KR102402946B1 - 투영 리소그래피용 조명 광학 유닛 - Google Patents

투영 리소그래피용 조명 광학 유닛 Download PDF

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KR102402946B1
KR102402946B1 KR1020167024766A KR20167024766A KR102402946B1 KR 102402946 B1 KR102402946 B1 KR 102402946B1 KR 1020167024766 A KR1020167024766 A KR 1020167024766A KR 20167024766 A KR20167024766 A KR 20167024766A KR 102402946 B1 KR102402946 B1 KR 102402946B1
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illumination
pupil
optical unit
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arrangement
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KR20160118353A (ko
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마틴 엔드레스
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칼 짜이스 에스엠티 게엠베하
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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/702—Reflective illumination, i.e. reflective optical elements other than folding mirrors, e.g. extreme ultraviolet [EUV] illumination systems
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
    • G03F7/70116—Off-axis setting using a programmable means, e.g. liquid crystal display [LCD], digital micromirror device [DMD] or pupil facets
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216—Mask projection systems
    • G03F7/70275—Multiple projection paths, e.g. array of projection systems, microlens projection systems or tandem projection systems
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
    • G03F7/70833—Mounting of optical systems, e.g. mounting of illumination system, projection system or stage systems on base-plate or ground

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Lenses (AREA)
  • Microscoopes, Condenser (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
KR1020167024766A 2014-02-21 2015-02-16 투영 리소그래피용 조명 광학 유닛 Active KR102402946B1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020227017234A KR102464752B1 (ko) 2014-02-21 2015-02-16 투영 리소그래피용 조명 광학 유닛

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102014203187.7A DE102014203187A1 (de) 2014-02-21 2014-02-21 Beleuchtungsoptik für die Projektionslithografie
DE102014203187.7 2014-02-21
PCT/EP2015/053174 WO2015124515A1 (en) 2014-02-21 2015-02-16 Illumination optical unit for projection lithography

Related Child Applications (1)

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KR1020227017234A Division KR102464752B1 (ko) 2014-02-21 2015-02-16 투영 리소그래피용 조명 광학 유닛

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KR20160118353A KR20160118353A (ko) 2016-10-11
KR102402946B1 true KR102402946B1 (ko) 2022-05-27

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KR1020167024766A Active KR102402946B1 (ko) 2014-02-21 2015-02-16 투영 리소그래피용 조명 광학 유닛

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Country Link
US (1) US9897924B2 (enExample)
EP (2) EP3108302A1 (enExample)
JP (2) JP6655545B2 (enExample)
KR (2) KR102464752B1 (enExample)
CN (2) CN111176077B (enExample)
DE (1) DE102014203187A1 (enExample)
TW (2) TWI714524B (enExample)
WO (1) WO2015124515A1 (enExample)

