KR102631350B1 - 메모리 플레인들을 포함하는 비휘발성 메모리 장치 및 상기 비휘발성 메모리 장치의 동작 방법 - Google Patents

메모리 플레인들을 포함하는 비휘발성 메모리 장치 및 상기 비휘발성 메모리 장치의 동작 방법 Download PDF

Info

Publication number
KR102631350B1
KR102631350B1 KR1020170132752A KR20170132752A KR102631350B1 KR 102631350 B1 KR102631350 B1 KR 102631350B1 KR 1020170132752 A KR1020170132752 A KR 1020170132752A KR 20170132752 A KR20170132752 A KR 20170132752A KR 102631350 B1 KR102631350 B1 KR 102631350B1
Authority
KR
South Korea
Prior art keywords
memory
planes
plane
peak power
memory device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
KR1020170132752A
Other languages
English (en)
Korean (ko)
Other versions
KR20190041319A (ko
Inventor
전수창
박상원
심동교
곽동훈
Original Assignee
삼성전자주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자주식회사 filed Critical 삼성전자주식회사
Priority to KR1020170132752A priority Critical patent/KR102631350B1/ko
Priority to DE102018116927.2A priority patent/DE102018116927B4/de
Priority to JP2018180268A priority patent/JP7280027B2/ja
Priority to US16/145,772 priority patent/US10712955B2/en
Priority to CN201811189134.7A priority patent/CN109658967B/zh
Publication of KR20190041319A publication Critical patent/KR20190041319A/ko
Application granted granted Critical
Publication of KR102631350B1 publication Critical patent/KR102631350B1/ko
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/06Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
    • G06F3/0601Interfaces specially adapted for storage systems
    • G06F3/0602Interfaces specially adapted for storage systems specifically adapted to achieve a particular effect
    • G06F3/0625Power saving in storage systems
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/30Power supply circuits
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/06Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
    • G06F3/0601Interfaces specially adapted for storage systems
    • G06F3/0628Interfaces specially adapted for storage systems making use of a particular technique
    • G06F3/0653Monitoring storage devices or systems
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/06Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
    • G06F3/0601Interfaces specially adapted for storage systems
    • G06F3/0668Interfaces specially adapted for storage systems adopting a particular infrastructure
    • G06F3/0671In-line storage system
    • G06F3/0683Plurality of storage devices
    • G06F3/0688Non-volatile semiconductor memory arrays
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/32Timing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Memories (AREA)
  • Memory System (AREA)
  • Read Only Memory (AREA)
KR1020170132752A 2017-10-12 2017-10-12 메모리 플레인들을 포함하는 비휘발성 메모리 장치 및 상기 비휘발성 메모리 장치의 동작 방법 Active KR102631350B1 (ko)

Priority Applications (5)

Application Number Priority Date Filing Date Title
KR1020170132752A KR102631350B1 (ko) 2017-10-12 2017-10-12 메모리 플레인들을 포함하는 비휘발성 메모리 장치 및 상기 비휘발성 메모리 장치의 동작 방법
DE102018116927.2A DE102018116927B4 (de) 2017-10-12 2018-07-12 Nicht-flüchtige Speichervorrichtung einschließlich Speicherebenen und Betriebsverfahren davon
JP2018180268A JP7280027B2 (ja) 2017-10-12 2018-09-26 メモリプレーンを含む不揮発性メモリ装置及びその動作方法
US16/145,772 US10712955B2 (en) 2017-10-12 2018-09-28 Non-volatile memory device including memory planes, and operating method thereof
CN201811189134.7A CN109658967B (zh) 2017-10-12 2018-10-12 包括存储器平面的非易失性存储器设备及其操作方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020170132752A KR102631350B1 (ko) 2017-10-12 2017-10-12 메모리 플레인들을 포함하는 비휘발성 메모리 장치 및 상기 비휘발성 메모리 장치의 동작 방법

Publications (2)

Publication Number Publication Date
KR20190041319A KR20190041319A (ko) 2019-04-22
KR102631350B1 true KR102631350B1 (ko) 2024-01-31

Family

ID=65910381

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020170132752A Active KR102631350B1 (ko) 2017-10-12 2017-10-12 메모리 플레인들을 포함하는 비휘발성 메모리 장치 및 상기 비휘발성 메모리 장치의 동작 방법

Country Status (5)

