems and methods for forming refractory metal nitride layers using organic amines |
| US20040065255A1 (en) * | 2002-10-02 | 2004-04-08 | Applied Materials, Inc. | Cyclical layer deposition system |
| US6821563B2 (en) | 2002-10-02 | 2004-11-23 | Applied Materials, Inc. | Gas distribution system for cyclical layer deposition |
| US6905737B2 (en) * | 2002-10-11 | 2005-06-14 | Applied Materials, Inc. | Method of delivering activated species for rapid cyclical deposition |
| EP1420080A3 (en) * | 2002-11-14 | 2005-11-09 | Applied Materials, Inc. | Apparatus and method for hybrid chemical deposition processes |
| US7262133B2 (en) | 2003-01-07 | 2007-08-28 | Applied Materials, Inc. | Enhancement of copper line reliability using thin ALD tan film to cap the copper line |
| WO2004064147A2 (en) * | 2003-01-07 | 2004-07-29 | Applied Materials, Inc. | Integration of ald/cvd barriers with porous low k materials |
| US6989457B2 (en) * | 2003-01-16 | 2006-01-24 | Advanced Technology Materials, Inc. | Chemical vapor deposition precursors for deposition of tantalum-based materials |
| US6753248B1 (en) | 2003-01-27 | 2004-06-22 | Applied Materials, Inc. | Post metal barrier/adhesion film |
| US20040253386A1 (en) * | 2003-06-13 | 2004-12-16 | Sarojini Deevi | Preparation of intermetallics by metallo-organic decomposition |
| WO2004113585A2 (en) * | 2003-06-18 | 2004-12-29 | Applied Materials, Inc. | Atomic layer deposition of barrier materials |
| US7208427B2 (en) * | 2003-08-18 | 2007-04-24 | Advanced Technology Materials, Inc. | Precursor compositions and processes for MOCVD of barrier materials in semiconductor manufacturing |
| US6964911B2 (en) * | 2003-09-23 | 2005-11-15 | Freescale Semiconductor, Inc. | Method for forming a semiconductor device having isolation regions |
| US20050067103A1 (en) * | 2003-09-26 | 2005-03-31 | Applied Materials, Inc. | Interferometer endpoint monitoring device |
| US6960675B2 (en) * | 2003-10-14 | 2005-11-01 | Advanced Technology Materials, Inc. | Tantalum amide complexes for depositing tantalum-containing films, and method of making same |
| US20050104142A1 (en) * | 2003-11-13 | 2005-05-19 | Vijav Narayanan | CVD tantalum compounds for FET get electrodes |
| US20050252449A1 (en) | 2004-05-12 | 2005-11-17 | Nguyen Son T | Control of gas flow and delivery to suppress the formation of particles in an MOCVD/ALD system |
| US20060019033A1 (en) * | 2004-05-21 | 2006-01-26 | Applied Materials, Inc. | Plasma treatment of hafnium-containing materials |
| US8323754B2 (en) * | 2004-05-21 | 2012-12-04 | Applied Materials, Inc. | Stabilization of high-k dielectric materials |
| US20060153995A1 (en) * | 2004-05-21 | 2006-07-13 | Applied Materials, Inc. | Method for fabricating a dielectric stack |
| US20060062917A1 (en) * | 2004-05-21 | 2006-03-23 | Shankar Muthukrishnan | Vapor deposition of hafnium silicate materials with tris(dimethylamino)silane |
| US7166732B2 (en) * | 2004-06-16 | 2007-01-23 | Advanced Technology Materials, Inc. | Copper (I) compounds useful as deposition precursors of copper thin films |
| US7241686B2 (en) * | 2004-07-20 | 2007-07-10 | Applied Materials, Inc. | Atomic layer deposition of tantalum-containing materials using the tantalum precursor TAIMATA |
| CN101052615B (zh) * | 2004-11-02 | 2010-07-14 | 株式会社艾迪科 | 金属化合物、薄膜形成用原料及薄膜的制造方法 |
| US20060102895A1 (en) * | 2004-11-16 | 2006-05-18 | Hendrix Bryan C | Precursor compositions for forming tantalum-containing films, and tantalum-containing barrier films and copper-metallized semiconductor device structures |