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DE102014203187A1 (de) * 2014-02-21 2015-08-27 Carl Zeiss Smt Gmbh Beleuchtungsoptik für die Projektionslithografie
DE102014217610A1 (de) * 2014-09-03 2016-03-03 Carl Zeiss Smt Gmbh Beleuchtungsoptik für die Projektionslithografie
DE102015217603A1 (de) * 2015-09-15 2017-03-16 Carl Zeiss Smt Gmbh Beleuchtungsoptik für die Projektionslithografie
DE102015221984A1 (de) * 2015-11-09 2017-05-11 Carl Zeiss Smt Gmbh Abbildende Optik zur Abbildung eines Objektfeldes in ein Bildfeld sowie Projektionsbelichtungsanlage mit einer derartigen abbildenden Optik
DE102015226529A1 (de) * 2015-12-22 2017-06-22 Carl Zeiss Smt Gmbh Abbildende Optik zur Abbildung eines Objektfeldes in ein Bildfeld sowie Projektionsbelichtungsanlage mit einer derartigen abbildenden Optik
DE102016225220A1 (de) 2016-02-09 2017-08-10 Carl Zeiss Smt Gmbh Beleuchtungsoptik für die Projektionslithographie sowie optisches System mit einer derartigen Beleuchtungsoptik
DE102016205624B4 (de) * 2016-04-05 2017-12-28 Carl Zeiss Smt Gmbh Beleuchtungsoptik für die EUV-Projektionslithografie, Beleuchtungssystem, Projektionsbelichtungsanlage und Verfahren zur Projektionsbelichtung
DE102017200935A1 (de) 2017-01-20 2018-07-26 Carl Zeiss Smt Gmbh Abbildende Optik zur Führung von EUV-Abbildungslicht sowie Justageanordnung für eine derartige abbildende Optik
DE102017220586A1 (de) * 2017-11-17 2019-05-23 Carl Zeiss Smt Gmbh Pupillenfacettenspiegel, Beleuchtungsoptik und optisches System für eine Projek-tionsbelichtungsanlage
DE102018201457A1 (de) * 2018-01-31 2019-08-01 Carl Zeiss Smt Gmbh Beleuchtungsoptik für die Projektionslithographie
DE102018207277A1 (de) 2018-05-09 2019-11-14 Carl Zeiss Smt Gmbh Lithografiemaske, optisches System zur Übertragung von Original Strukturabschnitten der Lithografiemaske sowie Projektionsoptik zur Abbildung eines Objektfeldes, in dem mindestens ein Original-Strukturabschnitt einer Lithografiemaske anordenbar ist
DE102018214437A1 (de) 2018-08-27 2018-10-18 Carl Zeiss Smt Gmbh Abbildende Optik zur Abbildung eines Objektfeldes in ein Bildfeld sowie Projektionsbelichtungsanlage mit einer derartigen abbildenden Optik
DE102020205123A1 (de) * 2020-04-23 2021-10-28 Carl Zeiss Smt Gmbh Facetten-Baugruppe für einen Facettenspiegel
DE102021202847A1 (de) * 2021-03-24 2022-09-29 Carl Zeiss Smt Gmbh Beleuchtungsoptik für eine Projektionsbelichtungsanlage für die Lithografie
DE102021213828B4 (de) 2021-12-06 2023-07-27 Carl Zeiss Smt Gmbh Verfahren zum Ziel-Betreiben einer EUV-Strahlungsquelle
DE102021214366A1 (de) 2021-12-15 2023-06-15 Carl Zeiss Smt Gmbh Vorrichtung und Verfahren zur Vermeidung einer Degradation einer optischen Nutzoberfläche eines Spiegelmoduls, Projektionssystem, Beleuchtungssystem sowie Projektionsbelichtungsanlage
CN114660880A (zh) * 2022-04-11 2022-06-24 长沙沃默科技有限公司 一种反射式投影成像装置及其设计方法
DE102022204996A1 (de) 2022-05-19 2023-11-23 Carl Zeiss Smt Gmbh Verfahren und Vorrichtung zur Bestimmung eines Restgases mittels eines Restgasanalyseverfahrens in einem Vakuum einer Vakuumkammer
DE102022206110A1 (de) * 2022-06-20 2023-12-21 Carl Zeiss Smt Gmbh Abbildende EUV-Optik zur Abbildung eines Objektfeldes in ein Bildfeld
DE102023203810A1 (de) 2023-04-25 2024-10-31 Carl Zeiss Smt Gmbh Einzelspiegel für einen Facettenspiegel einer Beleuchtungsoptik einer Projektionsbelichtungsanlage
DE102023205562A1 (de) 2023-06-14 2024-12-19 Carl Zeiss Smt Gmbh Verfahren zum Herstellen eines Spiegelsubstrats eines optischen Elements, optisches Element und Projektionsbelichtungsanlage
DE102023206872A1 (de) 2023-07-20 2025-01-23 Carl Zeiss Smt Gmbh Optische Komponente, Verfahren zur Montage der optischen Komponente, Projektionsbelichtungsanlage
DE102023209707A1 (de) * 2023-10-04 2024-10-02 Carl Zeiss Smt Gmbh Verfahren zur Zuordnung von Einzelspiegeln eines ersten Facettenspiegels einer Beleuchtungsoptik für die Projektionslithographie zu Feldhöhen eines Objektfeldes

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Patent Citations (1)

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KR20160118353A (ko) 2016-10-11
EP4276539A2 (en) 2023-11-15
JP2017507356A (ja) 2017-03-16
EP4276539C0 (en) 2025-04-02
EP3108302A1 (en) 2016-12-28
JP6655545B2 (ja) 2020-02-26
EP4276539A3 (en) 2024-01-24
CN111176077A (zh) 2020-05-19
CN106030415B (zh) 2020-02-21
CN111176077B (zh) 2022-09-06
WO2015124515A1 (en) 2015-08-27
TW202107224A (zh) 2021-02-16
TW201546564A (zh) 2015-12-16
KR20220070578A (ko) 2022-05-31
JP6963642B2 (ja) 2021-11-10
CN106030415A (zh) 2016-10-12
EP4276539B1 (en) 2025-04-02
TWI714524B (zh) 2021-01-01
US20160327868A1 (en) 2016-11-10
TWI782331B (zh) 2022-11-01
US9897924B2 (en) 2018-02-20
KR102464752B1 (ko) 2022-11-09
JP2020074040A (ja) 2020-05-14
DE102014203187A1 (de) 2015-08-27

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