Country Link
US (1) US10712955B2 (enExample)
JP (1) JP7280027B2 (enExample)
KR (1) KR102631350B1 (enExample)
CN (1) CN109658967B (enExample)
DE (1) DE102018116927B4 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102838205B1 (ko) * 2019-10-21 2025-07-25 삼성전자주식회사 플래시 메모리 장치 및 플래시 메모리 셀들을 포함하는 컴퓨팅 장치
US11270759B2 (en) 2019-10-21 2022-03-08 Samsung Electronics Co., Ltd. Flash memory device and computing device including flash memory cells
KR20210073754A (ko) 2019-12-11 2021-06-21 에스케이하이닉스 주식회사 시스템, 컨트롤러 및 시스템의 동작 방법
US11056195B1 (en) * 2020-04-27 2021-07-06 Macronix International Co., Ltd. Nonvolatile memory device and related driving method
US11200001B2 (en) * 2020-05-15 2021-12-14 Micron Technology, Inc. Management of power during memory device reset and initialization
US11385810B2 (en) * 2020-06-30 2022-07-12 Sandisk Technologies Llc Dynamic staggering for programming in nonvolatile memory
EP4513487A3 (en) 2020-11-26 2025-05-21 Yangtze Memory Technologies Co., Ltd. Dynamic peak power management for multi-die operations
US11532348B2 (en) * 2020-12-02 2022-12-20 Micron Technology, Inc. Power management across multiple packages of memory dies
US11520497B2 (en) 2020-12-02 2022-12-06 Micron Technology, Inc. Peak power management in a memory device
US12513898B2 (en) 2021-01-05 2025-12-30 Samsung Electronics Co., Ltd. Semiconductor device and data storage system including the same
US12362022B2 (en) * 2022-08-15 2025-07-15 Micron Technology, Inc. Scheduled interrupts for peak power management token ring communication
US12118219B2 (en) 2022-09-06 2024-10-15 SanDisk Technologies, Inc. Asymmetric time division peak power management (TD-PPM) timing windows
US11893253B1 (en) 2022-09-20 2024-02-06 Western Digital Technologies, Inc. Dynamic TD-PPM state and die mapping in multi-NAND channels
US20240152295A1 (en) * 2022-11-08 2024-05-09 Micron Technology, Inc. Peak power management with dynamic data path operation current budget management

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150098291A1 (en) 2012-09-24 2015-04-09 Micron Technology, Inc. Power consumption control
US20150200008A1 (en) * 2014-01-16 2015-07-16 Kabushiki Kaisha Toshiba Semiconductor package and electronic apparatus
KR101560860B1 (ko) * 2010-07-26 2015-10-19 애플 인크. 전력 소모를 제한하기 위해 비휘발성 메모리에서의 동작들을 동적으로 제어하는 방법들 및 시스템들

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4996277B2 (ja) * 2007-02-09 2012-08-08 株式会社東芝 半導体記憶システム
KR101226685B1 (ko) 2007-11-08 2013-01-25 삼성전자주식회사 수직형 반도체 소자 및 그 제조 방법.
KR101519061B1 (ko) * 2008-01-21 2015-05-11 삼성전자주식회사 하나의 고전압 레벨 쉬프터를 공유하는 로우 디코더를 갖는플래쉬 메모리 장치
EP2394221A4 (en) 2009-02-09 2012-11-21 Rambus Inc NON-VOLATILE MEMORY WITH MULTIPLE LEVELS WITH SYNCHRONIZED CONTROL
JP2011065708A (ja) * 2009-09-16 2011-03-31 Toshiba Corp 不揮発性半導体記憶装置
KR101691092B1 (ko) 2010-08-26 2016-12-30 삼성전자주식회사 불휘발성 메모리 장치, 그것의 동작 방법, 그리고 그것을 포함하는 메모리 시스템
US8553466B2 (en) 2010-03-04 2013-10-08 Samsung Electronics Co., Ltd. Non-volatile memory device, erasing method thereof, and memory system including the same
US9536970B2 (en) 2010-03-26 2017-01-03 Samsung Electronics Co., Ltd. Three-dimensional semiconductor memory devices and methods of fabricating the same
KR101682666B1 (ko) 2010-08-11 2016-12-07 삼성전자주식회사 비휘발성 메모리 장치, 그것의 채널 부스팅 방법, 그것의 프로그램 방법 및 그것을 포함하는 메모리 시스템
JP2012058860A (ja) * 2010-09-06 2012-03-22 Toshiba Corp メモリシステム
DE102012109612A1 (de) * 2011-10-13 2013-04-18 Samsung Electronics Co., Ltd. Nichtflüchtige Speichervorrichtung, Programmierungsverfahren für nichtflüchtige Speichervorrichtungen und Speichersystem, das eine nichtflüchtiger Speichervorrichtung umfasst
US20130290611A1 (en) 2012-03-23 2013-10-31 Violin Memory Inc. Power management in a flash memory
US9443600B2 (en) 2013-03-28 2016-09-13 Intel Corporation Auto-suspend and auto-resume operations for a multi-die NAND memory device to reduce peak power consumption
US9368214B2 (en) 2013-10-03 2016-06-14 Apple Inc. Programmable peak-current control in non-volatile memory devices
KR102225989B1 (ko) * 2014-03-04 2021-03-10 삼성전자주식회사 불휘발성 메모리 시스템 및 그것의 동작 방법
KR102233808B1 (ko) * 2014-03-14 2021-03-30 삼성전자주식회사 저장 장치 및 그것의 테이블 관리 방법
US10013345B2 (en) 2014-09-17 2018-07-03 Sandisk Technologies Llc Storage module and method for scheduling memory operations for peak-power management and balancing
KR102259943B1 (ko) * 2014-12-08 2021-06-04 삼성전자주식회사 멀티 플래인을 포함하는 불 휘발성 메모리 장치
US20160162215A1 (en) 2014-12-08 2016-06-09 Sandisk Technologies Inc. Meta plane operations for a storage device
KR20160074929A (ko) * 2014-12-19 2016-06-29 에스케이하이닉스 주식회사 비휘발성 메모리 장치 및 이의 동작 방법
KR102316267B1 (ko) * 2015-04-15 2021-10-22 삼성전자주식회사 씨오피 구조를 갖는 메모리 장치, 이를 포함하는 메모리 패키지 및 그 제조 방법
KR102296741B1 (ko) * 2015-07-07 2021-09-01 삼성전자 주식회사 메모리 장치 및 메모리 시스템
US9875049B2 (en) 2015-08-24 2018-01-23 Sandisk Technologies Llc Memory system and method for reducing peak current consumption
KR20170034126A (ko) * 2015-09-18 2017-03-28 에스케이하이닉스 주식회사 고전압 스위치 회로 및 이를 포함하는 반도체 메모리 장치
US20170256955A1 (en) 2016-03-02 2017-09-07 Sandisk Technologies Inc. Efficient Peak Current Management In A Multi-Die Stack
KR102713411B1 (ko) 2017-01-18 2024-10-08 삼성전자주식회사 불휘발성 메모리 장치 및 그것을 포함하는 메모리 시스템