| US7429402B2 (en) * | 2004-12-10 | 2008-09-30 | Applied Materials, Inc. | Ruthenium as an underlayer for tungsten film deposition |
| JP5053543B2 (ja) | 2005-02-02 | 2012-10-17 | 東ソー株式会社 | タンタル化合物、その製造方法、タンタル含有薄膜、及びその形成方法 |
| US7410927B2 (en) * | 2005-04-13 | 2008-08-12 | Chevron Phillips Chemical Company, Lp | Catalysts for olefin polymerization |
| US7247594B2 (en) * | 2005-04-13 | 2007-07-24 | Chevron Phillips Chemical Co. Lp | Catalysts for olefin polymerization |
| US9312557B2 (en) * | 2005-05-11 | 2016-04-12 | Schlumberger Technology Corporation | Fuel cell apparatus and method for downhole power systems |
| WO2007005088A2 (en) * | 2005-07-01 | 2007-01-11 | Honeywell International Inc. | Vaporizable metalorganic compounds for deposition of metals and metal-containing thin films |
| US20070020890A1 (en) * | 2005-07-19 | 2007-01-25 | Applied Materials, Inc. | Method and apparatus for semiconductor processing |
| US7521356B2 (en) * | 2005-09-01 | 2009-04-21 | Micron Technology, Inc. | Atomic layer deposition systems and methods including silicon-containing tantalum precursor compounds |
| US20070065578A1 (en) * | 2005-09-21 | 2007-03-22 | Applied Materials, Inc. | Treatment processes for a batch ALD reactor |
| US7547796B2 (en) * | 2005-09-29 | 2009-06-16 | Praxair Technology, Inc. | Organometallic compounds, processes for the preparation thereof and methods of use thereof |
| US7550385B2 (en) * | 2005-09-30 | 2009-06-23 | Intel Corporation | Amine-free deposition of metal-nitride films |
| US8993055B2 (en) | 2005-10-27 | 2015-03-31 | Asm International N.V. | Enhanced thin film deposition |
| US20070099422A1 (en) * | 2005-10-28 | 2007-05-03 | Kapila Wijekoon | Process for electroless copper deposition |
| US7850779B2 (en) * | 2005-11-04 | 2010-12-14 | Applied Materisals, Inc. | Apparatus and process for plasma-enhanced atomic layer deposition |
| US20070194470A1 (en) * | 2006-02-17 | 2007-08-23 | Aviza Technology, Inc. | Direct liquid injector device |
| US20070252299A1 (en) * | 2006-04-27 | 2007-11-01 | Applied Materials, Inc. | Synchronization of precursor pulsing and wafer rotation |
| US7798096B2 (en) * | 2006-05-05 | 2010-09-21 | Applied Materials, Inc. | Plasma, UV and ion/neutral assisted ALD or CVD in a batch tool |
| US20070259111A1 (en) * | 2006-05-05 | 2007-11-08 | Singh Kaushal K | Method and apparatus for photo-excitation of chemicals for atomic layer deposition of dielectric film |
| EP2047502A4 (en) * | 2006-06-30 | 2009-12-30 | Applied Materials Inc | NANOCRYSTAL FORMATION |
| US7959986B2 (en) * | 2006-08-09 | 2011-06-14 | Praxair Technology, Inc. | Organometallic compounds, processes for the preparation thereof and methods of use thereof |
| US7956207B2 (en) * | 2006-09-28 | 2011-06-07 | Praxair Technology, Inc. | Heteroleptic organometallic compounds |
| EP1916253A1 (en) * | 2006-10-26 | 2008-04-30 | L'AIR LIQUIDE, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | New group V metal containing precursors and their use for metal containing film deposition |
| US20080099436A1 (en) * | 2006-10-30 | 2008-05-01 | Michael Grimbergen | Endpoint detection for photomask etching |
| US8158526B2 (en) | 2006-10-30 | 2012-04-17 | Applied Materials, Inc. | Endpoint detection for photomask etching |
| US7775508B2 (en) * | 2006-10-31 | 2010-08-17 | Applied Materials, Inc. | Ampoule for liquid draw and vapor draw with a continuous level sensor |
| US7611751B2 (en) | 2006-11-01 | 2009-11-03 | Asm America, Inc. | Vapor deposition of metal carbide films |
| TW200825200A (en) * | 2006-12-05 | 2008-06-16 | Advanced Tech Materials | Metal aminotroponiminates, bis-oxazolinates and guanidinates |
| US7750173B2 (en) | 2007-01-18 | 2010-07-06 | Advanced Technology Materials, Inc. | Tantalum amido-complexes with chelate ligands useful for CVD and ALD of TaN and Ta205 thin films |
| US20080206987A1 (en) * | 2007-01-29 | 2008-08-28 | Gelatos Avgerinos V | Process for tungsten nitride deposition by a temperature controlled lid assembly |
| WO2008128141A2 (en) * | 2007-04-12 | 2008-10-23 | Advanced Technology Materials, Inc. | Zirconium, hafnuim, titanium, and silicon precursors for ald/cvd |
| WO2009012341A2 (en) * | 2007-07-16 | 2009-01-22 | Advancaed Technology Materials, Inc. | Group iv complexes as cvd and ald precursors for forming metal-containing thin films |
| US7678298B2 (en) * | 2007-09-25 | 2010-03-16 | Applied Materials, Inc. | Tantalum carbide nitride materials by vapor deposition processes |
| US7585762B2 (en) * | 2007-09-25 | 2009-09-08 | Applied Materials, Inc. | Vapor deposition processes for tantalum carbide nitride materials |
| US7824743B2 (en) * | 2007-09-28 | 2010-11-02 | Applied Materials, Inc. | Deposition processes for titanium nitride barrier and aluminum |
| US20090087561A1 (en) * | 2007-09-28 | 2009-04-02 | Advanced Technology Materials, Inc. | Metal and metalloid silylamides, ketimates, tetraalkylguanidinates and dianionic guanidinates useful for cvd/ald of thin films |
| KR101540077B1 (ko) | 2008-04-16 | 2015-07-28 | 에이에스엠 아메리카, 인코포레이티드 | 알루미늄 탄화수소 화합물들을 이용한 금속 카바이드 막들의 원자층 증착법 |
| US20090275164A1 (en) * | 2008-05-02 | 2009-11-05 | Advanced Technology Materials, Inc. | Bicyclic guanidinates and bridging diamides as cvd/ald precursors |
| WO2010012595A1 (en) | 2008-08-01 | 2010-02-04 | L'air Liquide Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude | Method of forming a tantalum-containing layer on a substrate |
| US20100062149A1 (en) | 2008-09-08 | 2010-03-11 | Applied Materials, Inc. | Method for tuning a deposition rate during an atomic layer deposition process |
| US8491967B2 (en) * | 2008-09-08 | 2013-07-23 | Applied Materials, Inc. | In-situ chamber treatment and deposition process |
| ATE535534T1 (de) | 2008-10-07 | 2011-12-15 | Air Liquide | Metall-organische niobium- und vanadium-vorläufer zur dünnschichtablagerung |
| US8146896B2 (en) * | 2008-10-31 | 2012-04-03 | Applied Materials, Inc. | Chemical precursor ampoule for vapor deposition processes |
| WO2010065874A2 (en) | 2008-12-05 | 2010-06-10 | Atmi | High concentration nitrogen-containing germanium telluride based memory devices and processes of making |
| KR101706809B1 (ko) | 2010-03-26 | 2017-02-15 | 엔테그리스, 아이엔씨. | 게르마늄 안티몬 텔루라이드 물질 및 이를 포함하는 장치 |
| US9190609B2 (en) | 2010-05-21 | 2015-11-17 | Entegris, Inc. | Germanium antimony telluride materials and devices incorporating same |
| US8778204B2 (en) | 2010-10-29 | 2014-07-15 | Applied Materials, Inc. | Methods for reducing photoresist interference when monitoring a target layer in a plasma process |
| US8961804B2 (en) | 2011-10-25 | 2015-02-24 | Applied Materials, Inc. | Etch rate detection for photomask etching |
| US8808559B2 (en) | 2011-11-22 | 2014-08-19 | Applied Materials, Inc. | Etch rate detection for reflective multi-material layers etching |
| US8900469B2 (en) | 2011-12-19 | 2014-12-02 | Applied Materials, Inc. | Etch rate detection for anti-reflective coating layer and absorber layer etching |
| WO2013192220A1 (en) * | 2012-06-18 | 2013-12-27 | University Of Florida Research Foundation, Inc. | Tungsten nitrido precursors for the cvd of tungsten nitride, carbonitride, and oxide films |
| US9805939B2 (en) | 2012-10-12 | 2017-10-31 | Applied Materials, Inc. | Dual endpoint detection for advanced phase shift and binary photomasks |
| CN103794596B (zh) * | 2012-10-29 | 2016-08-10 | 中芯国际集成电路制造(上海)有限公司 | 标准晶片及其制造方法 |
| WO2014070682A1 (en) | 2012-10-30 | 2014-05-08 | Advaned Technology Materials, Inc. | Double self-aligned phase change memory device structure |
| US8778574B2 (en) | 2012-11-30 | 2014-07-15 | Applied Materials, Inc. | Method for etching EUV material layers utilized to form a photomask |
| US9412602B2 (en) | 2013-03-13 | 2016-08-09 | Asm Ip Holding B.V. | Deposition of smooth metal nitride films |
| US8846550B1 (en) | 2013-03-14 | 2014-09-30 | Asm Ip Holding B.V. | Silane or borane treatment of metal thin films |
| US8841182B1 (en) | 2013-03-14 | 2014-09-23 | Asm Ip Holding B.V. | Silane and borane treatments for titanium carbide films |
| US9394609B2 (en) | 2014-02-13 | 2016-07-19 | Asm Ip Holding B.V. | Atomic layer deposition of aluminum fluoride thin films |
| US10643925B2 (en) | 2014-04-17 | 2020-05-05 | Asm Ip Holding B.V. | Fluorine-containing conductive films |
| KR102216575B1 (ko) | 2014-10-23 | 2021-02-18 | 에이에스엠 아이피 홀딩 비.브이. | 티타늄 알루미늄 및 탄탈륨 알루미늄 박막들 |
| US9941425B2 (en) | 2015-10-16 | 2018-04-10 | Asm Ip Holdings B.V. | Photoactive devices and materials |
| US9786492B2 (en) | 2015-11-12 | 2017-10-10 | Asm Ip Holding B.V. | Formation of SiOCN thin films |
| US9786491B2 (en) | 2015-11-12 | 2017-10-10 | Asm Ip Holding B.V. | Formation of SiOCN thin films |
| KR102627456B1 (ko) | 2015-12-21 | 2024-01-19 | 삼성전자주식회사 | 탄탈럼 화합물과 이를 이용한 박막 형성 방법 및 집적회로 소자의 제조 방법 |
| TW201722971A (zh) * | 2015-12-28 | 2017-07-01 | Up Chemical Co Ltd | 鉭化合物、其製備方法、包含其的膜沉積用前體組合物及利用該前體組合物的膜沉積方法 |
| KR102378021B1 (ko) | 2016-05-06 | 2022-03-23 | 에이에스엠 아이피 홀딩 비.브이. | SiOC 박막의 형성 |
| US10847529B2 (en) | 2017-04-13 | 2020-11-24 | Asm Ip Holding B.V. | Substrate processing method and device manufactured by the same |
| US10504901B2 (en) | 2017-04-26 | 2019-12-10 | Asm Ip Holding B.V. | Substrate processing method and device manufactured using the same |
| CN114875388A (zh) | 2017-05-05 | 2022-08-09 | Asm Ip 控股有限公司 | 用于受控形成含氧薄膜的等离子体增强沉积方法 |
| TWI761636B (zh) | 2017-12-04 | 2022-04-21 | 荷蘭商Asm Ip控股公司 | 電漿增強型原子層沉積製程及沉積碳氧化矽薄膜的方法 |
| US12359315B2 (en) | 2019-02-14 | 2025-07-15 | Asm Ip Holding B.V. | Deposition of oxides and nitrides |
| US12142479B2 (en) | 2020-01-17 | 2024-11-12 | Asm Ip Holding B.V. | Formation of SiOCN thin films |
| US12341005B2 (en) | 2020-01-17 | 2025-06-24 | Asm Ip Holding B.V. | Formation of SiCN thin films |
| TW202200828A (zh) | 2020-06-24 | 2022-01-01 | 荷蘭商Asm Ip私人控股有限公司 | 含鉬薄膜的氣相沉積 |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2839421A (en) * | 1955-04-06 | 1958-06-17 | Du Pont | An alkoxy aluminum chelate, a dispersion of it in an organic liquid and a water repellant porous object |
| GB976573A (en) * | 1959-12-30 | 1964-11-25 | Union Carbide Corp | Improvements in and relating to metal plating |
| US3076834A (en) * | 1960-03-04 | 1963-02-05 | Dow Chemical Co | Chelate-phenol adducts |
| US3288829A (en) * | 1961-01-19 | 1966-11-29 | Ethyl Corp | Process for preparing cyclopentadienyl group vb and vib metal hydrides |
| US3437516A (en) * | 1966-04-28 | 1969-04-08 | Us Air Force | Vapor deposition from perfluoroorganometallic compounds |
| US4147556A (en) * | 1972-01-12 | 1979-04-03 | Ppg Industries, Inc. | Nonflammable beta diketonate composition |
| US3988332A (en) * | 1974-05-20 | 1976-10-26 | E. I. Du Pont De Nemours And Company | Hydrocarbylidene compounds of niobium and tantalum |
| US4529427A (en) * | 1977-05-19 | 1985-07-16 | At&T Bell Laboratories | Method for making low-loss optical waveguides on an industrial scale |
| US4401474A (en) * | 1979-12-03 | 1983-08-30 | Ppg Industries, Inc. | Pyrolytic coating reactant for defect and durability control |
| US4281037A (en) * | 1980-08-08 | 1981-07-28 | Dap, Inc. | Cleaning and priming composition containing titanium acetylacetonate and method |
| JPS58203443A (ja) * | 1982-05-24 | 1983-11-26 | Hitachi Ltd | ホトマスクの白点欠陥修正用組成物 |
| JPS60140880A (ja) * | 1983-12-28 | 1985-07-25 | Hitachi Ltd | 太陽電池の製造方法 |
| FR2575936B1 (fr) * | 1985-01-15 | 1987-02-13 | Rhone Poulenc Spec Chim | Procede de purification de solutions aqueuses de sels de terres rares par extraction liquide-liquide |
| US4898842A (en) * | 1986-03-03 | 1990-02-06 | International Business Machines Corporation | Organometallic-derived cordierite and other compounds comprising oxides of silicon |
| JP2729373B2 (ja) * | 1987-01-07 | 1998-03-18 | 東京応化工業 株式会社 | 金属酸化膜形成用塗布液 |
| US5034372A (en) * | 1987-12-07 | 1991-07-23 | Mitsubishi Denki Kabushiki Kaisha | Plasma based method for production of superconductive oxide layers |
| JP2615469B2 (ja) * | 1988-04-21 | 1997-05-28 | 松下電器産業株式会社 | 金属硫化物薄膜の製造方法 |
| US5120703A (en) * | 1990-04-17 | 1992-06-09 | Alfred University | Process for preparing oxide superconducting films by radio-frequency generated aerosol-plasma deposition in atmosphere |
| US5280012A (en) * | 1990-07-06 | 1994-01-18 | Advanced Technology Materials Inc. | Method of forming a superconducting oxide layer by MOCVD |
| US5204314A (en) * | 1990-07-06 | 1993-04-20 | Advanced Technology Materials, Inc. | Method for delivering an involatile reagent in vapor form to a CVD reactor |
| US5225561A (en) * | 1990-07-06 | 1993-07-06 | Advanced Technology Materials, Inc. | Source reagent compounds for MOCVD of refractory films containing group IIA elements |
| US5711816A (en) * | 1990-07-06 | 1998-01-27 | Advanced Technolgy Materials, Inc. | Source reagent liquid delivery apparatus, and chemical vapor deposition system comprising same |
| US5165960A (en) * | 1991-07-29 | 1992-11-24 | Ford Motor Company | Deposition of magnesium fluoride films |
| US5376409B1 (en) * | 1992-12-21 | 1997-06-03 | Univ New York State Res Found | Process and apparatus for the use of solid precursor sources in liquid form for vapor deposition of materials |
| US5412129A (en) * | 1994-06-17 | 1995-05-02 | Dicarolis; Stephen A. | Stabilization of precursors for thin film deposition |
| US5591483A (en) * | 1994-08-31 | 1997-01-07 | Wayne State University | Process for the preparation of metal nitride coatings from single source precursors |
| US5679815A (en) * | 1994-09-16 | 1997-10-21 | Advanced Technology Materials, Inc. | Tantalum and niobium reagents useful in chemical vapor deposition processes, and process for depositing coatings using the same |
| US5668054A (en) * | 1996-01-11 | 1997-09-16 | United Microelectronics Corporation | Process for fabricating tantalum nitride diffusion barrier for copper matallization |
-
1998
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| JP2002501075A (ja) | 2002-01-15 |
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| US6379748B1 (en) | 2002-04-30 |
| DE19982730T1 (de) | 2001-07-26 |
| AU2332199A (en) | 1999-08-09 |
| KR20070086743A (ko) | 2007-08-27 |
| US6015917A (en) | 2000-01-18 |
| GB2354762A (en) | 2001-04-04 |
| GB0015192D0 (en) | 2000-08-09 |
| DE19982730C2 (de) | 2002-01-31 |
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