KR102482181B1 - 기판의 연마 장치 및 연마 방법 - Google Patents
기판의 연마 장치 및 연마 방법 Download PDFInfo
- Publication number
- KR102482181B1 KR102482181B1 KR1020197028236A KR20197028236A KR102482181B1 KR 102482181 B1 KR102482181 B1 KR 102482181B1 KR 1020197028236 A KR1020197028236 A KR 1020197028236A KR 20197028236 A KR20197028236 A KR 20197028236A KR 102482181 B1 KR102482181 B1 KR 102482181B1
- Authority
- KR
- South Korea
- Prior art keywords
- polishing
- substrate
- conditioning
- polishing pad
- partial
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/12—Dressing tools; Holders therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
- B24B55/06—Dust extraction equipment on grinding or polishing machines
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2017055976A JP6884015B2 (ja) | 2017-03-22 | 2017-03-22 | 基板の研磨装置および研磨方法 |
| JPJP-P-2017-055976 | 2017-03-22 | ||
| PCT/JP2018/000233 WO2018173421A1 (ja) | 2017-03-22 | 2018-01-10 | 基板の研磨装置および研磨方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20190131501A KR20190131501A (ko) | 2019-11-26 |
| KR102482181B1 true KR102482181B1 (ko) | 2022-12-29 |
Family
ID=63584243
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020197028236A Active KR102482181B1 (ko) | 2017-03-22 | 2018-01-10 | 기판의 연마 장치 및 연마 방법 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20200269383A1 (enExample) |
| JP (1) | JP6884015B2 (enExample) |
| KR (1) | KR102482181B1 (enExample) |
| CN (1) | CN110461542A (enExample) |
| SG (1) | SG11201908381RA (enExample) |
| TW (1) | TWI763765B (enExample) |
| WO (1) | WO2018173421A1 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20250085835A (ko) * | 2018-12-19 | 2025-06-12 | 도쿄엘렉트론가부시키가이샤 | 기판 처리 장치 및 기판 처리 방법 |
| JP7517832B2 (ja) * | 2020-01-17 | 2024-07-17 | 株式会社荏原製作所 | 研磨ヘッドシステムおよび研磨装置 |
| JP7387471B2 (ja) * | 2020-02-05 | 2023-11-28 | 株式会社荏原製作所 | 基板処理装置および基板処理方法 |
| KR102781684B1 (ko) * | 2021-02-26 | 2025-03-18 | 주식회사 케이씨텍 | 기판 이송 시스템 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001054864A (ja) | 1999-08-11 | 2001-02-27 | Ishikawajima Harima Heavy Ind Co Ltd | 研削加工方法及びそれを用いる研削盤 |
| JP2002321146A (ja) | 2001-04-24 | 2002-11-05 | Canon Inc | 回折光学素子用金型加工方法 |
| JP2010076080A (ja) | 2008-09-29 | 2010-04-08 | Nikon Corp | 研磨装置および研磨方法 |
| JP2011167813A (ja) | 2010-02-19 | 2011-09-01 | Jtekt Corp | カップ型ドレッサ及びツルーイング・ドレッシング方法 |
| JP2011177842A (ja) * | 2010-03-02 | 2011-09-15 | Ebara Corp | 研磨装置及び研磨方法 |
| WO2015050185A1 (ja) | 2013-10-04 | 2015-04-09 | 株式会社 フジミインコーポレーテッド | 研磨装置、研磨部材の加工方法、研磨部材の修正方法、形状加工用切削工具及び表面修正用工具 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4974368A (en) * | 1987-03-19 | 1990-12-04 | Canon Kabushiki Kaisha | Polishing apparatus |
| JPH0818241B2 (ja) * | 1987-03-19 | 1996-02-28 | キヤノン株式会社 | 研磨工具の製造方法 |
| US5938504A (en) * | 1993-11-16 | 1999-08-17 | Applied Materials, Inc. | Substrate polishing apparatus |
| US6478977B1 (en) * | 1995-09-13 | 2002-11-12 | Hitachi, Ltd. | Polishing method and apparatus |
| US6191038B1 (en) * | 1997-09-02 | 2001-02-20 | Matsushita Electronics Corporation | Apparatus and method for chemical/mechanical polishing |
| JP3011168B2 (ja) * | 1997-12-19 | 2000-02-21 | 日本電気株式会社 | 半導体基板研磨装置 |
| US6135868A (en) * | 1998-02-11 | 2000-10-24 | Applied Materials, Inc. | Groove cleaning device for chemical-mechanical polishing |
| JPH11320384A (ja) * | 1998-05-13 | 1999-11-24 | Sony Corp | 化学的機械研磨方法及びこれを使った化学的機械研磨装置 |
| US6227956B1 (en) * | 1999-10-28 | 2001-05-08 | Strasbaugh | Pad quick release device for chemical mechanical polishing |
| JP2001170856A (ja) * | 1999-12-14 | 2001-06-26 | Kawasaki Heavy Ind Ltd | 曲面仕上げ装置 |
| JP2002018662A (ja) * | 2000-06-30 | 2002-01-22 | Toshiba Mach Co Ltd | 磨き加工用工具 |
