KR102804109B1 - 기판 상에 마이크로led를 조립하기 위한 방법 및 시스템 - Google Patents

기판 상에 마이크로led를 조립하기 위한 방법 및 시스템 Download PDF

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KR102804109B1
KR102804109B1 KR1020210017940A KR20210017940A KR102804109B1 KR 102804109 B1 KR102804109 B1 KR 102804109B1 KR 1020210017940 A KR1020210017940 A KR 1020210017940A KR 20210017940 A KR20210017940 A KR 20210017940A KR 102804109 B1 KR102804109 B1 KR 102804109B1
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substrate
coupon
microled chips
chips
transfer
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KR20210111155A (ko
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왕 윤다
루 제핑
왕 퀴안
래이차우드후리 소롭
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팔로 알토 리서치 센터, 엘엘씨
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H01L21/52
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0438Apparatus for making assemblies not otherwise provided for, e.g. package constructions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J183/00Adhesives based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Adhesives based on derivatives of such polymers
    • C09J183/04Polysiloxanes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2632Circuits therefor for testing diodes
    • G01R31/2635Testing light-emitting diodes, laser diodes or photodiodes
    • H01L21/67144
    • H01L21/6835
    • H01L25/0753
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01Manufacture or treatment
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0446Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H10P72/7434Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used in a transfer process involving at least two transfer steps, i.e. including an intermediate handle substrate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • H10P74/23Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes
    • H10P74/232Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes comprising connection or disconnection of parts of a device in response to a measurement
    • H01L2221/68368
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01Manufacture or treatment
    • H10H20/011Manufacture or treatment of bodies, e.g. forming semiconductor layers
    • H10H20/018Bonding of wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H10P72/7428Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used to support diced chips prior to mounting
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Organic Chemistry (AREA)
  • Led Device Packages (AREA)
  • Electroluminescent Light Sources (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR1020210017940A 2020-03-02 2021-02-09 기판 상에 마이크로led를 조립하기 위한 방법 및 시스템 Active KR102804109B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US16/805,911 US11348905B2 (en) 2020-03-02 2020-03-02 Method and system for assembly of micro-LEDs onto a substrate
US16/805,911 2020-03-02

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KR20210111155A KR20210111155A (ko) 2021-09-10
KR102804109B1 true KR102804109B1 (ko) 2025-05-09

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US (1) US11348905B2 (https=)
EP (1) EP3876270B1 (https=)
JP (1) JP7514777B2 (https=)
KR (1) KR102804109B1 (https=)
CN (1) CN113345878B (https=)
TW (1) TWI858227B (https=)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11842989B2 (en) * 2020-03-10 2023-12-12 Meta Platforms Technologies, Llc Integrating control circuits with light emissive circuits with dissimilar wafer sizes
TWI872235B (zh) * 2020-03-30 2025-02-11 加拿大商弗瑞爾公司 微裝置轉移中之偏移對齊及修復
US11677060B2 (en) * 2020-04-13 2023-06-13 Electronics and Teleocmmunications Research Institute Method for transferring and bonding of devices
TW202310323A (zh) * 2021-04-27 2023-03-01 日商昭和電工材料股份有限公司 Led轉移構件及led裝置的製造方法
US12263576B2 (en) 2021-08-19 2025-04-01 Hyundai Mobis Co., Ltd. Robot system for automated assembly of modular component
CN115771214A (zh) * 2021-09-09 2023-03-10 日月光半导体制造股份有限公司 用于形成多个分离组件的模具及装置
KR20240070671A (ko) * 2021-09-30 2024-05-21 보드 오브 리전츠, 더 유니버시티 오브 텍사스 시스템 픽앤플레이스 조립 툴 및 프로세스
TWI807544B (zh) * 2021-12-17 2023-07-01 友達光電股份有限公司 顯示面板及其製造方法
KR102700929B1 (ko) * 2021-12-21 2024-08-30 한국광기술원 Led 측정장치
CN114709163A (zh) * 2022-03-30 2022-07-05 北京石油化工学院 液气双态Mini/Micro LED芯片巨量转移用晶膜及制作方法
CN115101439B (zh) * 2022-05-27 2025-05-02 黄招凤 物料传送系统及方法
KR102787169B1 (ko) * 2022-09-06 2025-03-26 삼성전자주식회사 마이크로 반도체 칩의 대량 전사 방법 및 대량 전사 장치
CN117976569A (zh) * 2022-10-25 2024-05-03 群创光电股份有限公司 电子装置及其制作方法
WO2024193797A1 (en) * 2023-03-17 2024-09-26 Ams-Osram International Gmbh Method for evaluating optoelectronic components and test arrangement
KR20260041820A (ko) * 2023-07-18 2026-03-27 뷰리얼 인크. 디스플레이 백플레인 상에 집적된 led를 갖는 칩렛
TWI872659B (zh) * 2023-08-23 2025-02-11 雷傑科技股份有限公司 晶粒填補方法
CN121773762A (zh) * 2023-09-11 2026-03-31 东京毅力科创株式会社 接合装置、接合系统、接合方法、换载装置以及换载方法
TWI879346B (zh) * 2023-12-26 2025-04-01 前源科技股份有限公司 電子元件的接合方法與巨量轉移電子元件的方法
TWI890245B (zh) * 2023-12-27 2025-07-11 錼創顯示科技股份有限公司 元件加工設備

