KR102929984B1 - 접촉자 유닛, 소켓의 집합체 및 커넥터 - Google Patents

접촉자 유닛, 소켓의 집합체 및 커넥터

Info

Publication number
KR102929984B1
KR102929984B1 KR1020227033118A KR20227033118A KR102929984B1 KR 102929984 B1 KR102929984 B1 KR 102929984B1 KR 1020227033118 A KR1020227033118 A KR 1020227033118A KR 20227033118 A KR20227033118 A KR 20227033118A KR 102929984 B1 KR102929984 B1 KR 102929984B1
Authority
KR
South Korea
Prior art keywords
socket
protrusion
hole
sockets
axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
KR1020227033118A
Other languages
English (en)
Korean (ko)
Other versions
KR20220161308A (ko
Inventor
지롱 페이
무네히로 야마시타
Original Assignee
니덱 어드밴스 테크놀로지 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 니덱 어드밴스 테크놀로지 가부시키가이샤 filed Critical 니덱 어드밴스 테크놀로지 가부시키가이샤
Publication of KR20220161308A publication Critical patent/KR20220161308A/ko
Application granted granted Critical
Publication of KR102929984B1 publication Critical patent/KR102929984B1/ko
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/10—Sockets for co-operation with pins or blades
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
    • H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Connector Housings Or Holding Contact Members (AREA)
  • Measuring Leads Or Probes (AREA)
KR1020227033118A 2020-03-31 2021-03-23 접촉자 유닛, 소켓의 집합체 및 커넥터 Active KR102929984B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020062239 2020-03-31
JPJP-P-2020-062239 2020-03-31
PCT/JP2021/011829 WO2021200356A1 (ja) 2020-03-31 2021-03-23 接触子ユニット、ソケットの集合体、及びコネクタ

Publications (2)

Publication Number Publication Date
KR20220161308A KR20220161308A (ko) 2022-12-06
KR102929984B1 true KR102929984B1 (ko) 2026-02-24

Family

ID=77929864

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020227033118A Active KR102929984B1 (ko) 2020-03-31 2021-03-23 접촉자 유닛, 소켓의 집합체 및 커넥터

Country Status (5)

Country Link
JP (1) JP7548299B2 (https=)
KR (1) KR102929984B1 (https=)
CN (1) CN115428268A (https=)
TW (1) TWI886233B (https=)
WO (1) WO2021200356A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI823560B (zh) * 2022-09-13 2023-11-21 晝思有限公司 探針接頭及所組成的彈簧式探針

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008112672A (ja) * 2006-10-31 2008-05-15 Hirose Electric Co Ltd 同軸電気コネクタ
JP2010146949A (ja) 2008-12-22 2010-07-01 Molex Inc 同軸コネクタ
JP2016102696A (ja) 2014-11-27 2016-06-02 株式会社ヨコオ 検査ユニット
JP2019061871A (ja) * 2017-09-27 2019-04-18 日本電産リード株式会社 多極コネクタ
WO2019093614A1 (en) 2017-11-07 2019-05-16 Leeno Industrial Inc. A test probe assembly and test socket

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3576488B2 (ja) * 2000-12-18 2004-10-13 日本圧着端子製造株式会社 雌端子
JP4689196B2 (ja) 2003-11-05 2011-05-25 日本発條株式会社 導電性接触子ホルダ、導電性接触子ユニット
JP4374288B2 (ja) * 2004-04-19 2009-12-02 ケル株式会社 電線圧接型コネクタ
JP4926568B2 (ja) * 2006-06-29 2012-05-09 キヤノン株式会社 画像処理装置、画像処理方法、及び画像処理プログラム
KR20080098090A (ko) 2007-05-04 2008-11-07 구의정 일회용 구이 봉지
JP4706760B2 (ja) * 2009-01-26 2011-06-22 住友電装株式会社 端子金具
JP5847576B2 (ja) * 2011-12-29 2016-01-27 株式会社エンプラス プローブピン及び電気部品用ソケット
JP2015022797A (ja) * 2013-07-16 2015-02-02 矢崎総業株式会社 コネクタおよび端子
EP3086414B1 (en) * 2013-09-27 2019-08-28 Siemens Aktiengesellschaft Connector unit
JP5568677B1 (ja) * 2013-11-13 2014-08-06 イリソ電子工業株式会社 電気コネクタ
JP2019003833A (ja) * 2017-06-15 2019-01-10 第一精工株式会社 電気コネクタ
JP6868275B2 (ja) * 2017-06-22 2021-05-12 有限会社タイプエス 浮子投下システム、浮子投下装置および基地局装置
JP7463739B2 (ja) * 2019-03-22 2024-04-09 ニデックアドバンステクノロジー株式会社 ソケット、接触子ユニット、ソケットの集合体、及び接触子ユニットを備えた多極コネクタ

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008112672A (ja) * 2006-10-31 2008-05-15 Hirose Electric Co Ltd 同軸電気コネクタ
JP2010146949A (ja) 2008-12-22 2010-07-01 Molex Inc 同軸コネクタ
JP2016102696A (ja) 2014-11-27 2016-06-02 株式会社ヨコオ 検査ユニット
JP2019061871A (ja) * 2017-09-27 2019-04-18 日本電産リード株式会社 多極コネクタ
WO2019093614A1 (en) 2017-11-07 2019-05-16 Leeno Industrial Inc. A test probe assembly and test socket

Also Published As

Publication number Publication date
JPWO2021200356A1 (https=) 2021-10-07
TWI886233B (zh) 2025-06-11
TW202143567A (zh) 2021-11-16
JP7548299B2 (ja) 2024-09-10
WO2021200356A1 (ja) 2021-10-07
CN115428268A (zh) 2022-12-02
KR20220161308A (ko) 2022-12-06

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