| US6561880B1 (en) * | 2002-01-29 | 2003-05-13 | Taiwan Semiconductor Manufacturing Co., Ltd. | Apparatus and method for cleaning the polishing pad of a linear polisher |
| JP2009246240A (ja) * | 2008-03-31 | 2009-10-22 | Tokyo Seimitsu Co Ltd | 半導体ウェーハ裏面の研削方法及びそれに用いる半導体ウェーハ裏面研削装置 |
| US8915768B2 (en) * | 2008-07-31 | 2014-12-23 | Mitsubishi Heavy Industries, Ltd. | Method of phasing threaded grinding stone, as well as device therefor |
| JP5390807B2 (ja) * | 2008-08-21 | 2014-01-15 | 株式会社荏原製作所 | 研磨方法および装置 |
| US10065288B2 (en) | 2012-02-14 | 2018-09-04 | Taiwan Semiconductor Manufacturing Co., Ltd. | Chemical mechanical polishing (CMP) platform for local profile control |
| US10160092B2 (en) * | 2013-03-14 | 2018-12-25 | Cabot Microelectronics Corporation | Polishing pad having polishing surface with continuous protrusions having tapered sidewalls |
| JP6454326B2 (ja) * | 2014-04-18 | 2019-01-16 | 株式会社荏原製作所 | 基板処理装置、基板処理システム、および基板処理方法 |
| JP2015205359A (ja) * | 2014-04-18 | 2015-11-19 | 株式会社荏原製作所 | 基板処理装置 |
| JP6307428B2 (ja) * | 2014-12-26 | 2018-04-04 | 株式会社荏原製作所 | 研磨装置およびその制御方法 |
| CN205363593U (zh) * | 2016-02-22 | 2016-07-06 | 中芯国际集成电路制造(北京)有限公司 | 一种研磨垫调整器 |
| KR102535628B1 (ko) * | 2016-03-24 | 2023-05-30 | 어플라이드 머티어리얼스, 인코포레이티드 | 화학적 기계적 연마를 위한 조직화된 소형 패드 |
| JP2018134710A (ja) * | 2017-02-22 | 2018-08-30 | 株式会社荏原製作所 | 基板の研磨装置および研磨方法 |
-
2017
- 2017-03-22 JP JP2017055976A patent/JP6884015B2/ja active Active
-
2018
- 2018-01-10 SG SG11201908381R patent/SG11201908381RA/en unknown
- 2018-01-10 KR KR1020197028236A patent/KR102482181B1/ko active Active
- 2018-01-10 CN CN201880018928.9A patent/CN110461542A/zh active Pending
- 2018-01-10 WO PCT/JP2018/000233 patent/WO2018173421A1/ja not_active Ceased
- 2018-01-10 US US16/495,010 patent/US20200269383A1/en not_active Abandoned
- 2018-01-12 TW TW107101152A patent/TWI763765B/zh active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001054864A (ja) | 1999-08-11 | 2001-02-27 | Ishikawajima Harima Heavy Ind Co Ltd | 研削加工方法及びそれを用いる研削盤 |
| JP2002321146A (ja) | 2001-04-24 | 2002-11-05 | Canon Inc | 回折光学素子用金型加工方法 |
| JP2010076080A (ja) | 2008-09-29 | 2010-04-08 | Nikon Corp | 研磨装置および研磨方法 |
| JP2011167813A (ja) | 2010-02-19 | 2011-09-01 | Jtekt Corp | カップ型ドレッサ及びツルーイング・ドレッシング方法 |
| JP2011177842A (ja) * | 2010-03-02 | 2011-09-15 | Ebara Corp | 研磨装置及び研磨方法 |
| WO2015050185A1 (ja) | 2013-10-04 | 2015-04-09 | 株式会社 フジミインコーポレーテッド | 研磨装置、研磨部材の加工方法、研磨部材の修正方法、形状加工用切削工具及び表面修正用工具 |
Also Published As
| Publication number | Publication date |
|---|---|
| SG11201908381RA (en) | 2019-10-30 |
| JP6884015B2 (ja) | 2021-06-09 |
| CN110461542A (zh) | 2019-11-15 |
| JP2018158399A (ja) | 2018-10-11 |
| TW201834786A (zh) | 2018-10-01 |
| KR20190131501A (ko) | 2019-11-26 |
| TWI763765B (zh) | 2022-05-11 |
| US20200269383A1 (en) | 2020-08-27 |
| WO2018173421A1 (ja) | 2018-09-27 |
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| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
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St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
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| A201 | Request for examination | ||
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
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| P11-X000 | Amendment of application requested |
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| P13-X000 | Application amended |
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| PE0701 | Decision of registration |
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| PR0701 | Registration of establishment |
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