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002314052A (ja) * 2001-04-11 2002-10-25 Sony Corp 素子の転写方法及びこれを用いた素子の配列方法、画像表示装置の製造方法
JP2002344028A (ja) 2001-05-16 2002-11-29 Sony Corp 素子の転写方法及び画像表示装置の製造方法
US20180358508A1 (en) 2017-06-07 2018-12-13 Asti Global Inc., Taiwan Chip mounting system and method for mounting chips
WO2019147589A1 (en) * 2018-01-24 2019-08-01 Apple Inc. Micro led based display panel
JP2019140400A (ja) * 2019-04-08 2019-08-22 ゴルテック.インク マイクロ発光ダイオードの事前排除方法、製造方法、装置及び電子機器

Family Cites Families (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003162231A (ja) 2001-11-26 2003-06-06 Sony Corp 素子の製造方法、素子の配列方法及び画像表示装置の製造方法
US7959261B2 (en) 2007-05-08 2011-06-14 Lexmark International, Inc. Micro-fluid ejection devices having reduced input/output addressable heaters
WO2009143462A2 (en) * 2008-05-22 2009-11-26 Vi Systems Gmbh Method for attaching optical components onto silicon-based integrated circuits
US8198369B2 (en) 2008-08-05 2012-06-12 GM Global Technology Operations LLC Shape memory polymers with surface having dangling adhesive polymeric chains and methods of making and using the same
CN101656233B (zh) 2008-08-22 2012-10-24 群康科技(深圳)有限公司 薄膜晶体管基板的制造方法
JP2010129700A (ja) 2008-11-26 2010-06-10 Nitto Denko Corp ダイシング・ダイボンドフィルム及び半導体装置の製造方法
WO2011123285A1 (en) 2010-03-29 2011-10-06 Semprius, Inc. Selective transfer of active components
KR100998087B1 (ko) 2010-04-01 2010-12-03 한국기계연구원 능동 탈부착 척
WO2013010113A1 (en) 2011-07-14 2013-01-17 The Board Of Trustees Of The University Of Illinois Non-contact transfer printing
US9412727B2 (en) 2011-09-20 2016-08-09 Semprius, Inc. Printing transferable components using microstructured elastomeric surfaces with pressure modulated reversible adhesion
DE102012112965A1 (de) 2012-12-21 2014-06-26 Leibniz-Institut Für Neue Materialien Gemeinnützige Gesellschaft Mit Beschränkter Haftung Gegenstand mit schaltbarer Adhäsion
US10046353B2 (en) 2014-06-06 2018-08-14 The Board Of Trustees Of The University Of Illinois Microscale stamp with reversible adhesion for transfer printing
US9698134B2 (en) * 2014-11-27 2017-07-04 Sct Technology, Ltd. Method for manufacturing a light emitted diode display
US20160175238A1 (en) 2014-12-19 2016-06-23 L'oreal Hair cosmetic composition containing a polyurethane latex polymer and a silicone-organic polymer compound
CN113410146A (zh) 2015-01-23 2021-09-17 维耶尔公司 到受体衬底的选择性微型器件转移
CN107852794B (zh) * 2015-07-23 2020-03-10 首尔半导体株式会社 显示装置及其制造方法
GB2541970B (en) * 2015-09-02 2020-08-19 Facebook Tech Llc Display manufacture
WO2017037475A1 (en) * 2015-09-02 2017-03-09 Oculus Vr, Llc Assembly of semiconductor devices
US10252083B2 (en) 2015-09-23 2019-04-09 Varian Medical Systems Inc. Systems, methods, and devices for high-energy irradiation
US20170215280A1 (en) 2016-01-21 2017-07-27 Vuereal Inc. Selective transfer of micro devices
US10698986B2 (en) * 2016-05-12 2020-06-30 Markany Inc. Method and apparatus for embedding and extracting text watermark
EP3469424A4 (en) * 2016-06-10 2020-01-15 Applied Materials, Inc. MASKLESS PARALLEL ASSEMBLY TRANSMISSION OF MICRO COMPONENTS
US10533080B2 (en) 2016-07-26 2020-01-14 The Board Of Trustees Of The University Of Illinois Transfer printing using shape memory polymers
CN107833526B (zh) * 2016-09-15 2021-05-28 伊乐视有限公司 拾取-移除系统以及发光显示器的修复方法
DE102016221281A1 (de) 2016-10-28 2018-05-03 Osram Opto Semiconductors Gmbh Verfahren zum transferieren von halbleiterchips und transferwerkzeug
JP2020513681A (ja) * 2016-11-11 2020-05-14 キューエムエイティ・インコーポレーテッド 層転写によるマイクロ発光ダイオード(led)製造
US10978530B2 (en) * 2016-11-25 2021-04-13 Vuereal Inc. Integration of microdevices into system substrate
US10325893B2 (en) * 2016-12-13 2019-06-18 Hong Kong Beida Jade Bird Display Limited Mass transfer of micro structures using adhesives
US10403537B2 (en) 2017-03-10 2019-09-03 Facebook Technologies, Llc Inorganic light emitting diode (ILED) assembly via direct bonding
TWI681472B (zh) 2017-04-10 2020-01-01 英屬開曼群島商錼創科技股份有限公司 傳輸微小元件的方法
JP6720333B2 (ja) 2017-06-12 2020-07-08 ユニカルタ・インコーポレイテッド 基板上に個別部品を並列に組み立てる方法
US20190043843A1 (en) * 2017-08-01 2019-02-07 Innolux Corporation Methods for manufacturing a display device
US20190058081A1 (en) * 2017-08-18 2019-02-21 Khaled Ahmed Micro light-emitting diode (led) display and assembly apparatus
TWI653694B (zh) * 2017-09-13 2019-03-11 英屬開曼群島商錼創科技股份有限公司 微型發光元件陣列製造方法、轉移載板以及微型發光元件陣列
US10615063B2 (en) 2017-11-08 2020-04-07 Facebook Technologies, Llc Vacuum pick-up head for semiconductor chips
TWI689105B (zh) 2017-12-19 2020-03-21 優顯科技股份有限公司 光電半導體戳記及其製造方法、與光電半導體裝置
US11538785B2 (en) * 2017-12-19 2022-12-27 Ultra Display Technology Corp. Method of using optoelectronic semiconductor stamp to manufacture optoelectronic semiconductor device
KR102428029B1 (ko) * 2017-12-20 2022-08-02 (주)포인트엔지니어링 마이크로 led 전사헤드
JP6916525B2 (ja) 2018-02-06 2021-08-11 株式会社ブイ・テクノロジー Ledディスプレイの製造方法
KR20190114334A (ko) * 2018-03-29 2019-10-10 (주)포인트엔지니어링 마이크로 led 검사 및 리페어 방법
WO2019237228A1 (zh) * 2018-06-11 2019-12-19 厦门三安光电有限公司 发光组件
US10985046B2 (en) 2018-06-22 2021-04-20 Veeco Instruments Inc. Micro-LED transfer methods using light-based debonding
CN109473532B (zh) * 2018-11-20 2020-11-06 合肥京东方光电科技有限公司 一种Micro LED显示基板的制作方法
US11521887B2 (en) * 2019-12-18 2022-12-06 Seoul Viosys Co., Ltd. Method of transferring micro LED and micro LED transferring apparatus
JP2021110875A (ja) 2020-01-14 2021-08-02 三星電子株式会社Samsung Electronics Co., Ltd. ディスプレイ装置の製造方法、ディスプレイ装置、およびディスプレイ装置製造用中間体

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002314052A (ja) * 2001-04-11 2002-10-25 Sony Corp 素子の転写方法及びこれを用いた素子の配列方法、画像表示装置の製造方法
JP2002344028A (ja) 2001-05-16 2002-11-29 Sony Corp 素子の転写方法及び画像表示装置の製造方法
US20180358508A1 (en) 2017-06-07 2018-12-13 Asti Global Inc., Taiwan Chip mounting system and method for mounting chips
WO2019147589A1 (en) * 2018-01-24 2019-08-01 Apple Inc. Micro led based display panel
JP2019140400A (ja) * 2019-04-08 2019-08-22 ゴルテック.インク マイクロ発光ダイオードの事前排除方法、製造方法、装置及び電子機器

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TWI858227B (zh) 2024-10-11
JP2021140144A (ja) 2021-09-16
US20210272935A1 (en) 2021-09-02
EP3876270A1 (en) 2021-09-08
CN113345878A (zh) 2021-09-03
EP3876270B1 (en) 2025-01-08
CN113345878B (zh) 2024-04-05
JP7514777B2 (ja) 2024-07-11
TW202135279A (zh) 2021-09-16
KR20210111155A (ko) 2021-09-10
US11348905B2 (en) 2022-05-31

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