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101560860B1 (ko) * 2010-07-26 2015-10-19 애플 인크. 전력 소모를 제한하기 위해 비휘발성 메모리에서의 동작들을 동적으로 제어하는 방법들 및 시스템들
US20150098291A1 (en) 2012-09-24 2015-04-09 Micron Technology, Inc. Power consumption control
US20150200008A1 (en) * 2014-01-16 2015-07-16 Kabushiki Kaisha Toshiba Semiconductor package and electronic apparatus

Also Published As

Publication number Publication date
KR20190041319A (ko) 2019-04-22
US20190114099A1 (en) 2019-04-18
DE102018116927B4 (de) 2024-11-28
CN109658967B (zh) 2023-08-29
US10712955B2 (en) 2020-07-14
JP7280027B2 (ja) 2023-05-23
CN109658967A (zh) 2019-04-19
JP2019075105A (ja) 2019-05-16
DE102018116927A1 (de) 2019-04-18

Similar Documents

Publication Publication Date Title
KR102631350B1 (ko) 메모리 플레인들을 포함하는 비휘발성 메모리 장치 및 상기 비휘발성 메모리 장치의 동작 방법
US10978481B2 (en) Nonvolatile memory device having a vertical structure and a memory system including the same
US10102909B2 (en) Nonvolatile memory device
US9941009B2 (en) Memory device having vertical structure and memory system including the same
KR102547947B1 (ko) 비휘발성 메모리 장치
CN102194523B (zh) 非易失性存储器件、其擦除方法以及包括其的存储系统
US11238933B2 (en) Non-volatile memory device including a verify circuit to control word and bit line voltages and method of operating the same
US9928165B2 (en) Nonvolatile memory device and method of controlling suspension of command execution of the same
US11069399B2 (en) 3-dimensional memory device
JP2019528546A (ja) マルチデッキメモリデバイス及び操作
CN110246532B (zh) 非易失性存储器设备和包括非易失性存储器设备的存储器系统
US20230018305A1 (en) Nonvolatile memory device and method of operating a nonvolatile memory
US10545880B2 (en) Memory device and memory system performing an unmapped read
US11315646B2 (en) Memory device having improved data reliability by varying program sequences
US12265727B2 (en) Memory controller for controlling allocation ratio of buffer memory, memory system including the same, and method of operating memory controller
US11205485B2 (en) Three-dimensional NAND flash memory device having improved data reliability by varying program intervals, and method of operating the same
US12431208B2 (en) Memory device detecting defect of word line path and operating method thereof
EP4177891A1 (en) Memory device and operation method thereof
KR20240110432A (ko) 비휘발성 메모리 장치 및 그의 동작 방법
CN118212963A (zh) 执行多平面读取操作的非易失性存储器设备及其操作方法
CN102163457A (zh) 非易失性存储器件、其编程方法以及包括其的存储系统

Legal Events

Date Code Title Description
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

A201 Request for examination
PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

D18-X000 Deferred examination requested

St.27 status event code: A-1-2-D10-D18-exm-X000

D19-X000 Deferred examination accepted

St.27 status event code: A-1-2-D10-D19-exm-X000

D20-X000 Deferred examination resumed

St.27 status event code: A-1-2-D10-D20-exm-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601