KR102818067B1 - 광학장치, 노광장치, 및 물품의 제조방법 - Google Patents
광학장치, 노광장치, 및 물품의 제조방법 Download PDFInfo
- Publication number
- KR102818067B1 KR102818067B1 KR1020210000641A KR20210000641A KR102818067B1 KR 102818067 B1 KR102818067 B1 KR 102818067B1 KR 1020210000641 A KR1020210000641 A KR 1020210000641A KR 20210000641 A KR20210000641 A KR 20210000641A KR 102818067 B1 KR102818067 B1 KR 102818067B1
- Authority
- KR
- South Korea
- Prior art keywords
- exposure
- tube
- gas
- optical
- setting means
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70883—Environment aspects, e.g. pressure of beam-path gas, temperature of optical system
- G03F7/70891—Temperature
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/008—Mountings, adjusting means, or light-tight connections, for optical elements with means for compensating for changes in temperature or for controlling the temperature; thermal stabilisation
-
- H01L21/027—
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Atmospheric Sciences (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Mounting And Adjusting Of Optical Elements (AREA)
- Lens Barrels (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2020-018861 | 2020-02-06 | ||
| JP2020018861A JP7427461B2 (ja) | 2020-02-06 | 2020-02-06 | 露光装置、及び物品の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20210100528A KR20210100528A (ko) | 2021-08-17 |
| KR102818067B1 true KR102818067B1 (ko) | 2025-06-11 |
Family
ID=77130109
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020210000641A Active KR102818067B1 (ko) | 2020-02-06 | 2021-01-05 | 광학장치, 노광장치, 및 물품의 제조방법 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP7427461B2 (https=) |
| KR (1) | KR102818067B1 (https=) |
| CN (1) | CN113238459B (https=) |
| TW (2) | TWI840643B (https=) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020145711A1 (en) * | 1997-11-12 | 2002-10-10 | Nobutaka Magome | Exposure apparatus, apparatus for manufacturing devices, and method of manufacturing exposure apparatuses |
| JP2008292761A (ja) | 2007-05-24 | 2008-12-04 | Canon Inc | 露光装置及びデバイス製造方法 |
| JP2015079074A (ja) | 2013-10-16 | 2015-04-23 | キヤノン株式会社 | 露光装置 |
| JP2016095412A (ja) * | 2014-11-14 | 2016-05-26 | キヤノン株式会社 | 露光装置、および物品の製造方法 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1092735A (ja) * | 1996-09-13 | 1998-04-10 | Nikon Corp | 露光装置 |
| WO2003030229A1 (en) * | 2001-09-27 | 2003-04-10 | Nikon Corporation | Aligner and method for fabricating device |
| JP2003124092A (ja) * | 2001-10-09 | 2003-04-25 | Canon Inc | 露光装置及びその制御方法、デバイス製造方法 |
| TWI474380B (zh) * | 2003-05-23 | 2015-02-21 | 尼康股份有限公司 | A method of manufacturing an exposure apparatus and an element |
| US7136142B2 (en) * | 2004-05-25 | 2006-11-14 | Asml Netherlands B.V. | Lithographic apparatus having a gas flushing device |
| JP5517847B2 (ja) * | 2010-09-08 | 2014-06-11 | キヤノン株式会社 | 露光装置、及びそれを用いたデバイスの製造方法 |
| JP6896404B2 (ja) * | 2016-11-30 | 2021-06-30 | キヤノン株式会社 | 露光装置及び物品の製造方法 |
| JP7016661B2 (ja) * | 2017-10-06 | 2022-02-07 | キヤノン株式会社 | 露光装置および物品の製造方法 |
-
2020
- 2020-02-06 JP JP2020018861A patent/JP7427461B2/ja active Active
- 2020-12-30 TW TW109146782A patent/TWI840643B/zh active
- 2020-12-30 TW TW113113085A patent/TWI874179B/zh active
-
2021
- 2021-01-05 KR KR1020210000641A patent/KR102818067B1/ko active Active
- 2021-02-02 CN CN202110140250.5A patent/CN113238459B/zh active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020145711A1 (en) * | 1997-11-12 | 2002-10-10 | Nobutaka Magome | Exposure apparatus, apparatus for manufacturing devices, and method of manufacturing exposure apparatuses |
| JP2008292761A (ja) | 2007-05-24 | 2008-12-04 | Canon Inc | 露光装置及びデバイス製造方法 |
| JP2015079074A (ja) | 2013-10-16 | 2015-04-23 | キヤノン株式会社 | 露光装置 |
| JP2016095412A (ja) * | 2014-11-14 | 2016-05-26 | キヤノン株式会社 | 露光装置、および物品の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW202131107A (zh) | 2021-08-16 |
| TWI840643B (zh) | 2024-05-01 |
| JP2021124634A (ja) | 2021-08-30 |
| JP7427461B2 (ja) | 2024-02-05 |
| CN113238459A (zh) | 2021-08-10 |
| TWI874179B (zh) | 2025-02-21 |
| TW202429220A (zh) | 2024-07-16 |
| KR20210100528A (ko) | 2021-08-17 |
| CN113238459B (zh) | 2024-09-13 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| A201 | Request for examination | ||
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |